公开(公告)号：US20110286960A1

公开(公告)日：2011-11-24

申请号：US13126929

申请日：2009-11-02

申请人： Oded Vainas ,  Vladimir Vainstein ,  Ori Inbar ,  Marina Kleiman ,  Radel Ben-av ,  Zvia Agur

发明人： Oded Vainas ,  Vladimir Vainstein ,  Ori Inbar ,  Marina Kleiman ,  Radel Ben-av ,  Zvia Agur

IPC分类号： A61K38/19 ,  A61P37/00 ,  G06G7/60 ,  A61P35/00

CPC分类号： A61K45/06 ,  A61K38/193 ,  G16C20/30 ,  A61K2300/00

摘要： Neutropenia is the dose-limiting toxicity of the tri-weekly docetaxel (Taxotere®) schedule. Here, we evaluate in Metastatic Breast Cancer (MBC) patients (N=38) a computerized method for predicting docetaxel-induced neutropenia, and use the model to identify improved docetaxel and Granulocyte Colony Stimulating Factor (G-CSF) regimens. Pharmacokinetics/pharmacodynamics (PK/PD) models were created and simulated concomitantly with a mathematical granulopoiesis model. Individual baseline neutrophil counts and docetaxel schedules served as inputs. Our trial validated the model accuracy in predicting nadir timings (r=0.99), grade 3/4 neutropenia (86% success) and neutrophil profiles (r=0.62). Model was robust to CYP3A-induced variability, except for slightly less accurate grade 3/4 neutropenia predictions. Simulations confirm smaller toxicity of the weekly docetaxel regimen than the tri-weekly one, and suggest an optimal G-CSF support for alleviating neutropenia, 60 μg/day QD×3, 6-7 days post-docetaxel, administered tri- and bi-weekly, and 4 days post weekly docetaxel>33 mg/m2.

摘要翻译： 中性粒细胞减少是三周多西他赛（Taxotere®）计划的剂量限制性毒性。 在这里，我们评估转移性乳腺癌（MBC）患者（N = 38）一种预测多西紫杉醇诱导的中性粒细胞减少的计算机化方法，并使用该模型来鉴定改良的多西他赛和粒细胞集落刺激因子（G-CSF）方案。 药物动力学/药效学（PK / PD）模型被创建并模拟与数学粒子学模型。 单个基线嗜中性粒细胞计数和多西他赛计划作为输入。 我们的试验验证了模型准确性预测最低点时间（r = 0.99），3/4级中性粒细胞减少（86％成功）和嗜中性粒细胞分布（r = 0.62）。 模型对CYP3A诱导的变异性是稳健的，除了稍微不太准确的3/4级中性粒细胞减少预测。 模拟证实每周多西紫杉醇方案的毒性小于三周一次，并建议最佳的G-CSF支持减轻中性粒细胞减少，60μg/天QD×3,6-天后多西紫杉醇，给予三 - 和二 - 每周，每周多西紫杉醇> 33 mg / m2。

公开(公告)号：US07800062B2

公开(公告)日：2010-09-21

申请号：US10912792

申请日：2004-08-06

申请人： Alex Goldenshtein ,  Radel Ben-Av ,  Asher Pearl ,  Igor Petrov ,  Nadav Haas ,  Pavel Adamec ,  Yaron Gold

发明人： Alex Goldenshtein ,  Radel Ben-Av ,  Asher Pearl ,  Igor Petrov ,  Nadav Haas ,  Pavel Adamec ,  Yaron Gold

IPC分类号： G01B15/04

CPC分类号： G01N23/22 ,  G01N23/203 ,  H01J37/1478 ,  H01J37/265 ,  H01J2237/202 ,  H01J2237/2611 ,  H01J2237/281

摘要： The present invention provides, according to a first aspect, a method for the examination of specimen with a beam of charged particles. The method provides one or more images of the specimen made with different view angles, so that, compared to a single image of the specimen, a lot of additional information about the specimen can be accessed. The different view angles (angles of incidence) are achieved by tilting the beam between the two images and moving the specimen to a new position so that the displacement of the beam caused by the tilting of the beam is compensated. Accordingly, while displaying/recording the second image the beam scans over the same area as it has scanned while displaying/recording the first image.

摘要翻译： 根据第一方面，本发明提供一种用带电粒子束检查样品的方法。 该方法提供了具有不同视角的样本的一个或多个图像，使得与样本的单个图像相比，可以访问大量关于样本的附加信息。 通过在两个图像之间倾斜光束并将样本移动到新位置来实现不同的视角（入射角），使得由光束的倾斜引起的光束的位移被补偿。 因此，当显示/记录第二图像时，在显示/记录第一图像的同时，光束扫描与其扫描的相同的区域。

公开(公告)号：US20050116164A1

公开(公告)日：2005-06-02

申请号：US10912792

申请日：2004-08-06

申请人： Alex Goldenshtein ,  Radel Ben-Av ,  Asher Pearl ,  Igor Petrov ,  Nadav Haas

发明人： Alex Goldenshtein ,  Radel Ben-Av ,  Asher Pearl ,  Igor Petrov ,  Nadav Haas

IPC分类号： G01N23/203 ,  G01N23/22 ,  G21K7/00 ,  G01N23/00

CPC分类号： G01N23/22 ,  G01N23/203 ,  H01J37/1478 ,  H01J37/265 ,  H01J2237/202 ,  H01J2237/2611 ,  H01J2237/281

摘要： The present invention provides, according to a first aspect, a method for the examination of specimen with a beam of charged particles. The method provides one or more images of the specimen made with different view angles, so that, compared to a single image of the specimen, a lot of additional information about the specimen can be accessed. The different view angles (angles of incidence) are achieved by tilting the beam between the two images and moving the specimen to a new position so that the displacement of the beam caused by the tilting of the beam is compensated. Accordingly, while displaying/recording the second image the beam scans over the same area as it has scanned while displaying/recording the first image.

摘要翻译： 根据第一方面，本发明提供一种用带电粒子束检查样品的方法。 该方法提供了具有不同视角的样本的一个或多个图像，使得与样本的单个图像相比，可以访问大量关于样本的附加信息。 通过在两个图像之间倾斜光束并将样本移动到新位置来实现不同的视角（入射角），使得由光束的倾斜引起的光束的位移被补偿。 因此，当显示/记录第二图像时，在显示/记录第一图像的同时，光束扫描与其扫描的相同的区域。

公开(公告)号：US06894435B2

公开(公告)日：2005-05-17

申请号：US10289882

申请日：2002-11-06

申请人： David Aviel ,  Jimmy Vishnipolsky ,  Radel Ben-Av

发明人： David Aviel ,  Jimmy Vishnipolsky ,  Radel Ben-Av

IPC分类号： G03F7/00 ,  G09G3/10 ,  G21G5/00 ,  H01J37/302 ,  H01J37/317 ,  H05B37/00

CPC分类号： H01J37/3177 ,  B82Y10/00 ,  B82Y40/00 ,  H01J2237/31762 ,  H01J2237/31766 ,  H01J2237/31767 ,  H01J2237/31771 ,  H01J2237/31774

摘要： A method for scanning a specimen 105 with beams 102 of charged particles of a source group. Thereby, a plurality of target points 402 is scanned with a charged particle beam emitted by a source 106 and the same plurality of target points is scanned with at least one further charged particle beam emitted by at least one further source. Further, the charged particle beams from the source and the at least one further source are emitted on the same target point at different times. Additionally, a multiple charged particle beam source and a data feed system are provided. A source array 104 comprises at least one logical emitting unit 106, wherein patterning information is shifted in a shift circuit 140, and redundancy emitting units 106, wherein individual redundancy emitting units obtain patterning information from the shift register.

摘要翻译： 用于用源组的带电粒子的束102扫描试样105的方法。 因此，用源106发射的带电粒子束扫描多个目标点402，并且用至少一个另外的源发射的至少一个另外带电的粒子束扫描相同的多个目标点。 此外，来自源极和至少一个另外的源的带电粒子束在不同时间被发射在相同的目标点上。 另外，提供多重带电粒子束源和数据馈送系统。 源阵列104包括至少一个逻辑发射单元106，其中图形化信息在移位电路140中移位，以及冗余发射单元106，其中各个冗余发射单元从移位寄存器获得图形信息。