摘要:
For determining mode spectra of an optical property of a device under test (DUT) in dependence on a spectral parameter, with the mode spectra corresponding to the device's principal states of polarization (PSPs), minimum and maximum envelope values are determined for the optical property, or other measured values from which the envelope values can be determined with respect to possible state of polarization of light that is incident upon the DUT, whereby the minimum envelope values and the maximum envelope values are determined for a spectral range of interest of the spectral parameter. The mode spectra are derived for the optical property for at least one of the PSPs as a function of the spectral parameter for the spectral range of interest, whereby a partial correspondence of the mode spectra with the minimum and maximum envelope values is used for deriving the mode spectra.
摘要:
The invention relates to determining a polarization dependent property of an optical device under test, wherein a response signal is received from the device under test in response to an optical stimulus signal having an reference state of polarization, an output state of polarization of the response signal is determined, a reference information about the reference state of polarization is received, the reference state of polarization is determined on the base of the reference information and a predefined function describing the dependency of reference information versus the reference state of polarization, and the polarization dependent property is determined on the base of the reference state of polarization and the output state of polarization.
摘要:
A fiber optic measurement device including an optical frequency domain reflectometer (10) performs polarization diversity detection without using a polarizing beam splitter.
摘要:
A method for characterizing a device under test includes propagating multiple optical signals through the device under test and combining the multiple optical signals with a reference optical signal. The multiple optical signals are mixed with the reference optical signal and a relative perturbation between the multiple optical signals from the mixing of the multiple optical signals with the reference optical signal is determined. In another embodiment a modulated optical signal is provided from a local oscillator and the modulated optical signal is combined with the input optical signal. The modulated optical signal is mixed with the input signal to provide a mixed signal and at least one polarization-resolved parameter of the input optical signal is extracted from the mixed signal.
摘要:
An interferometric optical analyzer apparatus comprises a light source, an interferometer and a detection system for determining the linear response, and subsequently any optical parameter, of one or more optical elements using substantially unpolarized light. In one embodiment, the light source supplies substantially unpolarized coherent light over a predetermined range of optical frequencies. The optical element is coupled in one arm of the interferometer and the other arm of the interferometer is used as a reference. The unpolarized light is first passed through the interferometer then through a three-way polarization splitter unit to split the light into at least three light beams according to preselected polarization axes corresponding to three linearly independent states of polarization. The three light beams are coupled to individual detectors and a controller computes Jones matrix elements from the resulting electrical signals. The total polarization independent power may also be determined by an additional detector.
摘要:
A polarization scan module is presented. The polarization scan module according to some embodiments of the present invention includes a swept-wavelength optical source providing a light signal that sweeps over a range of optical wavelengths, the light signal having a state of polarization; and a polarization rotator that rotates the state of polarization over a Poincare sphere as the light signal wavelength is swept within the range to produce a test optical signal. A single sweep polarization dependent loss measurement can be achieved with some embodiments of the present invention. In some embodiments, measurements of the state of polarization and optical power at the input and output of an optical component being tested together with the known optical wavelength for the state of polarization, taken at four different polarizations, can provide a set of measurement data that can be used to compute the polarization dependent loss.
摘要:
Wavelength dependent measurement is made by launching light into an object 8 to be measured and receiving transmitted light from the object 8 while continuously changing wavelengths of output light. Next, peak wavelength detection processing for detecting a wavelength at the time when loss or gain of the transmitted light from the object 8 becomes maximum based on a wavelength dependent measurement result is performed. Then, polarization dependent loss measurement processing for measuring polarization dependent loss of the object 8 is performed by measuring the transmitted light from the object 8 while launching light of a measurement wavelength detected into the object 8 and randomly changing a polarization state of the light. Further, a control circuit processes associating a wavelength dependent analysis result with a PDL measurement result, and displays its result on a display part 2.
摘要:
For measuring a polarization dependent parameter of an optical device under test—DUT—, an optical source provides an optical stimulus signal at variable wavelengths, and a polarization translator translates the polarization state of the optical stimulus signal applied from the optical source at its input to its output in a deterministic way dependent on the wavelength of the optical stimulus signal. A receiving unit receives an optical response signal from the DUT to the applied optical stimulus signal, and an analyzing unit analyzes received optical response signals for different wavelengths for determining values of the polarization dependent parameter of the DUT.
摘要:
A property of a device that is dependent upon both wavelength and state of polarization is measured by; passing through the device an optical signal having its wavelength and SOP varied, the wavelength over a spectral range of the device and the SOP between four Mueller SOPs; measuring the insertion loss of the device for each of the four SOPS and at each wavelength; using the four insertion loss measurements for each of the four different states of polarization for each wavelength to compute the four elements of the first line of the Mueller matrix for each wavelength; and using the Mueller matrix elements, computing insertion loss variations for the device for a multiplicity of input states of polarization in addition to the four states of polarization for which the actual attenuation measurements were made and using the insertion loss variations to compute the polarization and wavelength dependent property.
摘要:
Apparatus for making wavelength-resolved polarimetric measurements comprises an interferometric source (10,12), for example a broadband source (10) and an optical interferometer unit (12), and a polarization generator unit (16) for generating different states of polarization of light received from the interferometric source and applying same to a device-under-test (30). A polarimeter unit (20) receives and polarimetrically-analyzes light from the device-under-test, converts the polarimetrically-analyzed light into electrical signals, and, using Fast Fourier Transform numerical analysis, computes therefrom the wavelength-resolved polarimetric measurements. Placing the optical interferometer unit (10,12) nullupstreamnull not only of the device-under-test (30), but also of the polarisation generator unit (16), means that the latter substantially eliminates polarization dependent effects introduced by the former. The polarimeter (20) can still perform the necessary transformation even though the interferogram has been passed through the polarisation generator unit and the device-under-test.