摘要:
A synchronization system and method for use in a packet switched communication network are provided. The synchronization system comprises a transmitter-identification system, a packet-boundary detection system and a storage-access system. The transmitter-identification system enables each receiving terminal within the network to know the identity of the originating transmitter terminal for a given packet of information, prior to the reception of this packet of information. The packet-boundary detection system enables detection of packet synchronization parameters for all transmitter-receiver pairs of terminals within the network. The storage-access system stores the detected packet synchronization parameters and allows the receiver to access the packet synchronization parameters. According to one embodiment of the invention, the synchronization method comprises the step of detecting synchronization parameters and, for a given receiver terminal, establishing the identity of the originating transmitter for an incoming packet of information, accessing synchronization parameters corresponding to the identified transmitter, adjusting receiver based on accessed synchronization parameters and decoding the incoming packet of information.
摘要:
Methods and compositions for identifying and treating obesity and obesity-induced metabolic disorders are provided. One aspect provides a method for the evaluation of risk and progression of glucose tolerance, insulin resistance and Type 2 diabetes in mammalian subjects. The method includes measuring the concentration of circulating lipocalin-2 in a subject and comparing the measured level to lipocalin-2 to a reference level. Another aspect provides methods of treating insulin resistance, type 2 diabetes and other related complications by administering to a patient a composition that can reduce the circulating levels of lipocalin-2, for example a lipocalin-2 antagonist.
摘要:
This invention discloses a semiconductor wafer for manufacturing electronic circuit thereon. The semiconductor substrate further includes an etch-back indicator that includes trenches of different sizes having polysilicon filled in the trenches and then completely removed from some of the trenches of greater planar trench dimensions and the polysilicon still remaining in a bottom portion in some of the trenches having smaller planar trench dimensions.
摘要:
Methods and apparatus are disclosed for the measurement of lipocalin-2 in body fluids (including but not limited to blood, serum, plasma, urine, saliva, tear, etc.) by an assay such as an immunoassay or an immunotest for (1) the prediction of risk of future cardiovascular diseases; and (2) the determination of the likelihood that certain individuals will benefit to a greater or lesser extent from the use of certain treatments designed to prevent and/or treat cardiovascular diseases.
摘要:
An integrated electric-drive compressor system utilizes a high frequency drive for powering the multi-pole pair motor. The electric motor and compressor are housed in a common pressure casing. The electric motor has added permanent magnets for achieving higher ratings and higher speeds.
摘要:
A method for determining the depth etch, a method of forming a shielded gate trench (SGT) structure and a semiconductor device wafer are disclosed. A material layer is formed over part of a substrate having a trench. The material fills the trench. A resist mask is placed over a test portion of the material layer thereby defining a test structure that lies underneath the resist mask. The resist mask does not cover the trench. The material is isotropically etched and a signal related to a resistance change of the test structure is measured. A lateral undercut DL of the test structure is determined from the signal and an etch depth DT is determined from DL. The wafer may comprise one or more test structures forming a bridge circuit; one or more metal contacts that electrically connect the test structures through contact holes: and resist layer including over the test structures.
摘要:
A method, system and computer program product for automatically identifying unique language independent keys. A “key search” is performed which searches for various language independent keys in a properties file associated with a value or text string entered in a first locale. A second locale is suggested to narrow the number of language independent keys displayed in connection with the value entered in the first locale. Upon receiving the value for the second locale, another key search is performed, where this key search is performed on the language independent keys displayed in connection with the first value entered in association with the first locale. A unique language independent key may be identified based on this subsequent key search. By performing key searches and suggesting a second locale to narrow the number of language independent keys, the time in identifying a unique language independent key is reduced and efficiency is improved.
摘要:
A method for determining the depth etch, a method of forming a shielded gate trench (SGT) structure and a semiconductor device wafer are disclosed. A material layer is formed over part of a substrate having a trench. The material fills the trench. A resist mask is placed over a test portion of the material layer thereby defining a test structure that lies underneath the resist mask. The resist mask does not cover the trench. The material is isotropically etched and a signal related to a resistance change of the test structure is measured. A lateral undercut DL of the test structure is determined from the signal and an etch depth DT is determined from DL. The wafer may comprise one or more test structures forming a bridge circuit; one or more metal contacts that electrically connect the test structures through contact holes: and resist layer including over the test structures.
摘要翻译:公开了一种用于确定深度蚀刻的方法,形成屏蔽栅沟槽(SGT)结构的方法和半导体器件晶片。 在具有沟槽的衬底的一部分上形成材料层。 材料填充沟槽。 将抗蚀剂掩模放置在材料层的测试部分上,从而限定位于抗蚀剂掩模下方的测试结构。 抗蚀剂掩模不覆盖沟槽。 该材料被各向同性地蚀刻并且测量与测试结构的电阻变化相关的信号。 根据信号确定测试结构的横向底切D L L,并且从D L确定蚀刻深度D T T。 晶片可以包括形成桥接电路的一个或多个测试结构; 通过接触孔将测试结构电连接的一个或多个金属触点和包括在测试结构上的抗蚀剂层。
摘要:
A method of sealing a generator stator bar and a stator bar end fitting receiving the end including the steps of: brazing the fitting to the end of the stator bar with a braze material; applying a powder coating material to the end of the stator bar in the fitting; and curing the powder coating material to form a barrier coating on the end of the stator bar and the adjoining interior surfaces of the fitting.