Socket board and test board system having the same
    1.
    发明申请
    Socket board and test board system having the same 审中-公开
    插座板和测试板系统具有相同的功能

    公开(公告)号:US20070184680A1

    公开(公告)日:2007-08-09

    申请号:US11700906

    申请日:2007-02-01

    IPC分类号: H01R12/00

    摘要: A socket board may include an upper board supporting at least one test socket. The upper board may have a major surface defining a first reference plane. At least one stem board may support a stem board application circuit. The stem board may have a major surface defining a second reference plane that may intersect the first reference plane. A conductive member may connect the test socket to the stem board application circuit.

    摘要翻译: 插座板可以包括支撑至少一个测试插座的上板。 上板可以具有限定第一参考平面的主表面。 至少一个杆板可以支撑杆板施加电路。 杆板可以具有限定可与第一参考平面相交的第二参考平面的主表面。 导电构件可以将测试插座连接到杆板应用电路。

    Semiconductor test system and method of operating the same
    2.
    发明授权
    Semiconductor test system and method of operating the same 有权
    半导体测试系统及其操作方法

    公开(公告)号:US06911815B2

    公开(公告)日:2005-06-28

    申请号:US10644727

    申请日:2003-08-21

    摘要: A semiconductor test system and method for the same. A handler is capable of moving and classifying semiconductor packages, a logic tester is capable of receiving a semiconductor package from the handler, and for testing a logic component of the semiconductor package. An analog tester may be coupled to the logic tester, where the analog tester is capable of testing an analog component of the semiconductor package. An interface unit may be included for selectively outputting a logic signal to enable the analog tester.

    摘要翻译: 半导体测试系统及其方法。 处理器能够移动和分类半导体封装,逻辑测试器能够从处理器接收半导体封装,并且用于测试半导体封装的逻辑元件。 模拟测试器可以耦合到逻辑测试器,其中模拟测试器能够测试半导体封装的模拟部件。 可以包括接口单元以选择性地输出逻辑信号以使得模拟测试器能够使用。