Method for manufacturing semiconductor device
    54.
    发明授权
    Method for manufacturing semiconductor device 有权
    制造半导体器件的方法

    公开(公告)号:US08148259B2

    公开(公告)日:2012-04-03

    申请号:US11843745

    申请日:2007-08-23

    IPC分类号: H01L21/4763

    CPC分类号: H01L27/1288 H01L27/1214

    摘要: The present invention offers a method for forming an opening portion by a simple process without using a photomask or a resist. Further, the present invention proposes a method for manufacturing a semiconductor device at low cost. A plurality of light absorbing layers is formed over a substrate, an interlayer insulating layer is formed over the plurality of light absorbing layers, the plurality of light absorbing layers is irradiated with a linear or rectangular laser beam from the interlayer insulating layer side, and at least the interlayer insulating layer which is over the plurality of light absorbing layers is removed and an opening portion is formed; and accordingly, a plurality of opening portions can be formed by removing the plurality of light absorbing layers and an insulating film formed over the plurality of light absorbing layers.

    摘要翻译: 本发明提供一种通过简单的工艺形成开口部分的方法,而不使用光掩模或抗蚀剂。 此外,本发明提供一种以低成本制造半导体器件的方法。 在衬底上形成多个光吸收层,在多个光吸收层上形成层间绝缘层,多层光吸收层用来自层间绝缘层侧的直线或矩形激光束照射,并且在 除去多个光吸收层之上的层间绝缘层的最小值,形成开口部; 因此,可以通过去除多个光吸收层和形成在多个光吸收层上的绝缘膜来形成多个开口部。