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公开(公告)号：US08112249B2
公开(公告)日：2012-02-07
申请号：US12341431
申请日：2008-12-22
申请人： Leonid Gurov , Alexander Chufarovsky , Gil Balog
发明人： Leonid Gurov , Alexander Chufarovsky , Gil Balog
IPC分类号： G06F17/18
CPC分类号： H01L22/20 , G01R31/2894 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A parametric test time reduction method for reducing time expended to conduct a test program flow on a population of semiconductor devices, the test program flow comprising at least one parametric test having a specification defining a known pass value range characterized in that a result of the test is considered a passing result if the result falls within the known pass value range, the method including: computing an estimated maximum test range, at a given confidence level, on a validation set including a subset of the population of semiconductor devices, the estimated maximum test range including the range of values into which all results from performing the test on the set will statistically fall at the given confidence level and at least partly disabling the at least one parametric test based at least partly on a comparison of the estimated maximum test range and the known pass value range.
摘要翻译： 用于减少时间的参数测试时间缩短方法用于在半导体器件群体上进行测试程序流程，该测试程序流程包括具有定义已知通过值范围的规范的至少一个参数测试，其特征在于测试结果 如果结果在已知通过值范围内，则被认为是传递结果，该方法包括：以给定的置信水平计算包括半导体器件群体的子集的验证集合的估计最大测试范围，估计的最大值 测试范围包括值的范围，在该范围内，对集合进行测试的所有结果将统计地落在给定的置信水平，并且至少部分地至少部分地基于估计的最大测试范围的比较来禁用至少一个参数测试 和已知通过值范围。
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公开(公告)号：US08838408B2
公开(公告)日：2014-09-16
申请号：US12944363
申请日：2010-11-11
申请人： Reed Linde , Dan Glotter , Alexander Chufarovsky , Leonid Gurov
发明人： Reed Linde , Dan Glotter , Alexander Chufarovsky , Leonid Gurov
CPC分类号： G01R31/2891
摘要： Systems and methods for deciding whether or not to indicate misalignment. In some examples, an analysis of parametric data relating to tests sensitive to misalignment is performed in order to determine which data is incongruous and to identify corresponding probes or socket contacts as suspected misaligned. In some examples, additionally or alternatively, a spatial analysis quantifies the placement of a set of identified suspected misaligned probes, which were identified from pass/fail test data and/or parametric test data, with respect to a contiguous or non-contiguous area on one or more wafers.
摘要翻译： 用于决定是否指示未对准的系统和方法。 在一些示例中，执行与对准不对齐的测试相关的参数数据的分析，以便确定哪些数据不协调并且识别出疑似不对齐的相应探针或插座触点。 在一些示例中，附加地或替代地，空间分析量化由通过/失败测试数据和/或参数测试数据识别的一组识别的可疑未对准探针相对于邻近或不连续区域的位置 一个或多个晶片。
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公开(公告)号：US20120123734A1
公开(公告)日：2012-05-17
申请号：US12944363
申请日：2010-11-11
申请人： Reed LINDE , Dan GLOTTER , Alexander CHUFAROVSKY , Leonid GUROV
发明人： Reed LINDE , Dan GLOTTER , Alexander CHUFAROVSKY , Leonid GUROV
CPC分类号： G01R31/2891
摘要： Systems and methods for deciding whether or not to indicate misalignment. In some examples, an analysis of parametric data relating to tests sensitive to misalignment is performed in order to determine which data is incongruous and to identify corresponding probes or socket contacts as suspected misaligned. In some examples, additionally or alternatively, a spatial analysis quantifies the placement of a set of identified suspected misaligned probes, which were identified from pass/fail test data and/or parametric test data, with respect to a contiguous or non-contiguous area on one or more wafers.
摘要翻译： 用于决定是否指示未对准的系统和方法。 在一些示例中，执行与对准不对齐的测试相关的参数数据的分析，以便确定哪些数据不协调并且识别出疑似不对齐的相应探针或插座触点。 在一些示例中，附加地或替代地，空间分析量化由通过/失败测试数据和/或参数测试数据识别的一组识别的可疑未对准探针相对于邻近或不连续区域的位置 一个或多个晶片。
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公开(公告)号：US20110251812A1
公开(公告)日：2011-10-13
申请号：US13164910
申请日：2011-06-21
申请人： Leonid GUROV , Alexander CHUFAROVSKY , Gil BALOG , Reed LINDE
发明人： Leonid GUROV , Alexander CHUFAROVSKY , Gil BALOG , Reed LINDE
IPC分类号： G06F19/00
CPC分类号： H01L22/20 , G01R31/2894 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Methods, systems, computer program products and program storage devices for determining whether or not to perform an action based at least partly on an estimated maximum test range. One of the methods comprises: attaining results generated from a parametric test performed on semiconductor devices included in a control set comprising a subset of a population of semiconductor devices; selecting from among the semiconductor devices at least one extreme subset including at least one of a high-scoring subset including all devices whose results exceed a high cut-off point and a low-scoring subset including all devices whose results fall below a low cut-off point; plotting at least results of the at least one extreme subset as a normal probability plot located between a zero probability axis and a one probability axis; fitting a plurality of curves to a plurality of subsets of the results of the at least one extreme subset respectively; extending each of the plurality of curves to the zero probability axis for the low-scoring subset or to the one probability axis for the high scoring subset thereby to define a corresponding plurality of intersection points along the zero or one probability axis; defining an estimated maximum test range based on at least one of the intersection points; and determining whether or not to perform an action based at least partly on the estimated maximum test range.
摘要翻译： 用于确定是否至少部分地基于估计的最大测试范围来执行动作的方法，系统，计算机程序产品和程序存储设备。 方法之一包括：获得由包括在包括半导体器件群体的子集的控制集合中的半导体器件执行的参数测试产生的结果; 从半导体器件中选择至少一个极端子集，其包括包括其结果超过高截止点的所有器件的高得分子集和包括其结果低于低截止点的所有器件的低得分子集中的至少一个， 关闭点 将至少一个极端子集的至少结果绘制为位于零概率轴和一个概率轴之间的正态概率图; 将多个曲线拟合到所述至少一个极限子集的结果的多个子集中; 将多个曲线中的每一个延伸到低得分子集的零概率轴或高分数子集的一个概率轴，从而定义沿零或一个概率轴的相应多个交点; 基于所述交点中的至少一个来定义估计的最大测试范围; 以及至少部分地基于所估计的最大测试范围来确定是否执行动作。
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公开(公告)号：US08781773B2
公开(公告)日：2014-07-15
申请号：US13164910
申请日：2011-06-21
申请人： Leonid Gurov , Alexander Chufarovsky , Gil Balog , Reed Linde
发明人： Leonid Gurov , Alexander Chufarovsky , Gil Balog , Reed Linde
CPC分类号： H01L22/20 , G01R31/2894 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Methods, systems, computer-program products and program-storage devices for determining whether or not to perform an action based at least partly on an estimated maximum test-range. One method comprises: attaining results generated from a parametric test on semiconductor devices included in a control set; selecting from the semiconductor devices at least one extreme subset including at least one of a high-scoring subset and a low-scoring subset; plotting at least results of the at least one extreme subset; fitting a plurality of curves to a plurality of subsets of the results; extending the curves to the zero-probability axis for the low-scoring subset or the one-probability axis for the high-scoring subset to define a corresponding plurality of intersection points; defining an estimated maximum test range based on at least one of the intersection points; and determining whether or not to perform an action based at least partly on the estimated maximum test range.
摘要翻译： 用于确定是否至少部分地基于估计的最大测试范围来执行动作的方法，系统，计算机程序产品和程序存储设备。 一种方法包括：获得由包括在控制集中的半导体器件的参数测试产生的结果; 从所述半导体器件中选择至少一个极端子集，其包括高得分子集和低得分子集中的至少一个; 绘制至少一个极端子集的至少结果; 将多个曲线拟合到所述结果的多个子集中; 将所述曲线延伸到所述低得分子集的零概率轴或所述高分数子集的单概率轴，以定义相应的多个交点; 基于所述交点中的至少一个来定义估计的最大测试范围; 以及至少部分地基于所估计的最大测试范围来确定是否执行动作。
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公开(公告)号：US20100161276A1
公开(公告)日：2010-06-24
申请号：US12341431
申请日：2008-12-22
申请人： Leonid Gurov , Alexander Chufarovsky , Gil Balog
发明人： Leonid Gurov , Alexander Chufarovsky , Gil Balog
IPC分类号： G06F17/18
CPC分类号： H01L22/20 , G01R31/2894 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A parametric test time reduction method for reducing time expended to conduct a test program flow on a population of semiconductor devices, the test program flow comprising at least one parametric test having a specification which defines a known pass value range characterized in that a result of the test is considered a passing result if the result falls within the known pass value range, the method comprising, for at least one parametric test, computing an estimated maximum test range, at a given confidence level, on a validation set comprising a subset of the population of semiconductor devices, the estimated maximum test range comprising the range of values into which all results from performing the test on the set will statistically fall at the given confidence level, the validation set defining a complementary set including all semiconductors included in the population and not included in the validation set; and at least partly disabling the at least one parametric test based at least partly on a comparison of the estimated maximum test range and the known pass value range.
摘要翻译： 一种用于减少时间的参数测试时间缩短方法用于对一组半导体器件进行测试程序流程，所述测试程序流程包括至少一个具有定义已知通过值范围的规范的参数测试，其特征在于， 如果结果落在已知的通过值范围内，则测试被认为是传递结果，该方法包括对于至少一个参数测试，在给定的置信水平下，计算估计的最大测试范围在包括 估计的最大测试范围包括其中对集合进行测试的所有结果将统计学下降到给定的置信水平的值的范围，所述验证集定义包括所述群体中包括的所有半导体的互补集合，以及 不包括在验证集中; 并且至少部分地至少部分地基于估计的最大测试范围和已知通过值范围的比较来禁用所述至少一个参数测试。
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公开(公告)号：US6111554A
公开(公告)日：2000-08-29
申请号：US4049
申请日：1998-01-07
摘要： A helical antenna element including a metallic coil, a dielectric support element inserted in the coil, the support element being formed with a generally hollow core, and a dielectric tuning element inserted into said core, the tuning element having at least one adjustable dimension which when adjusted, provides a tuning of an antenna characteristic.
摘要翻译： 螺旋天线元件，包括金属线圈，插入线圈中的电介质支撑元件，支撑元件形成有大致中空的芯，以及插入到所述芯中的电介质调谐元件，所述调谐元件具有至少一个可调节的尺寸， 调整后，提供天线特性的调谐。
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