Cu seed layer deposition for ULSI metalization

    公开(公告)号:US06511609B2

    公开(公告)日:2003-01-28

    申请号:US09785170

    申请日:2001-02-20

    IPC分类号: H01L2100

    摘要: A novel method of Cu seed layer deposition for ULSI metalization is disclosed. The method of Cu seed layer deposition for ULSI metalization comprises forming a diffusion barrier on a substrate, forming a poly silicon layer, amorphous silicon layer or TaSix layer on said diffusion barrier, replacing said poly silicon layer with copper to form a copper seed layer, and electroplating a thick copper film on said copper seed layer. In this invention, a chemical replacing solution comprising a replacing reactant and at least one etchant is used to replace the poly silicon layer with copper and to reduce the quantity of byproducts of the reaction.