公开(公告)号：US20170089954A1

公开(公告)日：2017-03-30

申请号：US14870357

申请日：2015-09-30

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G01R13/02

CPC classification number: G01R13/0218 ,  G01R13/0272 ,  G01R13/029 ,  H03M1/188

Abstract: A test and measurement instrument, including a splitter configured to split an input signal into two split input signals and output each split input signal onto a separate path and a combiner configured to receive and combine an output of each path to reconstruct the input signal. Each path includes an amplifier configured to receive the split input signal and to compress the split input signal with a sigmoid function, a digitizer configured to digitize an output of the amplifier; and at least one processor configured to apply an inverse sigmoid function on the output of the digitizer.

公开(公告)号：US09596074B2

公开(公告)日：2017-03-14

申请号：US15076173

申请日：2016-03-21

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: H04L25/00 ,  H04L25/40 ,  H04L7/033 ,  H04L7/00

CPC classification number: H04L7/033 ,  G01R13/00 ,  H04L1/20 ,  H04L1/205 ,  H04L7/0008 ,  H04L7/027 ,  H04L7/0331 ,  H04L25/03878

Abstract: Embodiments of the present invention provide improved techniques for recovering clock information from data signals. In one embodiment, a general purpose device such as a real-time oscilloscope acquires a data signal. The device takes a derivative of the data signal, then computes the square or absolute of the derivative before applying a bandpass filter. The bandpass filter is a windowing function a spectrum that is wider than the clock, and has a flat top and smooth transitions on both sides. In one embodiment, at Tukey window may be used. The device finds edge crossing times of the filtered result, and applies a phase-locked loop or lowpass filter to the edge crossing times in order to recover a stable clock signal. When the improved techniques are implemented in software, they may be used with any number of different equalizers that are required by various high-speed serial data link systems.

Abstract translation: 本发明的实施例提供了用于从数据信号恢复时钟信息的改进技术。 在一个实施例中，诸如实时示波器的通用设备获取数据信号。 器件取数据信号的导数，然后在应用带通滤波器之前计算导数的平方或绝对值。 带通滤波器是一个比时钟宽的频谱的窗口功能，并且在两侧具有平坦的顶部和平滑的过渡。 在一个实施例中，可以使用Tukey窗口。 器件发现滤波结果的边沿交叉时间，并向边沿交叉时间施加锁相环或低通滤波器，以恢复稳定的时钟信号。 当改进的技术在软件中实现时，它们可以与各种高速串行数据链路系统所需的任何数量的不同均衡器一起使用。

公开(公告)号：US20160018450A1

公开(公告)日：2016-01-21

申请号：US14673747

申请日：2015-03-30

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G01R27/06

CPC classification number: G01R27/28 ,  G01R27/06 ,  G01R27/16 ,  G01R31/2839 ,  G01R31/2841

Abstract: A method for determining scattering parameters of a device under test using a real-time oscilloscope. The method includes calculating a reflection coefficient of each port of a device under test with N ports, wherein N is greater than one, based on a first voltage measured by the real-time oscilloscope when a signal is generated from a signal generator. The method also includes determining an insertion loss coefficient of each port of the device under test, including calculating the insertion loss coefficient of the port of the device under test to be measured based on a second voltage measured by the real-time oscilloscope when a signal is generated from a signal generator.

Abstract translation: 使用实时示波器确定被测器件的散射参数的方法。 该方法包括基于当从信号发生器产生信号时由实时示波器测量的第一电压，用N个端口计算被测设备的每个端口的反射系数，其中N大于1。 该方法还包括确定被测设备的每个端口的插入损耗系数，包括基于由实时示波器测量的第二电压计算待测量的被测器件的端口的插入损耗系数，当信号 从信号发生器产生。

公开(公告)号：US09191245B2

公开(公告)日：2015-11-17

申请号：US14468553

申请日：2014-08-26

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: H03H7/30 ,  H03H7/40 ,  H03K5/159 ,  H04L25/03

CPC classification number: H04L25/03057 ,  H04L25/03885 ,  H04L2025/03707

Abstract: Computationally efficient methods and related systems, for use in a test and measurement instrument, such as an oscilloscope, optimize the performance of DFEs used in a high-speed serial data link by identifying optimal DFE tap values for peak-to-peak based criteria. The optimized DFEs comply with the behavior of a model DFE set forth in the PCIE 3.0 specification.

Abstract translation: 用于测试和测量仪器（如示波器）中的计算有效的方法和相关系统通过识别基于峰 - 峰的标准的最佳DFE抽头值来优化高速串行数据链路中使用的DFE的性能。 优化的DFE符合PCIE 3.0规范中规定的DFE型号的行为。

公开(公告)号：US20150084656A1

公开(公告)日：2015-03-26

申请号：US14267697

申请日：2014-05-01

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Daniel G. Knierim

IPC: G01R31/319

CPC classification number: G01R31/31924 ,  G01R27/28 ,  G01R35/005

Abstract: A test and measurement system including a device under test, two de-embed probes connected to the device under test, and a test and measurement instrument connected to the two de-embed probes. The test and measurement instrument includes a processor configured to determine the S-parameter set of the device under test based on measurements from the device under test taken by the two de-embed probes.

Abstract translation: 包括被测器件的测试和测量系统，连接到被测器件的两个解嵌探测器以及连接到两个解嵌探测器的测试和测量仪器。 测试和测量仪器包括处理器，其被配置为基于由两个解嵌入探针所采取的被测器件的测量值确定被测器件的S参数组。