Method and apparatus for article inspection including speckle reduction
    1.
    发明授权
    Method and apparatus for article inspection including speckle reduction 有权
    用于物品检查的方法和装置,包括减少斑点

    公开(公告)号:US07463352B2

    公开(公告)日:2008-12-09

    申请号:US11040528

    申请日:2005-01-21

    IPC分类号: G01N21/88

    摘要: A method and apparatus for reducing speckle during inspection of articles used in the manufacture of semiconductor devices, including wafers, masks, photomasks, and reticles. The coherence of a light beam output by a coherent light source, such as a pulsed laser, is reduced by disposing elements in a light path. Examples of such elements include optical fiber bundles; optical light guides; optical gratings; an integrating sphere; and an acousto-optic modulator. These various elements may be combined as desired, such that light beams output by the element combinations have optical path length differences that are greater than a coherence length of the light beam output by the coherent light source.

    摘要翻译: 一种用于在用于制造半导体器件(包括晶片,掩模,光掩模和掩模版)的制品的检查期间减少斑点的方法和装置。 通过在光路中设置元件来减少由相干光源(例如脉冲激光)输出的光束的相干性。 这些元件的实例包括光纤束; 光学导光板; 光栅; 积分球; 和声光调制器。 这些各种元件可以根据需要组合,使得由元件组合输出的光束具有的光路长度差大于由相干光源输出的光束的相干长度。

    Method and apparatus for article inspection including speckle reduction
    7.
    发明授权
    Method and apparatus for article inspection including speckle reduction 失效
    用于物品检查的方法和装置,包括减少斑点

    公开(公告)号:US06429931B1

    公开(公告)日:2002-08-06

    申请号:US10043798

    申请日:2002-01-11

    IPC分类号: G01N2100

    摘要: A method and apparatus for reducing speckle during inspection of articles used in the manufacture of semiconductor devices, including wafers, masks, photomasks, and reticles. The coherence of a light beam output by a coherent light source, such as a pulsed laser, is reduced by disposing elements in a light path. Examples of such elements include optical fiber bundles; optical light guides; optical gratings; an integrating sphere; and an acousto-optic modulator. These various elements may be combined as desired, such that light beams output by the element combinations have optical path length differences that are greater than a coherence length of the light beam output by the coherent light source.

    摘要翻译: 一种用于在用于制造半导体器件(包括晶片,掩模,光掩模和掩模版)的制品的检查期间减少斑点的方法和装置。 通过在光路中设置元件来减少由相干光源(例如脉冲激光)输出的光束的相干性。 这些元件的实例包括光纤束; 光学导光板; 光栅; 积分球; 和声光调制器。 这些各种元件可以根据需要组合,使得由元件组合输出的光束具有的光路长度差大于由相干光源输出的光束的相干长度。