公开(公告)号：US4816064A

公开(公告)日：1989-03-28

申请号：US932527

申请日：1986-11-20

Applicant: Kazuhiko Konno ,  Kouichi Araki ,  Norio Sasaki ,  Keiji Endo ,  Mitsuru Hikido ,  Kiyoshi Sugaya

Inventor： Kazuhiko Konno ,  Kouichi Araki ,  Norio Sasaki ,  Keiji Endo ,  Mitsuru Hikido ,  Kiyoshi Sugaya

IPC: A01N43/70 ,  C07D251/52

CPC classification number: C07D251/52

Abstract: A 1,3,5-triazine derivative represented by the following formula (I) ##STR1## wherein R.sup.1, R.sup.2, R.sup.3 and R.sup.4, independently from each other, represent a hydrogen atom or a group selected from the class consisting of linear or branched C.sub.1 -C.sub.6 alkyl groups, C.sub.2 -C.sub.6 alkenyl groups, C.sub.2 -C.sub.6 alkynyl groups, C.sub.1 -C.sub.6 alkyl groups substituted by C.sub.1 -C.sub.6 alkoxy or alkylthio, C.sub.3 -C.sub.6 cycloalkyl groups, a phenyl group unsubstituted or substituted by a substituent selected from halogen, nitro, cyano, lower alkyl, lower alkoxy, lower alkylthio and fluoro-substituted lower alkyl, C.sub.7 -C.sub.9 aralkyl groups unsubstituted or substituted by a substituent selected from halogen, nitro, cyano, lower alkyl, lower alkoxy, lower alkylthio and fluoro-substituted lower alkyl, and alkoxycarbonylmethyl groups having 1 to 6 carbon atoms in the alkoxy moiety; and Y represents a fluoro-substituted C.sub.1 -C.sub.3 alkyl group and a herbicidal use thereof.

Abstract translation: 由下式（I）表示的1,3,5-三嗪衍生物其中R 1，R 2，R 3和R 4彼此独立地表示氢原子或选自以下的基团： 直链或支链C 1 -C 6烷基，C 2 -C 6烯基，C 2 -C 6炔基，被C 1 -C 6烷氧基或烷硫基取代的C 1 -C 6烷基，C 3 -C 6环烷基，未取代或被取代基取代的苯基 选自卤素，硝基，氰基，低级烷基，低级烷氧基，低级烷硫基和氟取代的低级烷基，未被取代或被选自卤素，硝基，氰基，低级烷基，低级烷氧基，低级烷硫基的取代基取代的C7-C9芳烷基 氟取代的低级烷基和烷氧基部分中具有1-6个碳原子的烷氧基羰基甲基; Y表示氟取代的C 1 -C 3烷基及其除草用途。

公开(公告)号：US4774413A

公开(公告)日：1988-09-27

申请号：US919409

申请日：1986-10-16

Applicant: Masao Okubo ,  Kiyoshi Sugaya ,  Toshinori Takagi ,  Junzo Ishikawa

Inventor： Masao Okubo ,  Kiyoshi Sugaya ,  Toshinori Takagi ,  Junzo Ishikawa

IPC: H05H1/22 ,  H01J27/26 ,  H01J37/08 ,  H01J27/02

CPC classification number: H01J37/08 ,  H01J27/26

Abstract: An ion emmisive head for fusing a metal to emit ion beam is disclosed, wherein a fused metal is designed to infiltrate through a porous portion for flow control and to reach an extremely sharpened needle which is provided after infiltration and wherefrom the fused metal is converted to ion beam by electrical action. Thus, ionized metallic beam is rendered to have smaller width or more focused ray. Submicron technology used in the IC industry, for instance, desires far thinner, finer beam line to attain more compact circuits, which need will be responded in the present invention by disposing a tipping needle to extend out of a porous tip portion which receives the fused metal from melting zone. Appropriate combination of sharpness at the needle point and provision of a beam guiding electrode in neighborhood of an emitting needle point enable to produce about 0.1 micron beam width by prevention of plasma ball which will otherwise diffuse the emitted beam.

Abstract translation: 公开了用于熔化金属以发射离子束的离子发射头，其中熔融金属被设计成渗透通过多孔部分以进行流量控制，并且到达在渗透之后提供的非常锋利的针，并且将熔融金属转化为 离子束通过电动作用。 因此，使电离金属束具有较小的宽度或更聚焦的光线。 例如，在IC工业中使用的亚微米技术需要更薄更细的光束线以获得更紧凑的电路，这在本发明中将需要响应，通过设置倾翻针以延伸出多孔尖端部分，该多孔尖端部分接收熔融 金属从熔化区。 在针尖处的锋利度和在发射针尖附近提供光束引导电极的适当组合使得能够通过防止等离子体球产生大约0.1微米的光束宽度，否则会使发射的光束扩散。

公开(公告)号：US4638217A

公开(公告)日：1987-01-20

申请号：US476470

申请日：1983-03-18

Applicant: Masao Okubo ,  Kiyoshi Sugaya ,  Toshinori Takagi ,  Junzo Ishikawa

Inventor： Masao Okubo ,  Kiyoshi Sugaya ,  Toshinori Takagi ,  Junzo Ishikawa

IPC: H01J37/08 ,  H01J3/04 ,  H01J27/26 ,  H01J49/16 ,  H01J7/24 ,  H05B31/26

CPC classification number: H01J27/26

Abstract: An ion source having a sintered metal head for ionizing various substances is disclosed. This ion source comprises a container made of a material which has a higher fusing point than that of the substance which is to be ionized, and a tip formed of a molded sintered metal of a higher fusing point than that of the substance which is to be ionized. The head is formed into a nearly conical shape and has a porosity capable of allowing the substance which is to be ionized to infiltrate therethrough in the molten state and the tip of the head is positioned at the opening of one end of the container for the ionizable material and arranged in such a manner that it protrudes beyond the end of the container.

Abstract translation: 公开了一种具有用于电离各种物质的烧结金属头的离子源。 该离子源包括由与要离子化的物质相比具有更高熔点的材料制成的容器，以及由与要物质相同的物质的熔点高的成型烧结金属形成的尖端 电离。 头部形成为近似圆锥形的形状，并且具有能够使被离子化的物质在熔融状态下渗透的孔隙，​​并且头部的顶端位于容器的一端的开口处，用于可离子化 材料并且以使其突出超过容器的端部的方式布置。

公开(公告)号：US4298740A

公开(公告)日：1981-11-03

申请号：US137005

申请日：1980-04-03

Applicant: Kazuhiko Konno ,  Atsushi Goh ,  Kiyoshi Sugaya

Inventor： Kazuhiko Konno ,  Atsushi Goh ,  Kiyoshi Sugaya

IPC: C07D295/20 ,  A01N47/12 ,  A01N47/16 ,  C07C67/00 ,  C07C325/00 ,  C07C333/04 ,  C07D211/16 ,  C07D295/21 ,  C07D211/06 ,  C07C155/02 ,  C07D207/24 ,  C07D209/32

CPC classification number: C07D295/21 ,  A01N47/12 ,  A01N47/16

Abstract: In the process for the production of a thiolcarbamate compound of the formula ##STR1## wherein R.sup.1 and R.sup.2 are as defined in claim, comprising reacting a tertiary halogen compound of the formula ##STR2## wherein X and R.sup.3 are as defined in claim, with a thiolcarbamic acid salt of the formula ##STR3## wherein M represents a member selected from the group consisting of the alkali metals, ammonium group and immonium group, in an aqueous reaction medium, in the presence of a strong base; the improvement wherein the reaction is carried out under conditions in which the reaction system is adjusted to a pH ranging from about 9 to about 13.

Abstract translation: 在制备式IMAMA的硫代氨基甲酸酯化合物的方法中，其中R 1和R 2如权利要求中所定义，包括使式（ⅩⅩⅥ）的叔卤素化合物其中X和R 3如权利要求中所定义，与 其中M表示选自碱金属，铵基和亚胺基的成员，在水性反应介质中，在强碱的存在下，式“IMAGE”的硫醇氨基甲酸盐; 其中反应在将反应体系调节至约9至约13的pH的条件下进行的改进。

公开(公告)号：US5134365A

公开(公告)日：1992-07-28

申请号：US735214

申请日：1991-07-24

Applicant: Kazumasa Okubo ,  Masao Okubo ,  Yasuro Yoshimitsu ,  Kiyoshi Sugaya

Inventor： Kazumasa Okubo ,  Masao Okubo ,  Yasuro Yoshimitsu ,  Kiyoshi Sugaya

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/07342 ,  G01R1/06733 ,  G01R1/06711

Abstract: Probe card is a part which is incorporated into probing equipment to test finished IC chips. This card is customarily mounted with a plurality of probes, very fine needle and generally L letter shaped, each of which is disposed so that its front end may project downwardly toward an IC chip. Conventional probes are difficult to align all the probe front ends with electrical ends on the IC chip. Overdrive is normally taken to produce adequate contact pressures with respective probes after all contacts between the probe front ends and the IC ends are formed, but this action often causes conventional probe ends to slip down from the IC ends. The proposed probe card includes a new provision of a resin layer of an elastic, insulative characteristic to fill the central open area of the supporter which is assembled into the probe card. The filling, by such a resin layer, makes the probe front ends resiliently held in position so that a deviation from proper respective dispositions by overdrive becomes avoidable. The disclosure refers to additional devices to enhance the convenience in determining the alignment between the probe front ends and the IC ends, and also in obtaining accurate measurements of an IC chip under test.

Abstract translation: 探头卡是测试成品IC芯片的一部分。 该卡通常安装有多个探针，非常细的针，大致为L字形，每个探针的前端可以朝向IC芯片向下突出。 传统探头难以将所有的探针前端与IC芯片上的电端对齐。 在探针前端和IC端部之间的所有触点形成之后，通常会采用过驱动来产生足够的接触压力，但这种作用往往会导致传统的探针端部从IC端部滑落。 所提出的探针卡包括具有弹性绝缘特性的树脂层的新设置，以填充组装到探针卡中的支撑件的中心开口区域。 通过这种树脂层的填充使得探头前端弹性地保持在适当的位置，使得通过过驱动偏离适当的各自配置变得可避免。 本公开涉及增加确定探针前端和IC端之间的对准的便利性的附加装置，并且还用于获得正在测试的IC芯片的精确测量。

公开(公告)号：US5055778A

公开(公告)日：1991-10-08

申请号：US548401

申请日：1990-07-05

Applicant: Kazumasa Okubo ,  Masao Okubo ,  Yasuro Yoshimitsu ,  Kiyoshi Sugaya

Inventor： Kazumasa Okubo ,  Masao Okubo ,  Yasuro Yoshimitsu ,  Kiyoshi Sugaya

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/07342 ,  G01R1/06733 ,  G01R1/06711

Abstract: Probe card is a part which is incorporated into probing equipment to test finished IC chips. This card is customarily mounted with a plurality of probes, very fine needle and generally L letter shaped, each of which is disposed so that its front end may project downwardly toward an IC chip. Conventional probes are difficult to align all the probe front ends with electrical ends on the IC chip. Overdrive is normally taken to produce adequate contact pressures with respective probes after all contacts between the probe front ends and the IC ends are formed, but this action often causes conventional probe ends to slip down from the IC ends. The proposed probe card includes a new provision of a resin layer of an elastic, insulative characteristic to fill the central open area of the supporter which is assembled into the probe card. The filling, by such a resin layer, makes the probe front ends resiliently held in position so that a deviation from proper respective dispositions by overdrive becomes avoidable. The disclosure refers to additional devices to enhance the convenience in determining the alignment between the probe front ends and the IC ends, and also in obtaining accurate measurements of an IC chip under test.

Abstract translation: 探头卡是测试成品IC芯片的一部分。 该卡通常安装有多个探针，非常细的针，大致为L字形，每个探针的前端可以朝向IC芯片向下突出。 传统探头难以将所有的探针前端与IC芯片上的电端对齐。 在探针前端和IC端部之间的所有触点形成之后，通常会使用过度驱动来产生足够的接触压力，但这种作用往往会导致传统的探针端部从IC端部滑落。 所提出的探针卡包括具有弹性绝缘特性的树脂层的新设置，以填充组装到探针卡中的支撑件的中心开口区域。 通过这种树脂层的填充使得探头前端弹性地保持在适当的位置，使得通过过驱动偏离适当的各自配置变得可避免。 本公开涉及增加确定探针前端和IC端之间的对准的便利性的附加装置，并且还用于获得正在测试的IC芯片的精确测量。