公开(公告)号：US08744796B2

公开(公告)日：2014-06-03

申请号：US13088880

申请日：2011-04-18

申请人： Chun-Chia Chen ,  Li-Ming Teng ,  Yu-Tsao Hsing

发明人： Chun-Chia Chen ,  Li-Ming Teng ,  Yu-Tsao Hsing

IPC分类号： G06F11/00 ,  G06F11/14

CPC分类号： G06F11/1441 ,  G11C29/16

摘要： The present invention discloses an algorithm integrating system and an integrating method thereof. The algorithm integrating system comprises a receiving module, an analyzing module, and a processing module. The receiving module receives at least one test algorithm. The analyzing module is connected to the receiving module and analyzes the at least one test algorithm to obtain at least one basic element from the at least one test algorithm. The processing module is connected to the analyzing module and screen out the at least one non-duplicate basic element based on the at least one basic element. Then, the processing module integrates the at least one non-duplicate basic element and generates a testing module.

摘要翻译： 本发明公开了一种算法集成系统及其集成方法。 算法集成系统包括接收模块，分析模块和处理模块。 接收模块接收至少一个测试算法。 所述分析模块连接到所述接收模块，并且分析所述至少一个测试算法以从所述至少一个测试算法中获得至少一个基本元素。 所述处理模块连接到所述分析模块，并基于所述至少一个基本元素屏蔽所述至少一个非重复的基本元素。 然后，处理模块集成至少一个非重复的基本元素，并生成测试模块。

公开(公告)号：US08281199B2

公开(公告)日：2012-10-02

申请号：US12772407

申请日：2010-05-03

申请人： Yu-Tsao Hsing ,  Li-Ming Teng

发明人： Yu-Tsao Hsing ,  Li-Ming Teng

IPC分类号： G11C29/00 ,  G01R31/28 ,  G01R31/3187

CPC分类号： G11C29/1201 ,  G11C29/26 ,  G11C29/48 ,  G11C2029/0401

摘要： A hybrid self-test circuit structure comprises a plurality of input terminals and a plurality of output terminals for testing a plurality of memory units. The circuit structure comprises a first level functional unit for driving a plurality of first output terminals electrically coupled to the first level functional unit to output an output signal according to an external control signal transmitted from the outside; a plurality of second level functional units for receiving the output signal and generating a test signal according to the output signal and outputting the test signal to the memory units; a parallel interface parallelly installed between the first level functional unit and at least one of the second level functional units; and a serial interface serially installed between the first level functional unit and at least one of the second level functional units.

摘要翻译： 混合自检电路结构包括多个输入端和用于测试多个存储单元的多个输出端。 电路结构包括：第一级功能单元，用于驱动电耦合到第一级功能单元的多个第一输出端，​​以根据从外部发送的外部控制信号输出输出信号; 多个第二级功能单元，用于接收输出信号，并根据输出信号产生测试信号，并将测试信号输出到存储单元; 并行接口，并行地安装在所述第一级功能单元和所述第二级功能单元中的至少一个之间; 以及串行接口，串行地安装在第一级功能单元和至少一个第二级功能单元之间。

公开(公告)号：US20110267071A1

公开(公告)日：2011-11-03

申请号：US12772407

申请日：2010-05-03

申请人： Yu-Tsao Hsing ,  Li-Ming Teng

发明人： Yu-Tsao Hsing ,  Li-Ming Teng

IPC分类号： G01R31/02

CPC分类号： G11C29/1201 ,  G11C29/26 ,  G11C29/48 ,  G11C2029/0401

摘要： A hybrid self-test circuit structure comprises a plurality of input terminals and a plurality of output terminals for testing a plurality of memory units. The circuit structure comprises a first level functional unit for driving a plurality of first output terminals electrically coupled to the first level functional unit to output an output signal according to an external control signal transmitted from the outside; a plurality of second level functional units for receiving the output signal and generating a test signal according to the output signal and outputting the test signal to the memory units; a parallel interface parallelly installed between the first level functional unit and at least one of the second level functional units; and a serial interface serially installed between the first level functional unit and at least one of the second level functional units.

摘要翻译： 混合自检电路结构包括多个输入端和用于测试多个存储单元的多个输出端。 电路结构包括：第一级功能单元，用于驱动电耦合到第一级功能单元的多个第一输出端，​​以根据从外部发送的外部控制信号输出输出信号; 多个第二级功能单元，用于接收输出信号，并根据输出信号产生测试信号，并将测试信号输出到存储单元; 并行接口，并行地安装在所述第一级功能单元和所述第二级功能单元中的至少一个之间; 以及串行接口，串行地安装在第一级功能单元和至少一个第二级功能单元之间。

公开(公告)号：US20120124441A1

公开(公告)日：2012-05-17

申请号：US12984988

申请日：2011-01-05

申请人： LI-MING TENG ,  YU-TSAO HSING

发明人： LI-MING TENG ,  YU-TSAO HSING

IPC分类号： G06F11/263

CPC分类号： G11C29/16

摘要： The present invention discloses an embedded testing module and testing method thereof which encodes one or more test commands to reduce the storage space required by a testing memory. In addition, most functions of automatic test equipment can be replaced by the present invention, in which, through the testing memory according to the present invention, if errors are found during testing, the error information will be transmitted to the external automatic test equipment and the error information can be optionally recorded in a memory. A test operator can get detailed descriptions from the error information stored in the memory, so the test operator can save time for subsequent debugging and tracking operations concerning the errors.

摘要翻译： 本发明公开了一种嵌入式测试模块及其测试方法，其编码一个或多个测试命令以减少测试存储器所需的存储空间。 此外，自动测试设备的大多数功能可以由本发明替代，其中通过根据本发明的测试存储器，如果在测试期间发现错误，则错误信息将被传送到外部自动测试设备，并且 错误信息可以可选地记录在存储器中。 测试操作员可以从存储器中存储的错误信息中获得详细的描述，因此测试操作员可以节省时间，以便随后进行有关错误的调试和跟踪操作。

公开(公告)号：US20120089360A1

公开(公告)日：2012-04-12

申请号：US13088880

申请日：2011-04-18

申请人： Chun-Chia Chen ,  Li-Ming Teng ,  Yu-Tsao Hsing

发明人： Chun-Chia Chen ,  Li-Ming Teng ,  Yu-Tsao Hsing

IPC分类号： G06F19/00

CPC分类号： G06F11/1441 ,  G11C29/16

摘要： The present invention discloses an algorithm integrating system and an integrating method thereof. The algorithm integrating system comprises a receiving module, an analyzing module, and a processing module. The receiving module receives at least one test algorithm. The analyzing module is connected to the receiving module and analyzes the at least one test algorithm to obtain at least one basic element from the at least one test algorithm. The processing module is connected to the analyzing module and screen out the at least one non-duplicate basic element based on the at least one basic element. Then, the processing module integrates the at least one non-duplicate basic element and generates a testing module.

摘要翻译： 本发明公开了一种算法集成系统及其集成方法。 算法集成系统包括接收模块，分析模块和处理模块。 接收模块接收至少一个测试算法。 所述分析模块连接到所述接收模块，并且分析所述至少一个测试算法以从所述至少一个测试算法中获得至少一个基本元素。 所述处理模块连接到所述分析模块，并基于所述至少一个基本元素屏蔽所述至少一个非重复的基本元素。 然后，处理模块集成至少一个非重复的基本元素，并生成测试模块。