摘要:
An automatic pattern original reading apparatus is disclosed in which perforation position coordinate data of a pattern original indicating a perforation position of a printed substrate is stored beforehand, and a hole diameter indication sheet having a colored indication which discriminates perforation diameter and which is located at a position corresponding to the perforation position of the pattern original is placed on a table. The table and an optical system for optically reading reflected light from the color indication through color filters are moved relatively to each other by position control circuits to the perforation position. The color detection output from the optical system is discriminated with respect to color by a color discrimination circuit, and the color discrimination output is stored in a memory as hole diameter information in a corresponding relationship with the perforation position coordinate data.
摘要:
A multiple-imaging charged particle-beam exposure system includes a charged particle beam source, and a screen lens having lens apertures therein. A charged particle beam is emitted from the charged particle beam source. A beam emerging from each of the lens apertures of the screen lens is irradiated on an object to be exposed, to effect exposure on the object. An image forming electrode is interposed between the screen lens and the object for focusing beams emerging from the screen lens to form images at the image forming electrode. An acceleration/deceleration correcting lens is interposed between the image forming electrode and the object for limiting divergency of the images formed at the image forming electrode. A bias voltage controller applies a bias voltage relative to a potential at the image forming electrode to a surface of the object. Alternatively, a beam limiting aperture plate having beam limiting apertures therein is interposed between the charged particle beam source and the screen lens. A deflector, is interposed between the beam limiting aperture plate and the screen lens, individually deflects charged particle beams emerging from the beam limiting apertures. Alternatively, a limiting aperture shapes the charged particle beam emitted from the charged particle beam source. A drawing electrode takes out the charged particle beam via the limiting aperture, and a deflector deflects the charged particle beam. An Einzel lens is interposed between the drawing electrode and the deflector.
摘要:
Hole diameter information is represented by color information. After detecting the color information, the detected color information is converted and generated into the hole diameter information. In this manner, a plurality of kinds of hole diameter information can be processed simultaneously, and efficiently with error reduction. The invention disclosed includes a pattern figure (2a) having a plurality of marks corresponding to holing positions of a printed board or the like and indicated by identification colors (3) corresponding to hole diameters of the holing positions. A detecting device 4 for generating detection signals corrsponding to the identification colors (2) of the marks in the pattern figure (2a), and hole diameter information generating means (6) for generating information representing the hole diameters by deciding the identification colors.