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公开(公告)号：US20220036649A1
公开(公告)日：2022-02-03
申请号：US17502669
申请日：2021-10-15
Applicant: Mitutoyo Corporation
Inventor： Shinsaku Abe , Hideyuki Kusanagi
Abstract: Provided are an offline teaching device and a measurement control device. The offline teaching device detects a shape of a measured object by a three-dimensional sensor unit, generates measurement procedure information in which measurement items are respectively associated with measurement points sequentially specified to the detected shape, and causes a measurement procedure information storage unit to store the measurement procedure information associated. The measurement control device detects a shape of a target measured object by a three-dimensional sensor unit, searches the measurement procedure information storage unit for a measured object having a shape substantially identical to a detected shape and specifies a measured object, extracts measurement procedure information on the specified measured object as measurement procedure information on the target measured object, and causes the use measuring device to measure the target measured object on the basis of the measurement procedure information extracted.
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公开(公告)号：US20210404802A1
公开(公告)日：2021-12-30
申请号：US17349300
申请日：2021-06-16
Applicant: MITUTOYO CORPORATION , Mitutoyo Europe GmbH
Inventor： Till Martin BRUCKDORFER
IPC: G01B21/30
Abstract: A method for filtering a measurement data set usable for specifying and/or verifying an internal feature of a workpiece, the method includes providing a measurement data set comprising a plurality of measurement points of the internal feature; providing an auxiliary feature representing an ideal estimate for the internal feature of the workpiece; mirroring each measurement point of the measurement data set on a boundary element of the auxiliary feature, thereby generating a first modified data set comprising a plurality of first modified measurement points; determining a convex hull of the first modified measurement points and projecting the first modified measurement points onto the determined convex hull, thereby generating a second modified data set comprising a plurality of second modified measurement points; and mirroring each second modified measurement point on the boundary element of the auxiliary feature, thereby generating a filtered measurement data set comprising a plurality of filtered measurement points.
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公开(公告)号：US11204237B2
公开(公告)日：2021-12-21
申请号：US17069256
申请日：2020-10-13
Applicant: MITUTOYO CORPORATION
Inventor： Shota Sakakibara , Hiroshi Kamitani
Abstract: There is provided a method for controlling a shape measuring apparatus that relatively moves a probe and a workpiece with a translation movement mechanism and a rotary drive mechanism to perform scanning measurement on the workpiece by moving the probe along a scanning path set in advance.
The method includes setting, by an operator, a scanning path and a rotation angle command for the rotary drive mechanism, dividing data about the scanning path into a plurality of segments and setting a translational velocity pattern of the translation movement mechanism for each segment, calculating for each segment, based on the rotation angle command, a rotation angle value at a start of the segment and a rotation angle value at an end of the segment and generating an angular velocity pattern for each segment, correcting the translational velocity pattern to reduce a rotation amount of the rotation command given by the angular velocity pattern and generating a corrected translational velocity pattern, and driving and controlling, based on a resultant velocity vector based on the corrected translational velocity pattern, the translation movement mechanism and simultaneously driving and controlling, based on an angular velocity command based on the angular velocity pattern, the rotary drive mechanism.-
公开(公告)号：US11193749B2
公开(公告)日：2021-12-07
申请号：US16655811
申请日：2019-10-17
Applicant: MITUTOYO CORPORATION
Inventor： Tatsuki Nakayama
Abstract: The present disclosure uses a surface property measuring device that includes an arm swingably supported so as to displace a stylus vertically, and an arm lifter that holds the stylus at a predetermined height by rotating the arm. After arranging the arm lifter in a state where the arm can be held at a lower limit height that is only a predetermined drop amount below a predetermined measurement height, the arm is arranged at the measurement height and the stylus contacts a measured object, and in this state surface properties of the measured object are measured.
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公开(公告)号：US20210333083A1
公开(公告)日：2021-10-28
申请号：US17001328
申请日：2020-08-24
Applicant: Mitutoyo Corporation
Inventor： Joseph Daniel Tobiason
Abstract: A calibration configuration for a chromatic range sensor (CRS) optical probe of a coordinate measurement machine (CMM) includes a cylindrical calibration object and a spherical calibration object. The cylindrical calibration object includes at least a first nominally cylindrical calibration surface having a central axis that extends along a Z direction that is intended to be aligned approximately parallel to a rotation axis of the CRS optical probe. The spherical calibration object includes a nominally spherical calibration surface having a first plurality of surface portions. The CMM is operated to obtain radial distance measurements and determine cylindrical calibration data using radial distance measurements of the cylindrical calibration object and to determine spherical calibration data using radial distance measurements of the spherical calibration object.
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Patent Agency Ranking
公开(公告)号：US20210333079A1
公开(公告)日：2021-10-28
申请号：US17236061
申请日：2021-04-21
Applicant: MITUTOYO CORPORATION
Inventor： Takuma MIZUNAGA
Abstract: ID numbers of connected multiple modules are easily automatically set.
Each of the multiple modules includes an ID number information holding unit that holds its own ID number information, a first command generation unit that generates a first command for notifying its rear stage of its own ID number information, a first command output unit that outputs the first command from a rear-stage output port, a second command generation unit that generates a second command for notifying its front stage of its own ID number information and ID number information on its rear-stage modules, a second command output unit that outputs the second command from a front-stage output port, and an ID number information update unit that sets, when the first command is received from a front-stage module, new ID number obtained by adding “1” to the ID number of the front-stage module contained in the received first command as its own ID number information in the ID number information holding unit. Each of the multiple modules outputs the first command and second commands for a predetermined period of time to assign a different ID number to each of the multiple modules connected to a network apparatus.-
公开(公告)号：US11156537B2
公开(公告)日：2021-10-26
申请号：US16587213
申请日：2019-09-30
Applicant: MITUTOYO CORPORATION
Inventor： Masaru Kawazoe , Naoki Izumi
Abstract: A controller of a hardness tester can determine, in a condition where a driver is not in operation and when a spring displacement detector and an arm displacement detector detect an amount of displacement of respective objects (plate spring and loading arm), that a loading arm and a plate spring are deformed according to changes in environmental temperature. A favorable hardness test can be performed by the hardness tester corresponding to the environmental temperature according to the determination by carrying out an initialization process that resets the displacement amount of respective object to zero, the displacement amount detected by the spring displacement detector and the arm displacement detector respectively.
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公开(公告)号：US11137269B2
公开(公告)日：2021-10-05
申请号：US15804170
申请日：2017-11-06
Applicant: MITUTOYO CORPORATION
Inventor： Osamu Kawatoko , Tomohiro Tahara , Hirokazu Kobayashi
Abstract: A reference voltage generator circuit generates a reference voltage corresponding to a power supply voltage. A current/voltage converter circuit converts a photocurrent output by a photoreceiver into voltage, and outputs a voltage obtained by adding the converted voltage and the reference voltage. A sample and hold circuit holds a voltage of a capacitor in response to a sample and hold signal, the capacitor having the voltage input at one end and the reference voltage input at another end. An amplifier circuit outputs an output signal where a voltage held by the sample and hold circuit is amplified with the reference voltage as a reference.
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公开(公告)号：US11119395B2
公开(公告)日：2021-09-14
申请号：US16031406
申请日：2018-07-10
Applicant: Mitutoyo Corporation
Inventor： Ryusuke Kato , Eisuke Moriuchi
Abstract: An image pickup apparatus that is capable of improving measurement accuracy and measurement workability of an optical measurement apparatus, an optical measurement apparatus including the image pickup apparatus, and a measurement system. An image pickup apparatus according to an embodiment includes a base section, a beam splitter, and an image pickup section. The base is configured to detachably attach to an optical measurement apparatus including an optical projection system configured to project an image of a subject on a screen. The beam splitter is disposed on an optical axis of the optical projection system upon attachment of the base to the optical measurement apparatus. The image pickup circuitry includes an image pickup device configured to receive light generated through splitting at the beam splitter and is configured to take an image of the subject upon attachment of the base.
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公开(公告)号：US11119214B2
公开(公告)日：2021-09-14
申请号：US16563362
申请日：2019-09-06
Applicant: Mitutoyo Corporation
Inventor： Joseph Daniel Tobiason , Paul Gerard Gladnick
Abstract: A triangulation sensing system includes a projection axis configuration and an imaging axis configuration. The projection axis configuration includes a triangulation light source (e.g. an incoherent source) and a variable focus lens (VFL) that is controlled to rapidly periodically modulate a triangulation light focus position (TLFP) along a Z axis over a focus position scan range, to provide a corresponding triangulation light extended focus range (TLEFR) that supports accurate measurement throughout. In some implementations, the triangulation system may be configured to provide the best measurement accuracy for a workpiece region of interest (WROI) by exposing its triangulation image only when the scanned TLFP temporarily coincides with the WROI Z height. In some implementations, the triangulation system may be configured to limit various measurement operations to using only an operational pixel subset of a detector that receives image light from the WROI, in order to shorten the measurement time.
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