公开(公告)号：US20110135061A1

公开(公告)日：2011-06-09

申请号：US12993623

申请日：2009-05-20

Applicant: Andreas Thünemann

Inventor： Andreas Thünemann

IPC: G01N23/201 ,  B82Y35/00

CPC classification number: G01N23/201 ,  G01N15/0211 ,  G01N15/0227 ,  G01N2013/003 ,  G01N2015/0038

Abstract: The invention relates to a method and to an apparatus for analyzing nanoparticles, wherein the nanoparticles are first fractionated as a function of their particle size and subsequently analyzed, wherein small angle X-ray scattering is used for the analysis of the nanoparticles, and to a corresponding apparatus for carrying out the method according to the invention. The analysis by means of small angle X-ray scattering comprises the focussing of X-radiation onto the nanoparticles to be analyzed by means of a slit collimator and the analysis of the nanoparticles using a detector-to-sample distance of less than 50 cm.

Abstract translation: 本发明涉及一种用于分析纳米颗粒的方法和装置，其中首先将纳米颗粒作为其颗粒尺寸的函数进行分级，随后进行分析，其中使用小角度X射线散射来分析纳米颗粒，并使用 用于执行根据本发明的方法的相应装置。 通过小角度X射线散射的分析包括通过狭缝准直器将X射线聚焦到待分析的纳米颗粒上，并且使用小于50cm的检测器到样品的距离对纳米颗粒进行分析。

公开(公告)号：US20110116599A1

公开(公告)日：2011-05-19

申请号：US12919485

申请日：2009-02-25

Applicant: Edward James Morton

Inventor： Edward James Morton

IPC: G01N23/20

CPC classification number: G01N23/201 ,  G01V5/0041

Abstract: The invention provides a method and system for scanning an object comprising providing a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm wherein the second detector region is arranged to receive radiation that has passed through the first detector region. The method comprises irradiating the object with radiation having a peak energy of at least 1 MeV, and detecting the first profile radiation after it has interacted with or passed through the object in order to provide information relating to the object. Detecting the first profile radiation comprises detecting the first profile radiation at the first detector region, receiving the first profile radiation that has passed through the first detector region at the second detector region, and detecting the first profile radiation at the second detector region. The scanning method further comprises irradiating the object with radiation having a second energy profile, relatively lower than the first energy profile, and having a peak energy of at least 0.5 MeV, detecting the second profile radiation after it has interacted with or passed through the object in order to provide information relating to the object. Detecting the second profile radiation comprises detecting the second profile radiation at the first detector region, receiving the second profile radiation that has passed through the first detector region at the second detector region, and detecting the second profile radiation at the second detector region.

Abstract translation: 本发明提供了一种用于扫描物体的方法和系统，包括提供具有至少2mm厚度的第一检测器区域和厚度至少为5mm的第二检测器区域，其中第二检测器区域布置成接收具有 通过第一检测器区域。 该方法包括用具有至少1MeV的峰值能量的辐射对物体进行照射，并且在与物体相互作用或通过物体之后检测第一轮廓辐射，以提供与物体有关的信息。 检测第一轮廓辐射包括检测第一检测器区域处的第一轮廓辐射，接收在第二检测器区域已经通过第一检测器区域的第一轮廓辐射，以及检测第二检测器区域处的第一轮廓辐射。 扫描方法还包括用具有比第一能量分布相对低的第二能量分布的辐射照射物体，并且具有至少0.5MeV的峰值能量，在与第一能量分布相互作用或通过物体之后检测第二分布辐射 以提供与该对象相关的信息。 检测第二轮廓辐射包括检测第一检测器区域处的第二轮廓辐射，接收已经通过第二检测器区域处的第一检测器区域的第二轮廓辐射，以及检测第二检测器区域处的第二轮廓辐射。

公开(公告)号：US07796734B2

公开(公告)日：2010-09-14

申请号：US12687762

申请日：2010-01-14

Applicant: Richard Mastronardi ,  Dean Fleury ,  Jeffrey R. Schubert ,  Joseph DiMare ,  Richard Schueller ,  Alexander Chalmers

Inventor： Richard Mastronardi ,  Dean Fleury ,  Jeffrey R. Schubert ,  Joseph DiMare ,  Richard Schueller ,  Alexander Chalmers

IPC: G01N23/203 ,  G21K5/10 ,  H05G1/02

CPC classification number: G01V5/0008 ,  G01N23/20083 ,  G01N23/201 ,  G01N23/203 ,  G01V5/0016 ,  G01V5/0025

Abstract: An apparatus and method for inspecting personnel or their effects. A first and second carriage each carries a source for producing a beam of penetrating radiation incident on a subject. A positioner provides for synchronized relative motion of each carriage vis-á-vis the subject in a direction having a vertical component. A detector receives radiation produced by at least one of the sources after the radiation interacts with the subject.

Abstract translation: 用于检查人员或其影响的装置和方法。 第一和第二托架每个都带有用于产生入射在被摄体上的穿透辐射束的源。 定位器提供每个支架相对于主体在具有垂直分量的方向上的同步相对运动。 在辐射与受试者相互作用之后，检测器接收由至少一个源产生的辐射。

公开(公告)号：US20090057581A1

公开(公告)日：2009-03-05

申请号：US12265825

申请日：2008-11-06

Applicant: JAMES M. PINCHOT

Inventor： JAMES M. PINCHOT

IPC: G21F5/00

CPC classification number: G01N23/201 ,  B22F2998/00 ,  G21F5/00 ,  G21K1/00 ,  G21K1/02 ,  G21K1/025 ,  G21K2201/00 ,  B22F3/008

Abstract: A collimator that formed from a plurality of metal layers that are shaped by use of lithographic techniques in specific shapes. The formed metal layers are stacked and aligned together and then connected together to form the collimator.

Abstract translation: 由通过使用特定形状的光刻技术成形的多个金属层形成的准直器。 形成的金属层被堆叠并对齐在一起，然后连接在一起以形成准直器。

公开(公告)号：US07474732B2

公开(公告)日：2009-01-06

申请号：US11000044

申请日：2004-12-01

Applicant: David Berman ,  Asher Peled ,  Dileep Agnihotri ,  Tachi Rafaeli ,  Boris Yokhin

Inventor： David Berman ,  Asher Peled ,  Dileep Agnihotri ,  Tachi Rafaeli ,  Boris Yokhin

IPC: G01N23/20 ,  H05G1/64 ,  A61B6/08

CPC classification number: G01N23/201

Abstract: A method for inspection of a sample includes irradiating the sample with a beam of X-rays and measuring a distribution of the X-rays that are emitted from the sample responsively to the beam, thereby generating an X-ray spectrum. An assessment is made of an effect on the spectrum of a non-uniformity of the beam, and the spectrum is corrected responsively to the effect.

Abstract translation: 用于检查样品的方法包括用X射线照射样品并测量响应于光束从样品发射的X射线的分布，从而产生X射线光谱。 对光束的不均匀性的光谱的影响进行评估，并且响应于效果校正光谱。

公开(公告)号：US07462854B2

公开(公告)日：2008-12-09

申请号：US11732237

申请日：2007-04-03

Applicant: James M. Pinchot

Inventor： James M. Pinchot

IPC: G01N23/201

CPC classification number: G01N23/201 ,  B22F2998/00 ,  G21F5/00 ,  G21K1/00 ,  G21K1/02 ,  G21K1/025 ,  G21K2201/00 ,  B22F3/008

Abstract: A collimator that formed from a plurality of metal layers that are shaped by use of lithographic techniques in specific shapes. The formed metal layers are stacked and aligned together and then connected together to form the collimator.

Abstract translation: 由通过使用特定形状的光刻技术成形的多个金属层形成的准直器。 形成的金属层被堆叠并对齐在一起，然后连接在一起以形成准直器。

公开(公告)号：US20080265156A1

公开(公告)日：2008-10-30

申请号：US11977410

申请日：2007-10-24

Applicant: Christopher Morris ,  Andrew Mcleod Fraser ,  Larry Joe Schultz ,  Konstantin N. Borozdin ,  Alexei Vasilievich Klimenko ,  Michael James Sossong ,  Gary Blanpied

Inventor： Christopher Morris ,  Andrew Mcleod Fraser ,  Larry Joe Schultz ,  Konstantin N. Borozdin ,  Alexei Vasilievich Klimenko ,  Michael James Sossong ,  Gary Blanpied

IPC: H01J47/00

CPC classification number: G01N23/201 ,  G01N23/20 ,  G01V5/0025 ,  G01V5/0075 ,  G06F17/18

Abstract: Methods, apparatus and systems for detecting charged particles and obtaining tomography of a volume by measuring charged particles including measuring the momentum of a charged particle passing through a charged particle detector. Sets of position sensitive detectors measure scattering of the charged particle. The position sensitive detectors having sufficient mass to cause the charged particle passing through the position sensitive detectors to scatter in the position sensitive detectors. A controller can be adapted and arranged to receive scattering measurements of the charged particle from the charged particle detector, determine at least one trajectory of the charged particle from the measured scattering; and determine at least one momentum measurement of the charged particle from the at least one trajectory. The charged particle can be a cosmic ray-produced charged particle, such as a cosmic ray-produced muon. The position sensitive detectors can be drift cells, such as gas-filled drift tubes.

Abstract translation: 用于检测带电粒子的方法，装置和系统，并通过测量带电粒子来测量体积的断层摄影，包括测量通过带电粒子检测器的带电粒子的动量。 位置敏感检测器的集合测量带电粒子的散射。 位置敏感检测器具有足够的质量以使带电粒子通过位置敏感检测器散射在位置敏感检测器中。 控制器可以被适配和布置成从带电粒子检测器接收带电粒子的散射测量，从测量的散射中确定带电粒子的至少一个轨迹; 并且从所述至少一个轨迹确定所述带电粒子的至少一个动量测量。 带电粒子可以是宇宙射线产生的带电粒子，例如宇宙射线产生的μ子。 位置敏感检测器可以是漂移电池，例如充气漂移管。

公开(公告)号：US20080253520A1

公开(公告)日：2008-10-16

申请号：US11786741

申请日：2007-04-11

Applicant: Edward S. Boyden ,  Roderick A. Hyde ,  Muriel Y. Ishikawa ,  Edward K.Y. Jung ,  Eric C. Leuthardt ,  Robert W. Lord ,  Nathan P. Myhrvold ,  Dennis J. Rivet ,  Michael A. Smith ,  Clarence T. Tegreene ,  Thomas A. Weaver ,  Charles Whitmer ,  Lowell L. Wood ,  Victoria Y.H. Wood

Inventor： Edward S. Boyden ,  Roderick A. Hyde ,  Muriel Y. Ishikawa ,  Edward K.Y. Jung ,  Eric C. Leuthardt ,  Robert W. Lord ,  Nathan P. Myhrvold ,  Dennis J. Rivet ,  Michael A. Smith ,  Clarence T. Tegreene ,  Thomas A. Weaver ,  Charles Whitmer ,  Lowell L. Wood ,  Victoria Y.H. Wood

IPC: G01N23/201

CPC classification number: G01N23/201

Abstract: One aspect relates to determining a location of an at least one scattering event occurring within an at least some matter of at least a portion of an individual, wherein the determining the location of the the at least one scattering event is based at least in part on a combination of: a relative position and/or angle at which an at least one applied X-ray being applied to the at least some matter of the at least the portion of the individual, an applied energy level of the at least one applied X-ray being applied to the at least some matter of the at least the portion of the individual, a detected location of an at least one scattered X-ray resulting from scattering of the at least one applied X-ray scattering during the at least one scattering event, and a scattered energy level of the at least one scattered X-ray.

Abstract translation: 一个方面涉及确定发生在个体的至少一部分的至少一部分内的至少一个散射事件的位置，其中确定所述至少一个散射事件的位置至少部分地基于 将至少一个施加的X射线施加到所述个体的至少一部分的至少一些物质的相对位置和/或角度的组合，所述至少一个施加的X的施加能量水平 射线被应用于个体的至少一部分的至少一些物质，由至少一个所施加的X射线散射的散射产生的至少一个散射X射线的检测位置在至少一个 散射事件和至少一个散射X射线的散射能级。

公开(公告)号：US20080179502A1

公开(公告)日：2008-07-31

申请号：US11854213

申请日：2007-09-12

Applicant: Robert J. Ledoux ,  William Bertozzi

Inventor： Robert J. Ledoux ,  William Bertozzi

IPC: G01N21/17

CPC classification number: G01N23/20 ,  G01N23/04 ,  G01N23/20083 ,  G01N23/201

Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

Abstract translation: 本文公开了使用从目标散射的光子的能谱对潜在威胁进行扫描的方法和系统，以确定目标中平均原子数和/或质量的空间分布。 一种示例性方法包括：用光子束照射目标的多个体素中的每一个; 确定每个体素的入射通量; 测量从体素散射的光子的能谱; 使用能谱确定体素中的平均原子数; 并且使用入射磁通量确定体素中的质量，体素中的材料的平均原子数，能谱和对应于体素的散射核。 示例性系统可以使用威胁检测启发式来确定是否基于体素的平均原子数和/或质量触发进一步的动作。

公开(公告)号：US20080002812A1

公开(公告)日：2008-01-03

申请号：US11844206

申请日：2007-08-23

Applicant: Yoshiyasu ITO

Inventor： Yoshiyasu ITO

IPC: G01N23/201

CPC classification number: G01N23/201 ,  G01N15/088 ,  G01N2015/086

Abstract: A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention includes three aspects. The first aspect is that an equipment constant is determined and an unknown void or particle content is calculated based on the equipment constant. The second aspect is that a plurality of samples having unknown matrix densities are prepared, the matrix densities are determined so that differences in the matrix densities among the samples become a minimum, and a void or particle content is calculated based on the matrix density and the scale factor of the X-ray small angle scattering. The third aspect is for a plurality of samples having unknown particle densities, and executes procedures similar to those of the second aspect.

Abstract translation: 使用由具有空隙或无序分散在基质中的颗粒的薄膜制成的样品的X射线小角度散射测量来确定空隙或颗粒含量，衍射峰不适用于这种样品。 本发明包括三个方面。 第一方面是确定设备常数，并且基于设备常数计算未知的空隙或颗粒含量。 第二方面是制备具有未知矩阵密度的多个样品，确定矩阵密度，使得样品中的基质密度的差异变得最小，并且基于矩阵密度计算空隙或颗粒含量， X射线小角度散射的比例因子。 第三方面是对于具有未知粒子密度的多个样品，并且执行与第二方面相似的步骤。