Abstract:
Phasor measurement units (108) provide phasor data from various locations (102) in an electrical power system. The phasor data is referenced to a common timing signal. Non-phasor measurement data is also obtained at various locations in the power system. A phasor assisted state estimator (120) uses the phasor data and the non-phasor data to determine the power system state.
Abstract:
M periods of the test signal and of the reference signal are received. The periods of the test signal and of the reference signal are in each case Tsig long. The test signal is sampled with N sampled values at a sampling frequency fs=1/Ts. Also, N*Ts=M*Tsig, where N>M. The sampled values are numbered progressively by n, for which 0≦n ≦N−1. The sampled values have a defined relative phase shift with respect to the reference signal. The phase shift Tφ is calculated by ∑ i = 0 M - 1 Idx ( i ) + K , K being a constant and Idx(i) corresponding to the number n which is either the first sampled value after a test signal zero crossing during the reference signal's ith period or the last sampled value before a test signal zero crossing during the reference signal's ith period. Either only rising or only falling zero crossings are taken into account.
Abstract translation:接收测试信号和参考信号的M个周期。 在每种情况下,测试信号和参考信号的周期都是长的。 测试信号以采样频率f N 1 = 1 / T S N的采样值采样。 此外,N * T S = M * T S,其中N> M。 采样值逐渐被n编号,0 <= n <= N-1。 采样值相对于参考信号具有限定的相对相移。 相位偏移T SUB>由
Abstract:
In general, in one aspect, the disclosure describes an apparatus for calibrating signals. The apparatus includes a receiver pair to receive a differential signal and a reference signal and to generate at least one comparison signal reflecting where a first signal of the differential signal and a second signal of the differential signal cross each other with respect to the reference signal. The second signal is a negative compliment of the first signal. The apparatus further includes a phase detector to determine a phase error based on the at least one comparison signal. The apparatus also includes an edge delay control driver pair to adjust the differential signal based on the phase error.
Abstract:
A digital test module (5) is provided for testing a phase locked loop circuit. The module (5) includes phase detection circuitry (10) for performing phase measurements of the phase locked loop circuit and analog test circuitry (20) for testing at least one analog element of the phase locked loop circuit. Frequency measurement circuitry (30) is provided for performing frequency measurements of the phase locked loop circuit, as is circuitry (40) for performing calibration and jitter measurements. In this way cycle-to-cycle and phase jitter measurements may be made. A calibration mechanism is provided allowing a process evaluation to be made and which allows the jitter data to be provided in a few seconds. The fully digital design facilitates easy manufacture and ready retargeting of the module to diverse applications and processes.
Abstract:
On a semiconductor device 20, fabricated are a VCO 10A, an frequency divider by integer R 21, a frequency divider by integer (P×N+A) 22 wherein each of P, N and A is an integer, A is variable and A
Abstract:
Method and apparatus for accurately determining the presence of voltage at capacitive test points and for determining the phase angle relationship between two capacitive points. The detection of the presence of the voltage at the capacitive test points is independent of the voltage range in the systems, independent of the contamination or defects that may occur in the capacitive test point systems. The phase angle relationship is determined based on the actual phase angle difference between the voltage waveforms at the capacitive test points independent of the capacitive divider ratio difference and the capacitive test point voltage accuracy.
Abstract:
A self compensating phase detector. Using two identical phase detectors introducing one of the phase detectors and a controlled variable phase shifter in a negative feedback loop shifts one clock signal enough such that the shifted signal compensates for existing static phase error. This self-compensation improves the accuracy of the phase difference measurement by significantly reducing the effect of static phase error. Moreover, this reduction remains true in spite of variations in process, temperature and voltage. Thus, inherent immunity of the invention to environmental conditions results in fewer failing parts during fabrication. Additionally, because the design is self-adjusting to environmental changes, design ease is significantly improved.
Abstract:
A phase detector which determines the phase based upon the output signals from a power coupler. The power coupler outputs a first signal and a second signal. The first and second signals are input to a magnitude detector which determines the magnitude of the relative phase between the first and second signals. The first and second signals are also input to a sign discriminator which determines the sign of the phase between the first and second signals.
Abstract:
A frequency comparator includes a circuit comparing, independently of a phase relationship between first and second clocks, frequencies of the first and second clocks and outputting first and second detection signals when the first clock has frequencies higher and lower than those of the second clock, respectively. The first and second detection signals are output for respective times based on a difference between the frequencies of the first and second clocks.
Abstract:
A phase detector wherein binary signals are supplied to inputs of an asymmetric circuit having two EXOR elements, the output voltage of the phase detector being proportional to the phase difference between the input signals by a subtraction of the output signals of two EXOR elements and subsequent low-pass filtering, and the subtraction is conducted in such a manner that there is no longer an error, due to the internal propagation delays of the EXOR elements, for determining the phase difference. In particular, the equal-phase condition between the input signals is determined accurately and by a simple voltage comparison with a threshold value selected by the expert, and the range of determination of greater phase differences between binary signals can be extended by the circuit proposed.