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公开(公告)号:US07368925B2
公开(公告)日:2008-05-06
申请号:US10759481
申请日:2004-01-16
Applicant: Peter Navratil , Brad Froemke , Craig Stewart , Anthony Lord , Jeff Spencer , Scott Runbaugh , Gavin Fisher , Pete McCann , Rod Jones
Inventor: Peter Navratil , Brad Froemke , Craig Stewart , Anthony Lord , Jeff Spencer , Scott Runbaugh , Gavin Fisher , Pete McCann , Rod Jones
IPC: G01R31/02
CPC classification number: G01R31/2886 , G01R1/18 , G01R31/2831 , G01R31/2887 , G01R31/311
Abstract: A probe station for testing a device under test. A first platen supporting an electrical probe. A chuck supporting the device under test. A second platen supporting an optical probe. The first platen and the second platen positioned above the device under test. A percentage of the top surface of the second platen terminating into free space.
Abstract translation: 用于测试被测设备的探测台。 支撑电探针的第一台板。 支持被测设备的卡盘。 支撑光学探针的第二台板。 第一压板和第二压板位于被测器件上方。 第二压板的顶表面的一部分终止于自由空间。
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公开(公告)号:US20080054929A1
公开(公告)日:2008-03-06
申请号:US11977280
申请日:2007-10-24
Applicant: K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
Inventor: K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
IPC: G01R11/067
CPC classification number: G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号:US20080054923A1
公开(公告)日:2008-03-06
申请号:US11977282
申请日:2007-10-24
Applicant: K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
Inventor: K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
CPC classification number: G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号:US20080054922A1
公开(公告)日:2008-03-06
申请号:US11906846
申请日:2007-10-04
Applicant: Timothy Lesher , Brad Miller , Clarence Cowan , Michael Simmons , Frank Gray , Cynthia McDonald
Inventor: Timothy Lesher , Brad Miller , Clarence Cowan , Michael Simmons , Frank Gray , Cynthia McDonald
CPC classification number: G01R1/18 , G01R19/0053 , G01R31/2886 , G01R31/2889 , H01B11/206
Abstract: A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor. The cable further includes an additional layer of material between the outer dielectric and the shield conductor of suitable composition for reducing triboelectric current generation between the outer dielectric and the shield conductor to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.
Abstract translation: 电缆包括内部导体,内部电介质和保护导体,其中内部电介质位于内部导体和保护导体之间。 电缆还包括外部电介质和屏蔽导体,其中外部电介质位于保护导体和屏蔽导体之间。 电缆还包括在外部电介质和屏蔽导体之间的适当组合物的附加材料层,用于减少外部电介质和屏蔽导体之间产生的摩擦电流,使其小于外电介质和屏蔽导体直接发生的摩擦电流 相邻。
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公开(公告)号:US20080054884A1
公开(公告)日:2008-03-06
申请号:US11977054
申请日:2007-10-23
Applicant: John Dunklee
Inventor: John Dunklee
CPC classification number: H01L21/68785 , G01R31/2887 , Y10T279/11 , Y10T279/35
Abstract: A chuck for a probe station.
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公开(公告)号:US20080054883A1
公开(公告)日:2008-03-06
申请号:US11975929
申请日:2007-10-23
Applicant: John Dunklee
Inventor: John Dunklee
IPC: G01R31/28
CPC classification number: H01L21/68785 , G01R31/2887 , Y10T279/11 , Y10T279/35
Abstract: A chuck for a probe station.
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公开(公告)号:US20080048693A1
公开(公告)日:2008-02-28
申请号:US11977338
申请日:2007-10-24
Applicant: Ron Peters , Leonard Hayden , Jeffrey Hawkins , R. Dougherty
Inventor: Ron Peters , Leonard Hayden , Jeffrey Hawkins , R. Dougherty
IPC: G01R31/02
CPC classification number: G01R1/18 , G01R1/04 , G01R31/002 , G01R31/2808 , G01R31/286 , G01R31/2886 , G01R31/2889
Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
Abstract translation: 用于探测测试装置的探测台具有用于支撑测试装置的卡盘元件。 导电外屏蔽外壳至少部分地包围这种卡盘元件以提供EMI屏蔽。 导电内屏蔽外壳被插入在外屏蔽外壳和卡盘元件之间并且与外屏蔽外壳和卡盘元件绝缘,并且至少部分地包围卡盘元件。
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公开(公告)号:US20080048692A1
公开(公告)日:2008-02-28
申请号:US11977324
申请日:2007-10-24
Applicant: K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
Inventor: K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
IPC: G01R1/067
CPC classification number: G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号:US20080048648A1
公开(公告)日:2008-02-28
申请号:US11977052
申请日:2007-10-23
Applicant: John Dunklee
Inventor: John Dunklee
CPC classification number: H01L21/68785 , G01R31/2887 , Y10T279/11 , Y10T279/35
Abstract: A chuck for a probe station.
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公开(公告)号:US20080048647A1
公开(公告)日:2008-02-28
申请号:US11977050
申请日:2007-10-23
Applicant: John Dunklee
Inventor: John Dunklee
CPC classification number: H01L21/68785 , G01R31/2887 , Y10T279/11 , Y10T279/35
Abstract: A chuck for a probe station.
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