公开(公告)号：US09103876B2

公开(公告)日：2015-08-11

申请号：US13521034

申请日：2011-01-07

Applicant: Kent Nguyen ,  Kaushal Gangakhedkar ,  David Baldwin ,  Nile Light ,  Steve Aochi ,  Yan Wang ,  Atila Ersahin ,  Hai Tran ,  Thomas H. Bailey ,  Kiran Jitendra ,  Alan Cable ,  Dave Smiley ,  Thomas E. Wishard

Inventor： Kent Nguyen ,  Kaushal Gangakhedkar ,  David Baldwin ,  Nile Light ,  Steve Aochi ,  Yan Wang ,  Atila Ersahin ,  Hai Tran ,  Thomas H. Bailey ,  Kiran Jitendra ,  Alan Cable ,  Dave Smiley ,  Thomas E. Wishard

IPC: G01R31/28

CPC classification number: G01R31/2893

Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.

Abstract translation: 用于便于检查被测设备的探针系统。 系统集成了一个存储架; 探针龙门架组件; 探针组件，被配置为使被测设备电气匹配; 以及用于从存储架拾取探针组件并将探针组件传送到探棒台架的机器人系统。 机器人系统还能够从探针台架上挑取探头组件，并将探头组件传送到存储架。 探针组件包括用于将探针组件附接到探针台架或存储架的夹紧组件。 探针组件可以包括接头销的阵列，其被配置为当探针组件安装在探针杆架架组件上时与被测器件上的导电焊盘配合。

公开(公告)号：US20120319713A1

公开(公告)日：2012-12-20

申请号：US13521034

申请日：2011-01-07

Applicant: Kent Nguyen ,  Kaushal Gangakhedkar ,  David Baldwin ,  Nile Light ,  Steve Aochi ,  Yan Wang ,  Atila Ersahin ,  Hai Tran ,  Thomas H. Bailey ,  Kiran Jitendra ,  Alan Cable ,  Dave Smiley ,  Thomas E. Wishard

Inventor： Kent Nguyen ,  Kaushal Gangakhedkar ,  David Baldwin ,  Nile Light ,  Steve Aochi ,  Yan Wang ,  Atila Ersahin ,  Hai Tran ,  Thomas H. Bailey ,  Kiran Jitendra ,  Alan Cable ,  Dave Smiley ,  Thomas E. Wishard

IPC: G01R31/20 ,  G01K1/00 ,  G01J1/00

CPC classification number: G01R31/2893

Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.

Abstract translation: 用于便于检查被测设备的探针系统。 系统集成了一个存储架; 探针龙门架组件; 探针组件，被配置为使被测设备电气匹配; 以及用于从存储架拾取探针组件并将探针组件传送到探棒台架的机器人系统。 机器人系统还能够从探针台架上挑取探头组件，并将探头组件传送到存储架。 探针组件包括用于将探针组件附接到探针台架或存储架的夹紧组件。 探针组件可以包括接头销的阵列，其被配置为当探针组件安装在探针杆架架组件上时与被测器件上的导电焊盘配合。