Abstract:
A sense amplifier for reading memory cells in a SRAM, the sense amplifier comprising two gate-biased pMOSFETs, each corresponding to a selected bitline. The gates of the two gate-biased pMOSFETs have their gates biased to a bias voltage, their sources coupled to the selected bitlines via column-select transistors, and their drains coupled via pass transistors to the two ports of two cross-coupled inverters, the cross-coupled inverters forming a latch. After a selected bitline pair has been pre-charged and the pre-charge phase ends, one of the two gate-biased pMOSFETs quickly goes into its subthreshold region as one of the bitlines discharges through its corresponding memory cell, thereby cutting off the bitline's capacitance from the sense amplifier. When the pass transistors are enabled, the other of the two pMOSFETs allows a significant bitline charge to transfer via its corresponding pass transistor to its corresponding port, whereas a relatively much smaller charge is transferred to the other port. This charge transfer scheme allows a differential voltage to quickly develop at the ports, thereby providing a fast latch and read operation with reduced power consumption. Bitline voltage swing may also be reduced to reduce power consumption.
Abstract:
A domino logic circuit contained within an integrated circuit includes a dynamic logic circuit and an intermediate logic circuit. The intermediate logic circuit includes a pull-up transistor having a source terminal coupled to a source voltage line and an n-block transistor having a source terminal connected to a low ground voltage line.
Abstract:
A system for measuring the stability of a power signal from a power supply includes a threshold violation detector. The threshold violation detector includes a comparator and an indicator. The comparator has a power signal input, a threshold signal input, and a comparison result output, and is configured to compare the power signal on the power signal input with a threshold on the threshold signal input to present a comparison result signal on the comparison result output. The indicator has a threshold violation output and a comparison input that receives the comparison result signal from the comparator. The indicator presents a threshold violation signal on the threshold violation output when the comparison result signal indicates that the power signal has violated the threshold.
Abstract:
Embodiments of the present invention relate to memory circuits with heavily loaded bit-lines, and where either the effect of leakage current in the read access or pass transistors is reduced, or leakage current is reduced.
Abstract:
A novel circuit technique for reducing leakage currents through the read-path of large register files in which a negative gate-source voltage is forced on a critical pass transistor between a cell read transistor and a local bitline such that when the cell is in a first state, the leakage current from a dynamic node of the cell read transistor is reduced. The reduced leakage current increases the robustness and performance of the read operation.
Abstract:
A voltage-level converter and a method of converting a first logic voltage level to a second logic voltage level are described. In one embodiment, a voltage-level converter connects a first logic unit connected to a first supply voltage to a second logic unit connected to a second supply voltage. The voltage-level converter includes at least one transistor connected to the second supply voltage. The at least one transistor has a threshold voltage whose absolute value is greater-than-or-about-equal to the absolute value of the difference between the second supply voltage and the first supply voltage. In an alternative embodiment, a method for converting a first logic voltage level to a second logic voltage level includes transmitting a logic signal from a logic unit having an output voltage swing of between a first voltage level and a second voltage level, receiving the logic signal at a logic circuit having a pull-up transistor and an output voltage swing between a third voltage level and a fourth voltage level, and turning off the pull-up transistor when the logic signal has a value slightly greater than the difference between the third voltage level and the first voltage level.
Abstract:
Embodiments of the present invention relate to memory circuits with heavily loaded bit-lines, and where either the effect of leakage current in the read access or pass transistors is reduced, or leakage current is reduced.
Abstract:
A DC-to-DC switching power converter includes switching elements having capacitive gate control inputs, an energy storage element and driver circuitry. Improved efficiency is achieved using adiabatic buffers to drive MOSFET switching elements with stepped switching signals. Substantially equal rise and fall times are achieved. In one embodiment, the switching power converter is fabricated on a semiconductor die to generate an output voltage to one or more functional unit blocks on the die.
Abstract:
A circuit including a clock signal input to receive a clock signal, at least one data signal input to receive at least one data signal, and a multiple input conditional inverter to receive the clock signal and the data signal, and to generate a dynamic output. The circuit also includes a conditional keeper circuit to charge a dynamic output node when the clock is evaluating and the dynamic output is high.
Abstract:
A domino logic circuit contained within an integrated circuit includes a dynamic logic circuit and an intermediate logic circuit. The intermediate logic circuit includes a pull-up transistor having a source terminal coupled to a source voltage line and an n-block transistor having a source terminal connected to a low ground voltage line.