Sealing structure and gasket
    71.
    发明授权
    Sealing structure and gasket 失效
    密封结构和垫片

    公开(公告)号:US08136819B2

    公开(公告)日:2012-03-20

    申请号:US12532943

    申请日:2008-03-12

    CPC classification number: F16J15/061 F16J15/025 F16J15/106

    Abstract: There is provided a sealing structure and a gasket which can seal both of a portion where a groove for mounting the gasket is formed and a portion where a groove for mounting the gasket is not formed when the portions are connected.The gasket includes a first gasket portion 110 which has a first mounted portion 111 to be mounted in a first groove 211 to come in close contact with a bottom face 211a of the first groove 211 and which is formed in a shape along an end portion of an outer wall portion 210 and a second gasket portion 120 which has a second mounted portion 150 to be mounted in a second groove 221 near a portion connected to the first gasket portion 110 and which is formed in a shape along an end portion 220 of a partition wall 220, the second mounted portion 150 having an inclined face for coming in close contact with the inclined bottom face 221a of the second groove 221.

    Abstract translation: 提供了一种密封结构和垫圈,其可以密封形成用于安装垫圈的凹槽的部分和当连接部分时不形成用于安装垫圈的凹槽的部分。 垫圈包括第一垫圈部分110,其具有第一安装部分111,其被安装在第一凹槽211中以与第一凹槽211的底面211a紧密接触,并且沿第一凹槽211的端部 外壁部分210和第二垫圈部分120,其具有第二安装部分150,该第二安装部分150安装在靠近第一密封垫片部分110的部分附近的第二凹槽221中,并且沿着第一衬垫部分220的端部220形成 分隔壁220,第二安装部分150具有与第二凹槽221的倾斜底面221a紧密接触的倾斜面。

    DATA READING WRITING APPARATUS FOR ACTIVE TAG DEVICE, ACTIVE TAG DEVICE AND SYSTEM THEREOF
    73.
    发明申请
    DATA READING WRITING APPARATUS FOR ACTIVE TAG DEVICE, ACTIVE TAG DEVICE AND SYSTEM THEREOF 审中-公开
    用于活动标签设备的数据读取写入设备,活动标签设备及其系统

    公开(公告)号:US20110279247A1

    公开(公告)日:2011-11-17

    申请号:US13186033

    申请日:2011-07-19

    CPC classification number: G06K7/0008

    Abstract: An active tag device includes a controller to cause the wireless communication unit to carry out data transmission at intervals of a first period, and to cause to start measurement of a second period set for determining a timing for causing a wireless communication unit to carry out carrier sense to detect data output by a reading writing apparatus, synchronously with the data transmission, and to cause the wireless communication unit to carry out the carrier sense after the second period elapsed. The reading writing apparatus includes a controller to cause to start measurement of the first period set for synchronizing with carrier sense of the active tag device after a wireless communication unit detected reception of data from the active tag device, and to cause the wireless communication unit to carry out data transmission to the active tag device during the second period after the first period elapsed.

    Abstract translation: 有源标签装置包括控制器,用于使无线通信单元以第一周期的间隔进行数据传输,并且使开始测量第二周期的测量,以确定用于使无线通信单元执行载波的定时 检测由读取写入装置输出的与数据传输同步的数据,并且使得无线通信单元在经过第二时间段之后执行载波侦听。 读取写入装置包括控制器,用于在无线通信单元检测到来自有源标签设备的数据的接收之后开始与有源标签设备的载波感测同步设置的第一周期的测量,并且使无线通信单元 在经过第一时间段之后的第二周期期间,向有源标签装置执行数据传输。

    Medical image processing apparatus, luminal image processing apparatus, luminal image processing method, and programs for the same
    74.
    发明授权
    Medical image processing apparatus, luminal image processing apparatus, luminal image processing method, and programs for the same 有权
    医用图像处理装置,管腔图像处理装置,管腔图像处理方法及其程序

    公开(公告)号:US08055033B2

    公开(公告)日:2011-11-08

    申请号:US11884515

    申请日:2006-02-10

    Abstract: There is provided a medical image processing apparatus including an image-extracting section extracting a frame image from in vivo motion picture data picked up by an in vivo image pickup device or a plurality of consecutively picked-up still image data, and an image analysis section analyzing the frame image extracted by the image-extracting section to output an image analysis result. The image analysis section includes a first biological-feature detection section detecting a first biological feature, a second biological-feature detection section detecting, based on a detection result obtained by the first biological feature detection section, a second biological feature in a frame image picked up temporally before or after the image used for detection by the first biological feature detection section; and a condition determination section making a determination for a biological condition based on a detection result obtained by the second biological feature detection section to output the determination.

    Abstract translation: 提供了一种医疗用图像处理装置,其包括从体内图像拾取装置拾取的体内运动图像数据或多个连续拍摄的静止图像数据中提取帧图像的图像提取部,以及图像分析部 分析由图像提取部分提取的帧图像以输出图像分析结果。 图像分析部包括检测第一生物特征的第一生物特征检测部,第二生物特征检测部,基于由第一生物特征检测部获得的检测结果,检测所拾取的帧图像中的第二生物特征 在第一生物特征检测部分用于检测的图像之前或之后, 以及条件确定部,其基于由所述第二生物特征检测部获得的检测结果来判定生物状态,以输出所述判定。

    ENDOSCOPE INSERTION SHAPE ANALYSIS APPARATUS AND ENDOSCOPE INSERTION SHAPE ANALYSIS SYSTEM
    76.
    发明申请
    ENDOSCOPE INSERTION SHAPE ANALYSIS APPARATUS AND ENDOSCOPE INSERTION SHAPE ANALYSIS SYSTEM 审中-公开
    内窥镜插入形状分析装置和内窥镜插入形状分析系统

    公开(公告)号:US20090149703A1

    公开(公告)日:2009-06-11

    申请号:US12064310

    申请日:2006-07-24

    Applicant: Hideki Tanaka

    Inventor: Hideki Tanaka

    Abstract: An electronic endoscope system as an endoscope insertion shape analysis apparatus of the invention includes: an electronic endoscope having an insertion portion to be inserted into a body cavity; a shape observation apparatus and the like for detecting a shape of the insertion portion by a plurality of source coils of the insertion portion of the endoscope, a sense coil unit, and a shape processing device; and a display for displaying an endoscope image picked up by the endoscope and the shape detected by the shape observation apparatus; and further includes a PC for classifying shape data into a pattern based on the shape detected by the shape processing device.

    Abstract translation: 一种作为本发明的内窥镜插入形状分析装置的电子内窥镜系统,具有:具有插入体腔内的插入部的电子内窥镜; 用于通过内窥镜的插入部分的多个源极线圈,感测线圈单元和形状处理装置来检测插入部分的形状的形状观察装置等; 以及显示器,用于显示由内窥镜拾取的内窥镜图像和由形状观察装置检测的形状; 并且还包括基于由形状处理装置检测到的形状将形状数据分类为图案的PC。

    Method of manufacturing a semiconductor device and electronic equipment
    77.
    发明授权
    Method of manufacturing a semiconductor device and electronic equipment 失效
    制造半导体器件和电子设备的方法

    公开(公告)号:US07405134B2

    公开(公告)日:2008-07-29

    申请号:US11065126

    申请日:2005-02-24

    Abstract: Exemplary embodiments of the present invention provide a method of manufacturing a semiconductor device that can take a connection between layers without giving damage to a layer, which is underlying. The semiconductor device includes forming conductive members Ms and Md at a predetermined position of a semiconductor film, forming an insulating film on a whole surface of a substrate excluding the conductive members Ms and Md, and forming a conductive film that is connected to the semiconductor film with the conductive member Ms and Md.

    Abstract translation: 本发明的示例性实施例提供一种制造半导体器件的方法,该半导体器件可以在层之间进行连接,而不会损害下层的层。 半导体器件包括在半导体膜的预定位置处形成导电构件Ms和Md,在除了导电构件Ms和Md之外的基板的整个表面上形成绝缘膜,并且形成连接到半导体膜的导电膜 与导电构件Ms和Md。

    SUBSTRATE PROCESSING APPARATUS AND ANALYSIS METHOD THEREFOR
    79.
    发明申请
    SUBSTRATE PROCESSING APPARATUS AND ANALYSIS METHOD THEREFOR 有权
    基板加工设备及其分析方法

    公开(公告)号:US20080110233A1

    公开(公告)日:2008-05-15

    申请号:US11931145

    申请日:2007-10-31

    CPC classification number: H01L22/26

    Abstract: An analysis method for a substrate processing apparatus capable of accurately detecting a state in a housing chamber. Emission intensities of processing gas before being introduced into the chamber and processing gas having passed therethrough are measured before an inter-chamber part is replaced. If an emission intensity measured after the replacement coincides with that measured before the replacement, an emission intensity of the processing gas having passed through the chamber is measured, and a variation between the emission intensities of the processing gas having passed through the chamber measured before and after the replacement is calculated. After start of plasma processing on wafers, an emission intensity of the processing gas having passed through the chamber is measured and the variation is removed therefrom to calculate an emission intensity really representing a state in the chamber, thus detecting an end point of plasma processing therefrom.

    Abstract translation: 一种能够精确地检测收纳室内的状态的基板处理装置的分析方法。 在更换腔室间部分之前,测量在引入室内的处理气体的排放强度和处理通过其中的气体之前。 如果在更换之后测量的发射强度与更换之前测量的发射强度一致,则测量已经通过室的处理气体的发射强度,并且测量了之前经过腔室的处理气体的发射强度之间的变化, 更换后计算。 在开始对晶片进行等离子体处理之后,测量已经通过室的处理气体的发射强度,并从其中去除变化,从而计算出真实表示室内状态的发射强度,从而检测等离子体处理的终点 。

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