摘要:
An inductance element (1) includes a doughnut-shaped magnetic core (2) and a bottomed container (3) for housing the doughnut-shaped magnetic core (2). The bottomed container (3) has a cylindrical outer wall portion, a cylindrical inner wall portion, a bottom portion, an open section and a hollow portion. The open section of the bottomed container (3) is covered with an adhesive portion (4) for integrally fixing the doughnut-shaped magnetic core (2) and the bottomed container (3). The adhesive portion (4) has an extended portion (4a) extended in the cylindrical inner wall portion. The ratio (B/A) of a length (B) of the extended portion (4a) to a height (A) of the cylindrical inner wall portion is in a range of 0.1 to 0.5.
摘要:
A probe card having a plurality of silicon finger contactors contacting pads provided on a tested semiconductor wafer and a probe board mounting the plurality of silicon finger contactors on its surface, wherein each silicon finger contactor has a base part on which a step difference is formed, a support part with a rear end side provided at the base part and with a front end side sticking out from the base part, and a conductive part formed on the surface of the support part, each silicon finger contactor mounted on the probe board so that an angle part of the step difference formed on the base part contacts the surface of the probe board.
摘要:
In one embodiment, an inductance element includes a toroidal core and a bottomed insulating resin case. The bottomed insulating resin case includes a cylindrical outer wall section, a cylindrical inner wall section, a bottom section, an open section and a hollow section. The cylindrical outer wall section has an extending section exceeding the height of the toroidal core. The open section of the insulating resin case is covered with a cover portion having a bent section formed by bending an extending section of the cylindrical outer wall section.
摘要:
Lactobacillus screening methods were carried out using surface plasmon resonance spectrums and human intestinal mucin and blood group antigens as probes. A trial to set selection criteria in the above-mentioned methods of screening for lactobacilli was made to adapt the methods to mass screening, and it was discovered that lactobacilli compatible with ABO blood groups can be screened by setting 100 RU as a criterion for judging bacterial binding under certain conditions. Using 238 lactobacillus strains, the above-mentioned screening methods and tests to judge their compatibility for the use of yogurt production were carried out, to at long last specifically discover bacillus strains compatible with blood groups A, B, and O.
摘要:
Lactobacillus screening methods were carried out using surface plasmon resonance spectrums and human intestinal mucin and blood group antigens as probes. A trial to set selection criteria in the above-mentioned methods of screening for lactobacilli was made to adapt the methods to mass screening, and it was discovered that lactobacilli compatible with ABO blood groups can be screened by setting 100 RU as a criterion for judging bacterial binding under certain conditions. Using 238 lactobacillus strains, the above-mentioned screening methods and tests to judge their compatibility for the use of yogurt production were carried out, to at long last specifically discover bacillus strains compatible with blood groups A, B, and O.
摘要:
An inductance element (1) includes a doughnut-shaped magnetic core (2) having a wound body or a stacked body of a magnetic ribbon, a bottomed container (3) in which the doughnut-shaped magnetic core (2) is housed, and a conductive lead portion (5) inserted into a hollow section of the doughnut-shaped magnetic core (2) housed in the bottomed container (3). An open section of the bottomed container (3) is covered with an adhesive portion (4) which integrally fixes the doughnut-shaped magnetic core (2), the bottomed container (3) and the conductive lead portion (5). The adhesive portion (4) is entered into a gap between the doughnut-shaped magnetic core (2) and the bottomed container (3) and a gap between the bottomed container (3) and the conductive lead portion (5) in a range of 5 to 50% in average to a thickness of the doughnut-shaped magnetic core (2).
摘要:
In one embodiment, an inductance element includes a toroidal core and a bottomed insulating resin case. The bottomed insulating resin case includes a cylindrical outer wall section, a cylindrical inner wall section, a bottom section, an open section and a hollow section. The cylindrical outer wall section has an extending section exceeding the height of the toroidal core. The open section of the insulating resin case is covered with a cover portion having a bent section formed by bending an extending section of the cylindrical outer wall section.
摘要:
An inductance element (1) includes a doughnut-shaped magnetic core (2) having a wound body or a stacked body of a magnetic ribbon, a bottomed container (3) in which the doughnut-shaped magnetic core (2) is housed, and a conductive lead portion (5) inserted into a hollow section of the doughnut-shaped magnetic core (2) housed in the bottomed container (3). An open section of the bottomed container (3) is covered with an adhesive portion (4) which integrally fixes the doughnut-shaped magnetic core (2), the bottomed container (3) and the conductive lead portion (5). The adhesive portion (4) is entered into a gap between the doughnut-shaped magnetic core (2) and the bottomed container (3) and a gap between the bottomed container (3) and the conductive lead portion (5) in a range of 5 to 50% in average to a thickness of the doughnut-shaped magnetic core (2).
摘要:
A probe card 1 is composed of a plurality of probe pins 50 having wafer-side plungers51 at one end portion and substrate-side plungers52 on the other end side; two probe guides 30 and 40 one above the other for supporting the plurality of probe pins 50, so that the plurality of probe pins 50 are arranged to be corresponding to an arrangement of external terminals of a semiconductor wafer and the wafer-side plungers 51 of the probe pins 50 protrude; a print substrate 10 having pads 13 for the substrate-side plungers 52 of the probe pins 50 supported by the probe guides 30 and 40 to contact; and a stiffener 20 provided on the back surface of the print substrate 10.
摘要:
A contact terminal for measurement is provided, for transmitting a signal between a desired probe pin among a plurality of probe pins arranged in parallel at a predetermined distance in a predetermined direction on the surface of a probe substrate and an external measurement apparatus. The contact terminal for measurement includes: a signal terminal having an width smaller than the distance between the probe pins provided on both sides of one probe pin in the arrangement direction; two ground terminals to which a ground potential is applied, which are provided on both sides of the signal terminal in the arrangement direction and which have each width larger than that of the signal terminal in the arrangement direction; and a signal line electrically connecting the signal terminal to a signal input terminal of the external measurement apparatus.