Surface modification of semiconductors using electromagnetic radiation
    1.
    发明授权
    Surface modification of semiconductors using electromagnetic radiation 失效
    使用电磁辐射对半导体的表面改性

    公开(公告)号:US6015759A

    公开(公告)日:2000-01-18

    申请号:US986916

    申请日:1997-12-08

    摘要: Deposition rates of undoped silicate glass dielectric layers on thermal oxide are increased by pre-treating the thermal oxide layer with electromagnetic radiation in the ultraviolet (UV) and/or vacuum ultraviolet (VUV) wavelengths. The surface smoothness of the resulting films are also increased by pre-treating films with UV and/or VUV radiation. Furthermore, the gap filling abilities of the undoped silicate glass films are increased by pre-treating the thermal oxide with UV and/or VUV radiation. New equipment and methods are presented for exposing semiconductor devices to UV and/or VUV radiation, and for enhancing the deposition rates and film quality for semiconductor manufacture. Semiconductor devices incorporating the new methods are also described.

    摘要翻译: 通过在紫外(UV)和/或真空紫外(VUV)波长中的电磁辐射预处理热氧化物层,增加了热氧化物上未掺杂的硅酸盐玻璃介电层的沉积速率。 通过用UV和/或VUV辐射预处理膜,所得膜的表面光滑度也增加。 此外,通过用UV和/或VUV辐射预处理热氧化物来增加未掺杂的硅酸盐玻璃膜的间隙填充能力。 提出了用于将半导体器件暴露于UV和/或VUV辐射的新设备和方法,并且用于提高用于半导体制造的沉积速率和膜质量。 还描述了结合新方法的半导体器件。