摘要:
Provided is a semiconductor image sensor device that includes a non-scribe-line region and a scribe-line region. The image sensor device includes a first substrate portion disposed in the non-scribe-line region. The first substrate portion contains a doped radiation-sensing region. The image sensor device includes a second substrate portion disposed in the scribe-line region. The second substrate portion has the same material composition as the first substrate portion. Also provided is a method of fabricating an image sensor device. The method includes forming a plurality of radiation-sensing regions in a substrate. The radiation-sensing regions are formed in a non-scribe-line region of the image sensor device. The method includes forming an opening in a scribe-line region of the image sensor device by etching the substrate in the scribe-line region. A portion of the substrate remains in the scribe-line region after the etching. The method includes filling the opening with an organic material.
摘要:
This invention discloses a method for mining a comment term in a document. The method comprises, first, to build a document database and a keyword database, wherein the document database includes at least one digital document, the keyword database includes at least one keyword. Then, a language of the digital document is determined. The digital document is processed based on the language to form a first document. Next, word groups are gathered from the first document based on a gathering range and apart-of-speech, wherein each word group includes the keyword and a word with the part-of-speech.
摘要:
The present invention includes a method, apparatus and graphical user interface (GUI) that allows a simple, precise, thorough, automatic and interactive diagnostic system for electronic devices. The present invention fully automates every test item, as a memory device including the diagnostic test items is inserted into the electronic device and is configured to automatically begin the diagnostic method. The present invention allows for interactive diagnostic analysis and a user is able to automatically repair many of the defects detected by the diagnostic method.
摘要:
The present invention includes a method, apparatus and graphical user interface (GUI) that allows a simple, precise, thorough, automatic and interactive diagnostic system for electronic devices. The present invention fully automates every test item, as a memory device including the diagnostic test items is inserted into the electronic device and is configured to automatically begin the diagnostic method. The present invention allows for interactive diagnostic analysis and a user is able to automatically repair many of the defects detected by the diagnostic method.
摘要:
Provided is a semiconductor image sensor device that includes a non-scribe-line region and a scribe-line region. The image sensor device includes a first substrate portion disposed in the non-scribe-line region. The first substrate portion contains a doped radiation-sensing region. The image sensor device includes a second substrate portion disposed in the scribe-line region. The second substrate portion has the same material composition as the first substrate portion. Also provided is a method of fabricating an image sensor device. The method includes forming a plurality of radiation-sensing regions in a substrate. The radiation-sensing regions are formed in a non-scribe-line region of the image sensor device. The method includes forming an opening in a scribe-line region of the image sensor device by etching the substrate in the scribe-line region. A portion of the substrate remains in the scribe-line region after the etching. The method includes filling the opening with an organic material.