摘要:
A grooved separating region 112 having information electric charge storing capacitances C.sub.P formed on side surfaces thereof is formed to extend the region between the adjacent word line 107 in parallel with the word line 107. As a result, the grooved separating region 112 does not contact the channel region 111 of the gate transistors and does not intersect the word line 107.
摘要:
In a semiconductor memory device, memory cells of a first column each comprising an N-channel FET are connected to a first bit line, and memory cells of a second column each comprising a P-channel FET are connected to a second bit line. The first bit line and the second bit line are connected to complementary terminals of a sense amplifier to form a folded-bit line pair. A work line is connected to the gate of the N-channel FET of one of the memory cells of the first column and to the gate of the P-channel FET of one of the memory cells of the second column. The word line is selectively provided with a first voltage to make conductive the N-channel FET connected thereto and to make nonconductive the P-channel FET connected thereto, or a second voltage to make conductive the P-channel FET connected thereto and to make nonconductive the N-channel FET connected thereto, or a third voltage to make nonconducitve both the N-channel FET and the P-channel FET connected thereto.
摘要:
An LSI semiconductor memory device in which errors in reading out memory cells connected to outermost bit lines of a memory cell array of the device are substantially eliminated. In accordance with the invention, this is done by making capacitances associated with the bit lines of respective ones of the memory cell array substantially equal to one another. To accomplish this, the configuration of an inside portion of wiring other than the bit lines of the array is made the same as that of the bit lines, and the distance between the outermost bit line and the other wiring is made equal to the distance between adjacent ones of the bit lines.
摘要:
A dynamic random access memory comprises a one-transistor type MOS dynamic random access memory of an open bit line type, which comprises two memory arrays at the left and the right sides of sense amplifying circuits (2). Each of both memory arrays comprises a plurality of memory cells (1) and dummy cells (3), each of columns of memory cells (1) and dummy cells (3) having a cell plate voltage control circuit (13) connected at the end thereof through a cell plate (8). Each cell plate voltage control circuit (13) is provided with a control signal .phi..sub.G having a level changing during a period when any of word lines (5) or dummy word lines (6) is selected and is responsive to selection of the word line (5) or the dummy word line (6) to discharge the voltage of the cell plate (8) and is responsive to a change of the level of the control signal .phi..sub.G to charge the cell plate (8). Accordingly, transfer of a signal electric charge from the memory cell (1) and the dummy cell (3) to the bit line (4) is performed at a high speed, and delay of the signal of the word line (5) and the dummy word line (6) is compensated, whereby a high speed operation can be performed. In addition, a signal electric charge stored in the memory cells (1) and the dummy cells (3) is increased and the operation is accordingly stabilized.
摘要:
A plurality of single transistor memory cells with electrically charged capacitors and two similar dummy memory cells are electrically coupled in symmetric relationship to a sense amplifier for each row of the disclosed memory circuit. An address signal selects a word line connected to the memory cell on one side of the amplifier and a dummy word line connected to the dummy memory cell on its other side and applies a word signal to the selected word lines, in order to read out electric charges on the capacitors, and the amplifier amplifies a potential difference due to the read charges. For each row two dummy word lines are connected to delay means coupled to the amplifier to form an activating signal for the amplifier by delaying a potential rise developed on the selected dummy word line.