Abstract:
Provided is a semiconductor memory device including a column decoder, a plurality of sub-cell blocks, and a bit line selection circuit. The column decoder is configured to decode column addresses and drive column selection signals. Each of the sub-cell blocks includes a plurality of bit lines, a plurality of word lines, and a plurality of memory cells connected to the plurality of bit lines and the plurality of word lines. The bit line selection circuit includes a plurality of bit line connection controllers, and is configured to select one or more bit lines in response to the column selection signals. Each of the bit line connection controllers electrically couples a respective first bit line to corresponding first and second local input/output (I/O) lines in response to first and second column selection signals of the column selection signals, respectively.
Abstract:
A semiconductor memory device comprises a substrate comprising a first cell array region, a first sense circuit region, a second sense circuit region, and a second cell array region that are arranged in order from a first side to a second side. First and second bit lines are coupled to a plurality of memory cells in the first cell array region, and first and second complementary bit lines are coupled to a plurality of memory cells in the second cell array region. A first column selector is formed in the first sense circuit region and is coupled to the first bit line and the first complementary bit line. A second column selector is formed in the second sense circuit region and is coupled to the second bit line and the second complementary bit line. The first column selector and the second column selector are formed directly adjacent to each other.
Abstract:
A semiconductor memory device comprises a substrate comprising a first cell array region, a first sense circuit region, a second sense circuit region, and a second cell array region that are arranged in order from a first side to a second side. First and second bit lines are coupled to a plurality of memory cells in the first cell array region, and first and second complementary bit lines are coupled to a plurality of memory cells in the second cell array region. A first column selector is formed in the first sense circuit region and is coupled to the first bit line and the first complementary bit line. A second column selector is formed in the second sense circuit region and is coupled to the second bit line and the second complementary bit line. The first column selector and the second column selector are formed directly adjacent to each other.