公开(公告)号：US20070164393A1

公开(公告)日：2007-07-19

申请号：US10596035

申请日：2004-12-06

Applicant: Konrad Bach ,  Alexander Hoelke ,  Uwe Eckoldt ,  Wolfgang Einbrodt ,  Karl-Ulrich Stahl

Inventor： Konrad Bach ,  Alexander Hoelke ,  Uwe Eckoldt ,  Wolfgang Einbrodt ,  Karl-Ulrich Stahl

IPC: H01L29/00

CPC classification number: H01L27/144 ,  H01L31/02016 ,  H01L31/022408 ,  H01L31/10

Abstract: The aim of the invention is to configure a photodetector (10) such that no disadvantages are created for processing low luminous intensities on detectors known in prior art, especially when monolithically integrating the evalation electronics. Said aim is achieved by a photodetector for processing low luminous intensities, comprising a monolithically integrated transimpedance amplifier and monolithically integrated evaluation electronics. An actual photocell component (20) is assigned to the chip face onto which the light preferably falls. Electronic circuit components (30) are arranged on the opposite chip face. Electrical connections (40) between the photocell and the electronic circuit are provided with an extension in the direction running perpendicular to the chip normal.

Abstract translation: 本发明的目的是配置光电检测器（10），使得在现有技术中已知的检测器上特别是当对评估电子器件进行单片整合时，不会产生用于处理低发光强度的缺点。 所述目的通过用于处理低发光强度的光电检测器实现，其包括单片集成跨阻抗放大器和单片集成评估电子器件。 实际的光电池组件（20）被分配给光优选落在其上的芯片面。 电子电路部件（30）布置在相对的芯片面上。 在光电管和电子电路之间的电连接（40）在垂直于芯片法线的方向上具有延伸。

公开(公告)号：US07491925B2

公开(公告)日：2009-02-17

申请号：US10596035

申请日：2004-12-06

Applicant: Konrad Bach ,  Alexander Hoelke ,  Uwe Eckoldt ,  Wolfgang Einbrodt ,  Karl-Ulrich Stahl

Inventor： Konrad Bach ,  Alexander Hoelke ,  Uwe Eckoldt ,  Wolfgang Einbrodt ,  Karl-Ulrich Stahl

IPC: H03F3/08

CPC classification number: H01L27/144 ,  H01L31/02016 ,  H01L31/022408 ,  H01L31/10

Abstract: The aim of the invention is to configure a photodetector (10) such that no disadvantages are created for processing low luminous intensities on detectors known in prior art, especially when monolithically integrating the evaluation electronics. Said aim is achieved by a photodetector for processing low luminous intensities, comprising a monolithically integrated transimpedance amplifier and monolithically integrated evaluation electronics. An actual photocell component (20) is assigned to the chip face onto which the light preferably falls. Electronic circuit components (30) are arranged on the opposite chip face. Electrical connections (40) between the photocell and the electronic circuit are provided with an extension in the direction running perpendicular to the chip normal.

Abstract translation: 本发明的目的是配置光电检测器（10），使得在现有技术中已知的检测器上特别是当对评估电子器件进行单片整合时，不会产生用于处理低发光强度的缺点。 所述目的通过用于处理低发光强度的光电检测器实现，其包括单片集成跨阻抗放大器和单片集成评估电子器件。 实际的光电池组件（20）被分配给光优选落在其上的芯片面。 电子电路部件（30）布置在相对的芯片面上。 在光电管和电子电路之间的电连接（40）在垂直于芯片法线的方向上具有延伸。

公开(公告)号：US07236743B2

公开(公告)日：2007-06-26

申请号：US10344141

申请日：2001-08-03

Applicant: Matthias Eichin ,  Alexander Kurz ,  Karl-Ulrich Stahl

Inventor： Matthias Eichin ,  Alexander Kurz ,  Karl-Ulrich Stahl

IPC: H04B1/00 ,  H04B15/00 ,  H04B17/02 ,  H04B1/10

CPC classification number: H04B1/24 ,  H04B10/6972

Abstract: In a method for interference suppression using a quality-adjustable bandpass filter in a receiver circuit for carrier-modulated received signals (SIN), the bandpass filtered received signal (Bout) is demodulated, and a switching process is triggered with the demodulated received signal (Dout). In order to eliminate internal or self-induced interferences that would be caused by a switching process in the output portion of the receiver, a quality reduction of the bandpass filter is correlated with the switching process that causes the interference. The method is especially suitable in connection with circuits for infrared receivers, which can thereby be manufactured in a small size, without external components, and thus economically.

Abstract translation: 在用于载波调制接收信号（S SUB IN IN）的接收机电路中使用质量可调带通滤波器的干扰抑制方法中，带通滤波的接收信号（B < ）被解调，并且用解调的接收信号（D OUT）触发切换处理。 为了消除由接收机的输出部分中的切换过程引起的内部或自身的干扰，带通滤波器的质量降低与引起干扰的切换过程相关。 该方法特别适用于红外接收器的电路，由此可以制造成小尺寸，无外部元件，从而经济地制造。