Determining mode spectra for principal states of polarization
    71.
    发明授权
    Determining mode spectra for principal states of polarization 失效
    确定主要极化状态的光谱

    公开(公告)号:US07397542B2

    公开(公告)日:2008-07-08

    申请号:US10649211

    申请日:2003-08-27

    IPC分类号: G01N21/00

    CPC分类号: G01M11/337

    摘要: For determining mode spectra of an optical property of a device under test (DUT) in dependence on a spectral parameter, with the mode spectra corresponding to the device's principal states of polarization (PSPs), minimum and maximum envelope values are determined for the optical property, or other measured values from which the envelope values can be determined with respect to possible state of polarization of light that is incident upon the DUT, whereby the minimum envelope values and the maximum envelope values are determined for a spectral range of interest of the spectral parameter. The mode spectra are derived for the optical property for at least one of the PSPs as a function of the spectral parameter for the spectral range of interest, whereby a partial correspondence of the mode spectra with the minimum and maximum envelope values is used for deriving the mode spectra.

    摘要翻译: 为了根据光谱参数确定待测器件(DUT)的光学特性的模式光谱,通过与器件的主要偏振态PSP相对应的模式光谱,确定光学特性的最小和最大包络值 或其他测量值,可以从入射到DUT的光的可能偏振状态确定包络值,由此针对光谱的感兴趣的光谱范围确定最小包络值和最大包络值 参数。 根据感兴趣的光谱范围的光谱参数的函数,为至少一个PSP的光学性质导出模式光谱,由此使用模式光谱与最小和最大包络值的部分对应来导出 模式光谱。

    Determination of polarization dependent properties
    72.
    发明授权
    Determination of polarization dependent properties 失效
    确定极化相关性质

    公开(公告)号:US07352450B2

    公开(公告)日:2008-04-01

    申请号:US11166899

    申请日:2005-06-24

    IPC分类号: G01N21/00

    CPC分类号: G01M11/337 G01M11/336

    摘要: The invention relates to determining a polarization dependent property of an optical device under test, wherein a response signal is received from the device under test in response to an optical stimulus signal having an reference state of polarization, an output state of polarization of the response signal is determined, a reference information about the reference state of polarization is received, the reference state of polarization is determined on the base of the reference information and a predefined function describing the dependency of reference information versus the reference state of polarization, and the polarization dependent property is determined on the base of the reference state of polarization and the output state of polarization.

    摘要翻译: 本发明涉及确定被测光学器件的偏振相关特性,其中响应于具有参考偏振状态的光激励信号,响应信号的极化的输出状态,从被测器件接收响应信号 接收到关于偏振参考状态的参考信息,基于参考信息确定偏振参考状态,并且描述参考信息相对于参考偏振状态的依赖性的预定函数,以及偏振相关 基于极化的参考状态和偏振的输出状态来确定属性。

    Elementary matrix based optical signal/network analyzer
    74.
    发明申请
    Elementary matrix based optical signal/network analyzer 有权
    基于矩阵的光信号/网络分析仪

    公开(公告)号:US20060238770A1

    公开(公告)日:2006-10-26

    申请号:US11112457

    申请日:2005-04-22

    申请人: Bogdan Szafraniec

    发明人: Bogdan Szafraniec

    IPC分类号: G01B9/02

    摘要: A method for characterizing a device under test includes propagating multiple optical signals through the device under test and combining the multiple optical signals with a reference optical signal. The multiple optical signals are mixed with the reference optical signal and a relative perturbation between the multiple optical signals from the mixing of the multiple optical signals with the reference optical signal is determined. In another embodiment a modulated optical signal is provided from a local oscillator and the modulated optical signal is combined with the input optical signal. The modulated optical signal is mixed with the input signal to provide a mixed signal and at least one polarization-resolved parameter of the input optical signal is extracted from the mixed signal.

    摘要翻译: 用于表征被测器件的方法包括通过被测器件传播多个光信号,并将多个光信号与参考光信号组合。 多个光信号与参考光信号混合,并且确定来自多个光信号与参考光信号的混合的多个光信号之间的相对扰动。 在另一个实施例中,调制的光信号由本地振荡器提供,并且调制的光信号与输入的光信号组合。 调制的光信号与输入信号混合以提供混合信号,并且从混合信号中提取输入光信号的至少一个偏振解析参数。

    Interferometric optical analyzer and method for measuring the linear response of an optical component
    75.
    发明申请
    Interferometric optical analyzer and method for measuring the linear response of an optical component 失效
    干涉光学分析仪以及用于测量光学部件的线性响应的方法

    公开(公告)号:US20060114471A1

    公开(公告)日:2006-06-01

    申请号:US11287972

    申请日:2005-11-28

    申请人: Normand Cyr

    发明人: Normand Cyr

    IPC分类号: G01B9/02

    摘要: An interferometric optical analyzer apparatus comprises a light source, an interferometer and a detection system for determining the linear response, and subsequently any optical parameter, of one or more optical elements using substantially unpolarized light. In one embodiment, the light source supplies substantially unpolarized coherent light over a predetermined range of optical frequencies. The optical element is coupled in one arm of the interferometer and the other arm of the interferometer is used as a reference. The unpolarized light is first passed through the interferometer then through a three-way polarization splitter unit to split the light into at least three light beams according to preselected polarization axes corresponding to three linearly independent states of polarization. The three light beams are coupled to individual detectors and a controller computes Jones matrix elements from the resulting electrical signals. The total polarization independent power may also be determined by an additional detector.

    摘要翻译: 干涉光学分析仪装置包括光源,干涉仪和用于使用基本上非偏振光确定一个或多个光学元件的线性响应以及随后的任何光学参数的检测系统。 在一个实施例中,光源在预定范围的光学频率上提供基本上非偏振的相干光。 光学元件耦合在干涉仪的一个臂中,并且干涉仪的另一个臂用作参考。 首先将非偏振光通过干涉仪,然后通过三路偏振分离器单元,根据对应于三个线性独立的偏振态的预选偏振轴将光分成至少三个光束。 三个光束耦合到各个检测器,并且控制器从所得到的电信号中计算Jones矩阵元素。 总极化独立功率也可以由另外的检测器确定。

    Single sweep polarization dependent loss measurement
    76.
    发明授权
    Single sweep polarization dependent loss measurement 失效
    单次扫描偏振相关损耗测量

    公开(公告)号:US06856386B2

    公开(公告)日:2005-02-15

    申请号:US10393642

    申请日:2003-03-21

    IPC分类号: G01M11/00 G01N21/00 G01N21/21

    CPC分类号: G01M11/337

    摘要: A polarization scan module is presented. The polarization scan module according to some embodiments of the present invention includes a swept-wavelength optical source providing a light signal that sweeps over a range of optical wavelengths, the light signal having a state of polarization; and a polarization rotator that rotates the state of polarization over a Poincare sphere as the light signal wavelength is swept within the range to produce a test optical signal. A single sweep polarization dependent loss measurement can be achieved with some embodiments of the present invention. In some embodiments, measurements of the state of polarization and optical power at the input and output of an optical component being tested together with the known optical wavelength for the state of polarization, taken at four different polarizations, can provide a set of measurement data that can be used to compute the polarization dependent loss.

    摘要翻译: 提出了偏振扫描模块。 根据本发明的一些实施例的偏振扫描模块包括扫描波长光源,其提供扫过一定范围的光波长的光信号,所述光信号具有偏振状态; 以及偏振旋转器,当光信号波长在该范围内扫描以产生测试光信号时,使Poincare球体上的偏振状态旋转。 可以通过本发明的一些实施例来实现单次扫描偏振相关损耗测量。 在一些实施例中,正在测试的光学部件的输入和输出处的偏振状态和光功率的测量结果与用于在四个不同偏振处获得的偏振状态的已知光学波长一起可以提供一组测量数据, 可用于计算偏振相关损耗。

    Polarization dependent loss measuring apparatus
    77.
    发明授权
    Polarization dependent loss measuring apparatus 失效
    偏振相关损耗测量仪

    公开(公告)号:US06798510B2

    公开(公告)日:2004-09-28

    申请号:US10322840

    申请日:2002-12-18

    申请人: Kiyohisa Fujita

    发明人: Kiyohisa Fujita

    IPC分类号: G01J400

    CPC分类号: G01M11/337

    摘要: Wavelength dependent measurement is made by launching light into an object 8 to be measured and receiving transmitted light from the object 8 while continuously changing wavelengths of output light. Next, peak wavelength detection processing for detecting a wavelength at the time when loss or gain of the transmitted light from the object 8 becomes maximum based on a wavelength dependent measurement result is performed. Then, polarization dependent loss measurement processing for measuring polarization dependent loss of the object 8 is performed by measuring the transmitted light from the object 8 while launching light of a measurement wavelength detected into the object 8 and randomly changing a polarization state of the light. Further, a control circuit processes associating a wavelength dependent analysis result with a PDL measurement result, and displays its result on a display part 2.

    摘要翻译: 通过将光发射到待测量的对象8中并且在连续改变输出光的波长的同时接收来自对象8的透射光而进行波长依赖测量。 接着,进行基于波长相关测量结果来检测来自对象8的透射光的损失或增益变为最大时的波长的峰值波长检测处理。 然后,通过在检测到对象8的测量波长的光的同时测量来自对象8的透射光并随机改变光的偏振状态来进行用于测量对象8的偏振相关损耗的偏振相关损耗测量处理。 此外,控制电路处理将波长相关分析结果与PDL测量结果相关联,并将其结果显示在显示部分2上。

    Measurement of polarization dependent characteristic of optical components
    78.
    发明授权
    Measurement of polarization dependent characteristic of optical components 失效
    光学元件偏振相关特性的测量

    公开(公告)号:US06671038B2

    公开(公告)日:2003-12-30

    申请号:US10075864

    申请日:2002-02-13

    申请人: Ralf Stolte

    发明人: Ralf Stolte

    IPC分类号: G01N2100

    摘要: For measuring a polarization dependent parameter of an optical device under test—DUT—, an optical source provides an optical stimulus signal at variable wavelengths, and a polarization translator translates the polarization state of the optical stimulus signal applied from the optical source at its input to its output in a deterministic way dependent on the wavelength of the optical stimulus signal. A receiving unit receives an optical response signal from the DUT to the applied optical stimulus signal, and an analyzing unit analyzes received optical response signals for different wavelengths for determining values of the polarization dependent parameter of the DUT.

    摘要翻译: 为了测量被测试的DUT的光学器件的偏振相关参数,光源提供可变波长的光学激励信号,偏振平移器将从光源在其输入处施加的光学刺激信号的偏振状态转换为 其输出以确定性方式取决于光刺激信号的波长。 接收单元接收从DUT到所应用的光激励信号的光响应信号,并且分析单元分析用于不同波长的接收光响应信号,以确定DUT的偏振相关参数的值。

    Measurement of optical properties of passive optical devices using the matrix method
    79.
    发明申请
    Measurement of optical properties of passive optical devices using the matrix method 失效
    使用矩阵法测量无源光学器件的光学特性

    公开(公告)号:US20030160951A1

    公开(公告)日:2003-08-28

    申请号:US10373736

    申请日:2003-02-27

    IPC分类号: G01N021/00

    CPC分类号: G01N21/21 G01J4/04 G01M11/337

    摘要: A property of a device that is dependent upon both wavelength and state of polarization is measured by; passing through the device an optical signal having its wavelength and SOP varied, the wavelength over a spectral range of the device and the SOP between four Mueller SOPs; measuring the insertion loss of the device for each of the four SOPS and at each wavelength; using the four insertion loss measurements for each of the four different states of polarization for each wavelength to compute the four elements of the first line of the Mueller matrix for each wavelength; and using the Mueller matrix elements, computing insertion loss variations for the device for a multiplicity of input states of polarization in addition to the four states of polarization for which the actual attenuation measurements were made and using the insertion loss variations to compute the polarization and wavelength dependent property.

    摘要翻译: 取决于波长和极化状态的器件的性质是通过测量的; 通过该器件具有其波长和SOP的光信号变化,器件的光谱范围上的波长和四个Mueller SOP之间的SOP; 测量四个SOPS中每一个和每个波长的器件的插入损耗; 对于每个波长使用四种不同极化状态中的每一种的四次插入损耗测量来计算每个波长的Mueller矩阵的第一行的四个元素; 并且使用Mueller矩阵元素,除了进行实际衰减测量的四个极化状态之外,还计算多个输入极化状态的装置的插入损耗变化,并且使用插入损耗变化来计算极化和波长 依赖财产。

    Method of and apparatus for making wavelength-resolved polarimetric measurements
    80.
    发明申请
    Method of and apparatus for making wavelength-resolved polarimetric measurements 失效
    波长分辨测量的方法和设备

    公开(公告)号:US20030095264A1

    公开(公告)日:2003-05-22

    申请号:US10281588

    申请日:2002-10-23

    发明人: Bernard Ruchet

    IPC分类号: G01B009/02

    摘要: Apparatus for making wavelength-resolved polarimetric measurements comprises an interferometric source (10,12), for example a broadband source (10) and an optical interferometer unit (12), and a polarization generator unit (16) for generating different states of polarization of light received from the interferometric source and applying same to a device-under-test (30). A polarimeter unit (20) receives and polarimetrically-analyzes light from the device-under-test, converts the polarimetrically-analyzed light into electrical signals, and, using Fast Fourier Transform numerical analysis, computes therefrom the wavelength-resolved polarimetric measurements. Placing the optical interferometer unit (10,12) nullupstreamnull not only of the device-under-test (30), but also of the polarisation generator unit (16), means that the latter substantially eliminates polarization dependent effects introduced by the former. The polarimeter (20) can still perform the necessary transformation even though the interferogram has been passed through the polarisation generator unit and the device-under-test.

    摘要翻译: 用于进行波长分辨偏振测量的装置包括干涉源(10,12),例如宽带源(10)和光干涉仪单元(12),以及偏振发生器单元(16),用于产生不同的偏振态 从干涉光源接收的光并将其施加到被测设备(30)。 偏振器单元(20)接收并极化分析来自被测器件的光,将偏振分析的光转换为电信号,并使用快速傅里叶变换数值分析,计算波长分辨的极化测量值。 将光干涉仪单元(10,12)“上游”不仅被测器件(30)而且还包括偏振发生器单元(16),这意味着后者基本消除了由前者产生的偏振相关效应 。 即使干涉图已经通过偏振发生器单元和被测器件,旋光仪仍然可以进行必要的变换。