公开(公告)号：US20060164627A1

公开(公告)日：2006-07-27

申请号：US10520819

申请日：2003-07-08

申请人： Mark Froggatt ,  Brian Soller ,  Matthew Wolfe

发明人： Mark Froggatt ,  Brian Soller ,  Matthew Wolfe

IPC分类号： G01N21/00

CPC分类号： G01M11/331 ,  G01M11/3172 ,  G01M11/3181 ,  G01M11/337

摘要： A fiber optic measurement device including an optical frequency domain reflectometer (10) performs polarization diversity detection without using a polarizing beam splitter.

摘要翻译： 包括光频域反射计（10）的光纤测量装置在不使用偏振分束器的情况下进行极化分集检测。

公开(公告)号：US20060115199A1

公开(公告)日：2006-06-01

申请号：US11291585

申请日：2005-11-30

申请人： X. Yao

发明人： X. Yao

IPC分类号： G02B6/00

CPC分类号： G01M11/337

摘要： Devices and techniques that use a polarization controller and a feedback control to the polarization controller to systematically control the polarization of light output from the polarization controller in measuring the polarization dependent loss (PDL) of an optical device or material that receives the light from the polarization controller or the degree of polarization (DOP) of a light beam directed into the polarization controller.

公开(公告)号：US06888624B2

公开(公告)日：2005-05-03

申请号：US10398318

申请日：2002-02-08

申请人： Stéphane Caplette ,  Sylvain Cloutier ,  Charles Massicotte ,  Alain Villeneuve

发明人： Stéphane Caplette ,  Sylvain Cloutier ,  Charles Massicotte ,  Alain Villeneuve

IPC分类号： G01M11/00 ,  G01N21/00

CPC分类号： G01M11/00 ,  G01M11/33 ,  G01M11/337

摘要： This invention provides a method of obtaining accurate measurements of polarization dependent loss and insertion loss during the tests aiming at measuring the polarization properties of optical components. This is achieved by taking into account every polarization disturbance in the line between generation of known states of polarization and the device under test. The method involves computing within a desired range of wavelengths either the transfer matrix of each polarization perturbing element or of all polarization perturbing elements as a whole, and compensating for errors introduced by these polarization perturbing elements.

摘要翻译： 本发明提供了一种在针对测量光学部件的偏振特性的测试期间获得精确测量偏振相关损耗和插入损耗的方法。 这是通过考虑在已知的极化状态的产生和被测器件之间的线中的每个极化扰动来实现的。 该方法涉及在期望的波长范围内计算每个偏振扰动元件的传递矩阵或者所有极化扰动元件的整体，并补偿由这些偏振扰动元件引入的误差。

公开(公告)号：US06856398B2

公开(公告)日：2005-02-15

申请号：US10281588

申请日：2002-10-23

申请人： Bernard Ruchet

发明人： Bernard Ruchet

IPC分类号： G01M11/00 ,  G01B9/02 ,  G01N21/00

CPC分类号： G01M11/337 ,  G01M11/331 ,  G01M11/336

摘要： Apparatus for making wavelength-resolved polarimetric measurements comprises an interferometric source (10,12), for example a broadband source (10) and an optical interferometer unit (12), and a polarization generator unit (16) for generating different states of polarization of light received from the interferometric source and applying same to a device-under-test (30). A polarimeter unit (20) receives and polarimetrically-analyzes light from the device-under-test, converts the polarimetrically-analyzed light into electrical signals, and, using Fast Fourier Transform numerical analysis, computes therefrom the wavelength-resolved polarimetric measurements. Placing the optical interferometer unit (10,12) “upstream” not only of the device-under-test (30), but also of the polarisation generator unit (16), means that the latter substantially eliminates polarization dependent effects introduced by the former. The polarimeter (20) can still perform the necessary transformation even though the interferogram has been passed through the polarisation generator unit and the device-under-test.

摘要翻译： 用于进行波长分辨偏振测量的装置包括干涉源（10,12），例如宽带源（10）和光干涉仪单元（12），以及偏振发生器单元（16），用于产生不同的偏振态 从干涉光源接收的光并将其施加到被测设备（30）。 偏振器单元（20）接收并极化分析来自被测器件的光，将偏振分析的光转换为电信号，并使用快速傅里叶变换数值分析，计算出波长分辨的偏振测量。 将光干涉仪单元（10,12）“上游”不仅被测器件（30）而且还包括偏振发生器单元（16），这意味着后者基本消除了由前者产生的偏振相关效应 。 即使干涉图已经通过偏振发生器单元和被测器件，旋光仪仍然可以进行必要的变换。

公开(公告)号：US20050030522A1

公开(公告)日：2005-02-10

申请号：US10634952

申请日：2003-08-05

申请人： Douglas Baney ,  Gregory VanWiggeren

发明人： Douglas Baney ,  Gregory VanWiggeren

IPC分类号： G01M11/00 ,  G01N21/00 ,  H04B3/46 ,  H04B10/08 ,  H04B17/00

CPC分类号： G01M11/336 ,  G01M11/331 ,  G01M11/335 ,  G01M11/337

摘要： Characterizing active and passive properties of an optical device involves applying a local oscillator signal to a device under test (DUT) and providing a portion of the local oscillator signal (referred to as the reference local oscillator signal) directly to the an optical analyzer. Providing the reference local oscillator signal to the optical analyzer enables interferometric measurements associated with the DUT to be obtained along with direct measurements, where the interferometric measurements result from combining the portion of the local oscillator signal that is applied to the DUT with the reference local oscillator signal. The interferometric measurements are used to characterize passive properties of the DUT while the direct measurements are used to characterize active properties of the DUT.

公开(公告)号：US06788396B2

公开(公告)日：2004-09-07

申请号：US10179368

申请日：2002-06-25

申请人： Ralf Stolte ,  Patrick Ziegler

发明人： Ralf Stolte ,  Patrick Ziegler

IPC分类号： G01N2100

CPC分类号： G01M11/3181 ,  G01M11/336 ,  G01M11/337 ,  G01M11/338 ,  G01N21/21

摘要： The present invention relates to determination of optical properties, e.g. polarization dependent loss (PDL), polarization mode dispersion (PMD), differential group delay (DGD), insertion loss, return loss and/or chromatic dispersion (CD), of a device under test (DUT) in transmission and in reflection of an optical beam. The invention is disclosing an element that is at least partly transmissive and at least partly reflective.

摘要翻译： 本发明涉及光学性质的测定，例如 被测器件（DUT）在透射和反射中的偏振相关损耗（PDL），偏振模色散（PMD），差分群延迟（DGD），插入损耗，回波损耗和/或色散（CD） 光束。 本发明公开了至少部分透射并至少部分反射的元件。

公开(公告)号：US20040070759A1

公开(公告)日：2004-04-15

申请号：US10271273

申请日：2002-10-14

发明人： Duwayne R. Anderson

IPC分类号： G01N021/21

CPC分类号： G01J4/04 ,  G01M11/333 ,  G01M11/335 ,  G01M11/337

摘要： A vector representation of polarization dependent loss (PDL) is introduced so that the true PDL of a composite optical system having more than one optical component in combination may be measured using a Mueller Matrix method. An optical source having four input states of polarization is measured at each polarization state to generate the first row of values for the Mueller Matrix for the optical source alone derived from the transmission coefficients. The first row of values is converted into a PDL vector for the optical source alone. The output of the composite optical system having the optical source as input is measured at each polarization state to generate the first row of values for a Mueller Matrix for the composite optical system including the optical source. The first row of values is converted into a PDL vector for the composite optical system in combination with the optical source. The absolute value of the PDL for the composite optical system is determined as the absolute value of the vector difference between the two PDL vectors. By representing the PDL of each optical component in an optical system as a vector, the behavior of the optical system may be approximately predicted by the vector combination of the individual PDL vectors.

摘要翻译： 引入偏振相关损耗（PDL）的矢量表示，使得可以使用Mueller矩阵法来测量具有多于一个光学组件的组合光学系统的真实PDL。 在每个偏振状态下测量具有四个输入偏振状态的光源，以产生源自传输系数的光源单独的Mueller矩阵的第一行值。 第一行值被单独转换为光源的PDL向量。 在每个偏振状态下测量具有光源作为输入的复合光学系统的输出，以产生用于包括光源的复合光学系统的Mueller矩阵的第一行值。 将第一行值与光源相结合地转换为复合光学系统的PDL矢量。 复合光学系统的PDL的绝对值被确定为两个PDL向量之间的向量差的绝对值。 通过将光学系统中的每个光学部件的PDL表示为矢量，可以通过各个PDL矢量的矢量组合近似地预测光学系统的行为。

公开(公告)号：US20030202171A1

公开(公告)日：2003-10-30

申请号：US10135481

申请日：2002-04-29

发明人： William P. Kennedy ,  Amanda J. Price ,  Max Seminario ,  John Bernard Medberry

IPC分类号： G01N021/00

CPC分类号： G01M11/337

摘要： A measurement system is provided that is capable of analyzing light at the input of an optical waveguide of an optical device under test (DUT) and/or at the output of the waveguide, preferably at both. At the input of the waveguide, light having a particular polarization state generated by a polarization controller is output from the polarization controller and coupled into a proximal end of an optical fiber. The measurement system analyzes the polarization state of the light being launched from the opposite, or distal, end of the optical fiber into the waveguide input of the DUT to determine whether and by how much the polarization state of the light has been changed by the optical fiber. The polarization controller is altered, if necessary, to compensate for any changes in the polarization state caused by the optical fiber so that the polarization state of light being launched into the input of the optical fiber is known and is controllable. At the output of the waveguide, the measurement system analyzes the polarization state of the light output from the waveguide to determine any effect the waveguide of the DUT had on the polarization state of the light that propagated through the waveguide.

摘要翻译： 提供一种测量系统，其能够分析光被测设备（DUT）的光波导的输入端和/或在波导的输出处优选在两者的输入处的光。 在波导的输入处，由偏振控制器产生的具有特定偏振态的光从偏振控制器输出并耦合到光纤的近端。 测量系统分析从光纤的相对端或远端发射到DUT的波导输入端的光的偏振状态，以确定是否和通过光学器件改变了多少光的偏振状态 纤维。 如果需要，偏振控制器被改变以补偿由光纤引起的偏振态的任何变化，使得发射到光纤输入端的光的偏振状态是已知的并且是可控的。 在波导的输出处，测量系统分析来自波导的光输出的偏振状态，以确定DUT的波导对通过波导传播的光的偏振态的任何影响。

公开(公告)号：US20030193667A1

公开(公告)日：2003-10-16

申请号：US10406693

申请日：2003-04-02

发明人： Egbert Krause ,  Adalbert Bandemer

IPC分类号： G01J004/00

CPC分类号： G01M11/337 ,  G01J4/04 ,  G01M11/336

摘要： Highly accurate calibration of a polarimeter of the type having at least four detectors involves using four known states of polarisation of an input light signal (calibration polarisations) and at least one further state of polarisation. All input states of polarisation to the polarimeter have unity normalised power of the light signal and unity degree of polarisation. A Stokes matrix for the four calibration polarisations is generated with at least one variable correction parameter, and a correction matrix is determined from the Stokes matrix and a corresponding detector current matrix measured by the polarimeter. An optimisation criterion that is a function of the degrees of polarisation for the states of polarisation as measured by the polarimeter is generated. The correction parameter is varied iteratively to minimise the optimisation criterion so that the polarimeter is calibrated to produce unity power and degree of polarisation for any input state of polarisation.

摘要翻译： 具有至少四个检测器的类型的偏振计的高精度校准涉及使用四个已知的输入光信号的偏振状态（校准极化）和至少一个另外的极化状态。 偏振光的所有输入状态都具有光信号的统一归一化功率和单位极化度。 使用至少一个可变校正参数生成用于四个校准极化的斯托克斯矩阵，并且从斯托克斯矩阵和由偏振计测量的对应的检测器电流矩阵确定校正矩阵。 产生通过偏振计测量的偏振状态的极化度的函数的优化标准。 校正参数被迭代地改变以最小化优化标准，使得校准偏振器以产生用于任何输入偏振状态的单位功率和极化度。

公开(公告)号：US20030111998A1

公开(公告)日：2003-06-19

申请号：US10276480

申请日：2002-11-15

发明人： Yeon Wan Koh ,  Bong Wan Lee ,  Jung Won Kim

IPC分类号： G01R031/00

CPC分类号： G01M11/337 ,  G02B6/105

摘要： Disclosed is an apparatus and method for measuring a changing amount of insertion loss of an optical device depending on a polarization state of an incident light, i.e., a polarization-dependent loss. An incident light that is periodically subject to all polarization states passes through a testing optical device by a polarization scrambler including a piezoelectric element type optical fiber birefringence modulator, and an optical detector measures intensity of the passing light, in which the measured intensity values are averaged for birefringence modulation having a constant period, and then the polarization-dependent loss is computed from a ratio of maximum power to minimum power for the period. Use of the birefringence modulator shortens measuring time, and decreases an affect of external disturbance to the incident light that is incident into the testing optical component or occurrence probability of the external disturbance, so that the polarization-dependent loss can be precisely measured.

摘要翻译： 公开了一种用于根据入射光的偏振状态即偏振相关损耗来测量光学器件的插入损耗的变化量的装置和方法。 周期性地受到所有极化状态的入射光通过包括压电元件型光纤双折射调制器的偏振加扰器通过测试光学器件，并且光学检测器测量通过光的强度，其中测量的强度值被平均 对于具有恒定周期的双折射调制，然后根据该周期的最大功率与最小功率的比率来计算偏振相关损耗。 双折射调制器的使用缩短了测量时间，并且减小了入射到测试光学部件中的入射光的外部干扰的影响或外部干扰的发生概率，从而可以精确地测量偏振相关损耗。