摘要:
A circuit structure for reading data contained in an electrically programmable/erasable integrated non-volatile memory device includes a matrix of memory cells and at least one reference cell for comparison with a memory cell during a reading phase. The reference cell is incorporated in a reference cells sub-matrix which is structurally independent of the matrix of memory cells. Also provided is a conduction path between the matrix and the sub-matrix, which path includes bit lines of the sub-matrix of reference cells extended continuously into the matrix of memory cells.
摘要:
The integrated device comprises a PMOS transistor and a voltage selector having an output connected to the bulk terminal of the PMOS transistor. The voltage selector comprises an input stage supplying a supply voltage or a programming voltage according to whether the device is in a reading step or in a programming step; a comparator connected to the output of the input stage, receiving a boosted voltage, and generating a first control signal, the state whereof depends upon the comparison of the voltages at the inputs of the comparator; a logic circuit connected to the output of the comparator and generating a second control signal, the state whereof depends upon the state of the first control signal and of a third-level signal; and a switching circuit controlled by the first control signal, by the second control signal, and by the third-level signal and supplying each time the highest among the supply voltage, the boosted voltage, and the programming voltage.
摘要:
A sense amplifier is provided that includes a measure branch receiving an input current to be detected, a reference branch receiving a reference current, and an equalizing circuit including a comparator. The equalizing circuit selectively equalizes a measure node of the measure branch with a reference node of the reference branch, and the comparator compares a voltage at the measure node of the measure branch with a voltage at the reference node of the reference branch. The equalizing circuit is such that, when activated, equalization of the measure node with the reference node is virtual and substantially does not involve a flow of current between the measure node and the reference node of the reference branch. The sense amplifier is particularly suited for reading memory cells of a semiconductor memory. Also provided is a method for sensing an input current.
摘要:
The method comprises the steps of detecting the trailing edge of an initialization signal, and generating a read bias signal and a read activation signal for the cell, when the trailing edge of the initialization signal is detected. The signals of read bias and read activation have a ramp-like leading edge and both signals are disabled when reading of the cell is completed. Thereby, phenomena of soft-writing of the cell are avoided, and risks of erroneous readings are reduced.
摘要:
The circuit, in accordance with the present invention is for detecting the presence at a signal input of a high voltage higher than a predetermined value and signaling it to a signal output through a logical type signal. The circuit comprises one or more first transistors of MOS type and of a predetermined conductivity type, each being diode-connected and having its body terminal connected to the source terminal, and having principal conduction paths connected in series for current conduction between a first node and a ground input. The circuit also includes two or more second transistors of the MOS type and of the same conductivity type, with each one being diode-connected and having its body terminal connected to the source terminal and having principal conduction paths connected in series for current conduction between the signal input and the first node. At least one first logical inverter of the CMOS type has its input connected to the first node and its output coupled to the signal output and is also connected for power supply to a power supply input and to the ground input.
摘要:
A sense amplifier is provided that includes a measure branch receiving an input current to be detected, a reference branch receiving a reference current, equalizing means, and a comparator. The equalizing means selectively equalizes a measure node of the measure branch with a reference node of the reference branch, and the comparator compares a voltage at the measure node of the measure branch with a voltage at the reference node of the reference branch. The equalizing means are such that, when activated, equalization of the measure node with the reference node is virtual and substantially does not involve a flow of current between the measure node and the reference node of the reference branch. The sense amplifier is particularly suited for reading memory cells of a semiconductor memory. Also provided is a method for sensing an input current.
摘要:
Described herein is an asynchronous serial dichotomic sense amplifier comprising a first comparator stage having a first input receiving the cell current flowing in the multilevel memory cell, the content of which is to be read, a second input receiving a first reference current, and an output supplying the first of the bits stored in the multilevel memory cell; a multiplexer stage having a selection input connected to the output of the first comparator stage, a first signal input receiving a second reference current, a second signal input receiving a third reference current, and a signal output selectively connectable to the first or the second signal input depending on the logic level present on the selection input; and a second comparator stage having a first input receiving the cell current, a second input connected to the signal output of the multiplexer stage, and an output supplying the second of the bits stored in the multilevel memory cell.
摘要:
A voltage boosting device for speeding power-up of multilevel nonvolatile memories, including a voltage regulator and a charge pump and having an output terminal; the voltage regulator having a regulation terminal connected to the output terminal, and an output supplying a control voltage; the read charge pump having an output connected to the output terminal and supplying a read voltage. The device further includes an enable circuit connected to the output and having a pump enable output connected to a charge pump enable terminal and supplying a pump enable signal. The pump enable signal is set at a first logic level so as to activate the charge pump when the read voltage is lower than a nominal value. In addition, the device generates a power-up sync signal which activates a read operation when the read voltage reaches its nominal value and a chip enable signal is set at an active value.
摘要:
A method for testing memory cells, and in particular virgin memory cells, in a multilevel memory device having a plurality of memory cells. The method includes reading the individual memory cells that constitute a memory device and comparing each one of these memory cells with at least one reference memory cell at a time, so as to determine whether the threshold of the memory cells is lower than the threshold of the at least one reference memory cell or not; determining the number of the memory cells whose threshold is higher than the threshold of the at least one reference cell; the at least one reference memory cell being chosen with a gradually higher threshold; when the number of memory cells whose threshold is higher than a given reference threshold is found to be sufficiently lower than the number of redundancy memory cells provided in the memory device, assuming the given reference threshold as lower reference threshold for the memory device, determining a statistical distribution of the thresholds of the memory cells.
摘要:
A compensated voltage regulator of the type used in programming non-volatile memory cells of a memory cell matrix that is divided into sectors. The voltage regulator includes a comparator that is connected to a supply voltage. A first input terminal of the comparator is supplied a reference voltage, and a second input terminal is feedback connected to a program line. The control terminal of an output transistor is connected to an output terminal of the comparator, and a conduction terminal of the output transistor is connected to the memory cells by the program line. An output current is passed through a conduction terminal of the output transistor. Further, a compensation circuit is powered by the supply voltage. An input of the compensation circuit is connected to the output terminal of the comparator and to the output transistor, and an output of the compensation circuit is also connected to the output terminal of the comparator. This causes the duplication of a current that is suitably attenuated with respect to the output current and is useful in modifying the output voltage of the comparator.