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公开(公告)号：US20230258688A1
公开(公告)日：2023-08-17
申请号：US18163652
申请日：2023-02-02
发明人： Valts Treibergs
CPC分类号： G01R1/06722 , G01R1/07314 , G01R1/06744
摘要： A spring probe assembly for a Kelvin testing system for testing integrated circuit devices is disclosed. The assembly includes a force spring probe and a sense spring probe. Each of the force spring probe and the sense spring probe includes a head; a body containing at least one resilient element; and a bottom. The body has a cylindrical shape, and the head and the body have a same diameter in an end view. The head includes a base and a top integrated with the base. The base has a cylindrical shape. The head includes a shoulder between the base and the top. The top includes an apex. The force spring probe and the sense spring probe are disposed so that the apexes of the force spring probe and the sense spring probe are adjacent to each other.
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公开(公告)号：US11209458B2
公开(公告)日：2021-12-28
申请号：US16939602
申请日：2020-07-27
发明人： John Nelson , Ranauld Perez , Jeffrey Sherry , Michael Andres , David Johnson
摘要： The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.
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公开(公告)号：US11002760B1
公开(公告)日：2021-05-11
申请号：US15889623
申请日：2018-02-06
发明人： Jeffrey Sherry , Dennis Wagner
摘要： A system and method for reducing inductance and capacitance and shielding signals in an integrated circuit test for devices under test (DUT) is disclosed. Inductance and capacitance are reduced in two ways. First, by recessing the contact pin housing 22 directly into the load board 20 thereby eliminating much of distance between the load board and DUT. Second, surrounding the slot/well 50 in which each RF contact pin resides in the housing with a ground isolation cage 46,46a, 48, 47 of electrically conductive strips or rings at the top and bottom of the housing adjacent the slot with connecting vias thereby creating an isolation cage against RF cross talk transmission and further lowering inductance and capacitance.
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公开(公告)号：US10928423B2
公开(公告)日：2021-02-23
申请号：US16120958
申请日：2018-09-04
发明人： John DeBauche , Dan Campion , Michael Andres , Steve Rott , Jeffrey Sherry , Brian Halvorson , Brian Eshult
摘要： The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.
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公开(公告)号：US10794933B1
公开(公告)日：2020-10-06
申请号：US15621548
申请日：2017-06-13
发明人： Jeffrey Sherry , Joel Erdman
摘要： A test socket for a device under test (DUT) is disclosed in several embodiments. One embodiment shows a test socket base (16) with apertures (30) for insertion of test pin insert blocks (28). The blocks are inserted top—in or bottom—in and are provided with registration bosses 80 and teeth 92 or other means for maintaining registration. Blocks are provided with dielectric constants to achieve different frequency response relative to other pins. To achieve great EMI and cross talk isolation, the socket may be made of aluminum with hard anodize coating to insulate test pins (32) from the housing.
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公开(公告)号：US20200313322A1
公开(公告)日：2020-10-01
申请号：US16901789
申请日：2020-06-15
发明人： Jeffrey Sherry , Michael Andres
摘要： A test socket (14) for a testing an integrated circuit (12) with controlled impedance while maintaining the structural integrity of the test pins (20). The pin (20) can have a sidewall with a thick portion 32 and a thinner portion (30) along the length of the pin. The pin can have projections (42) which provide a standoff from the slot (40). The sidewalls themselves can have projections or lands (60, 61) which extend into the slot and provide stability for the pin (20).
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公开(公告)号：US10551412B2
公开(公告)日：2020-02-04
申请号：US15795829
申请日：2017-10-27
发明人： Michael Andres
摘要： A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the test pin is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested. The test pin has a hard stop edge which engages a hard stop wall which limits its rotation movement. The bottom of the pin has a shallow convex curvature preferably with a flat region and the tip of the test pin has a chisel edge.
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公开(公告)号：US10401386B2
公开(公告)日：2019-09-03
申请号：US15249605
申请日：2016-08-29
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.
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10.发明授权公开(公告)号：US10067164B2
公开(公告)日：2018-09-04
申请号：US15245899
申请日：2016-08-24
发明人： John DeBauche , Dan Campion , Michael Andres , Steve Rott , Jeffrey Sherry , Brian Halvorson , Brian Eshult
摘要： The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.
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