摘要:
A semiconductor storage includes a receiver configured to receive a write request from a host device; a storage unit configured to hold redundancy data generation/non-generation information; a writing unit configured to write data in a semiconductor memory array and write redundancy data generation/non-generation information of the written data in the storage unit; a first data extracting unit configured to extract data whose redundancy data is not generated from among the data held by the semiconductor memory array; a first redundancy data generating unit configured to generate redundancy data; a first redundancy data writing unit configured to write the generated redundancy data in the semiconductor memory array; and a first redundancy data generation/non-generation information updating unit configured to update the redundancy data generation/non-generation information of the data whose redundancy data held by the storage unit is generated.
摘要:
To provide a memory system which determines a memory state such as an exhaustion level and allows a memory to be efficiently used.The memory system includes a NAND type flash memory 1 in which data can be electrically written/erased, a nonvolatile memory 2 which counts the number of erase operations of the NAND type flash memory 1 and retains the number of erase operations and a maximum number of erase operations, and a controller 3 which has a connection interface 31 to be given a self-diagnosis command from a computer 4, and retrieves the number of erase operations and the maximum number of erase operations from the nonvolatile memory 2 based on the self-diagnosis command and outputs the number of erase operations and the maximum number of erase operations to the computer 4 through the connection interface 31.
摘要:
A reproducing apparatus includes a storage unit including a plurality of memory elements each capable of holding an electric charge, each memory element indicating a 2-bit code which is related to each other so that the Hamming distance between adjacent codes is unity in four ranges determined by a charge amount with respect to three threshold values with the minimum or maximum value thereof as a fixed value; a reading unit that reads each 2-bit code by the charge amount which is held in each memory element using the three threshold values corresponding to each memory element; an error detector that detects whether a first bit string consisting of right bits of the 2 bit codes read or a second bit string consisting of left bits of the 2 bit codes read has an error; and a threshold changing unit that, upon detection of the error, changes a threshold value corresponding to the bit string having the error other than a fixed threshold value to secure a correct bit string.
摘要:
The present invention discloses a method for angiogenesis. The method comprises the steps of electrically stimulating a muscle below the threshold for muscle contraction.
摘要:
According to an embodiment of a controller, a bit string manipulating unit manipulates a bit string of manipulation target data based on a predetermined rule. A special data setting unit generates a magic number based on a special data setting request from a host interface, obtains an error detecting code for the magic number, and sends the magic number and the error detecting code as manipulation target data to the bit string manipulating unit to obtain a manipulated manipulation target data. The special data setting unit also extracts logical block address information from the special data setting request, and instructs an access unit to write the magic number in the manipulated manipulation target data to a user data storage area and to write the error detecting code in the manipulated manipulation target data to a redundant area in a storage area located by the logical block address information.
摘要:
A controller includes a storage for a translation table showing logical and physical addresses in a flash memory in correspondence with one another; another storage storing FAT information indicating the state of data stored in each of pages contained in each of blocks and FAT information identifiers each identifying a block to which pages each storing therein the data in the state indicated by the FAT information belong, while keeping them in correspondence with one another; yet another storage for a block management table showing block identifiers, use-state judging information indicating whether the corresponding block is used/unused, and the FAT information identifiers corresponding to all the blocks indicated as being used by the use-state judging information, while keeping them in correspondence with one another; and a controller controlling unit managing data stored in the flash memory by using the translation table, the FAT information, and the block management table.
摘要:
A CRC code is generated from an original data, a BCH code is generated with respect to the original data and the CRC code, and the original data, the CRC code, and the BCH code are recorded in pages selected from different planes of a plurality of memory chips. An RS code is generated from the original data across pages, a CRC code is generated with respect to the RS code, a BCH code is generated with respect to the RS code and the CRC code, and the RS code, the CRC code, the BCH code are recorded in a memory chip different from a memory chip including the original data. When reading data, error correction is performed on the original data by using the BCH code, and then CRC is calculated. If the number of errors is the number of errors that is correctable by erasure correction using the RS code, the original data is corrected by the erasure correction. If the number of errors exceeds an erasure correction capability of the RS code, normal error correction using the RS code is performed, and further error correction using the BCH code is performed.
摘要:
To provide a memory system which determines a memory state such as an exhaustion level and allows a memory to be efficiently used.The memory system includes a NAND type flash memory 1 in which data can be electrically written/erased, a nonvolatile memory 2 which counts the number of erase operations of the NAND type flash memory 1 and retains the number of erase operations and a maximum number of erase operations, and a controller 3 which has a connection interface 31 to be given a self-diagnosis command from a computer 4, and retrieves the number of erase operations and the maximum number of erase operations from the nonvolatile memory 2 based on the self-diagnosis command and outputs the number of erase operations and the maximum number of erase operations to the computer 4 through the connection interface 31.
摘要:
A semiconductor memory device includes a plurality of detecting code generators configured to generate a plurality of detecting codes to detect errors in a plurality of data items, respectively, a plurality of first correcting code generators configured to generate a plurality of first correcting codes to correct errors in a plurality of first data blocks, respectively, each of the first data blocks containing one of the data items and a corresponding detecting code, a second correcting code generators configured to generate a second correcting code to correct errors in a second data block, the second data block containing the first data blocks, and a semiconductor memory configured to nonvolatilely store the second data block, the first correcting codes, and the second correcting code.
摘要:
A semiconductor memory device includes a plurality of detecting code generators configured to generate a plurality of detecting codes to detect errors in a plurality of data items, respectively, a plurality of first correcting code generators configured to generate a plurality of first correcting codes to correct errors in a plurality of first data blocks, respectively, each of the first data blocks containing one of the data items and a corresponding detecting code, a second correcting code generators configured to generate a second correcting code to correct errors in a second data block, the second data block containing the first data blocks, and a semiconductor memory configured to nonvolatilely store the second data block, the first correcting codes, and the second correcting code.