ACTIVE PROBE CARD FOR ELECTRICAL WAFER SORT OF INTEGRATED CIRCUITS
    1.
    发明申请
    ACTIVE PROBE CARD FOR ELECTRICAL WAFER SORT OF INTEGRATED CIRCUITS 有权
    用于集成电路的电动滚筒主动探头卡

    公开(公告)号:US20130027071A1

    公开(公告)日:2013-01-31

    申请号:US13558210

    申请日:2012-07-25

    CPC classification number: G01R31/2889 G01R31/3025

    Abstract: A testing apparatus includes a tester and a probe card system that includes a probe card connected to the tester, and an active interposer connected to the probe card and wirelessly coupled with a device to be tested. The active interposer includes pads positioned on its free surface facing the device. The pads are positioned with respect to pads of the device so that each pad of the active interposer faces a pad of the device and is separated therefrom by a dielectric. Each pair of facing pads forms an elementary wireless coupling element which allows a wireless transmission between the active interposer and the device. The active interposer also includes an amplifier circuit configured to amplify wireless signals from the device before forwarding them to the tester. The probe card system includes a transmission element able to transmit a power voltage from the tester to the device.

    Abstract translation: 测试装置包括测试器和探针卡系统,其包括连接到测试器的探针卡,以及连接到探针卡并与要测试的设备无线耦合的有源插入器。 有源插入器包括位于其面向设备的自由表面上的焊盘。 焊盘相对于器件的焊盘定位,使得有源插入器的每个焊盘面向器件的焊盘并且通过电介质与其分离。 每对相对的焊盘形成基本无线耦合元件,其允许在有源插入器和设备之间进行无线传输。 有源插入器还包括放大器电路,其被配置为在将它们转发到测试器之前放大来自器件的无线信号。 探针卡系统包括能够从测试仪向设备传输电力电压的传输元件。

    Active probe card for electrical wafer sort of integrated circuits
    2.
    发明授权
    Active probe card for electrical wafer sort of integrated circuits 有权
    用于电子晶圆的主动探针卡集成电路

    公开(公告)号:US09176185B2

    公开(公告)日:2015-11-03

    申请号:US13558210

    申请日:2012-07-25

    CPC classification number: G01R31/2889 G01R31/3025

    Abstract: A testing apparatus includes a tester and a probe card system that includes a probe card connected to the tester, and an active interposer connected to the probe card and wirelessly coupled with a device to be tested. The active interposer includes pads positioned on its free surface facing the device. The pads are positioned with respect to pads of the device so that each pad of the active interposer faces a pad of the device and is separated therefrom by a dielectric. Each pair of facing pads forms an elementary wireless coupling element which allows a wireless transmission between the active interposer and the device. The active interposer also includes an amplifier circuit configured to amplify wireless signals from the device before forwarding them to the tester. The probe card system includes a transmission element able to transmit a power voltage from the tester to the device.

    Abstract translation: 测试装置包括测试器和探针卡系统,其包括连接到测试器的探针卡,以及连接到探针卡并与要测试的设备无线耦合的有源插入器。 有源插入器包括位于其面向设备的自由表面上的焊盘。 焊盘相对于器件的焊盘定位,使得有源插入器的每个焊盘面向器件的焊盘并且通过电介质与其分离。 每对相对的焊盘形成基本无线耦合元件,其允许在有源插入器和设备之间进行无线传输。 有源插入器还包括放大器电路,其被配置为在将它们转发到测试器之前放大来自器件的无线信号。 探针卡系统包括能够从测试仪向设备传输电力电压的传输元件。

    Communication cell for an integrated circuit, chip comprising said communication cell, electronic system including the chip, and test apparatus
    3.
    发明授权
    Communication cell for an integrated circuit, chip comprising said communication cell, electronic system including the chip, and test apparatus 有权
    用于集成电路的通信单元,包括所述通信单元的芯片,包括芯片的电子系统和测试装置

    公开(公告)号:US08773162B2

    公开(公告)日:2014-07-08

    申请号:US12980832

    申请日:2010-12-29

    Abstract: An embodiment of communication cell for enabling data communication between an integrated circuit and an electronic unit distinct from the integrated circuit, comprising a contact pad unit, configured for capacitively coupling, in a first operating condition of said communication cell, to the electronic unit for receiving an input signal from said electronic unit, and for ohmically coupling, in a second operating condition of said communication cell, to the electronic unit for receiving the input signal; a receiver device, including signal-amplifying means, coupled between said contact pad unit and said integrated circuit, configured for receiving the input signal and generating an intermediate signal correlated to the input signal; signal-selection means receiving the intermediate signal, the input signal, and providing an output signal which is the intermediate signal during the first operating condition, and the input signal during the second operating condition; and an input stage, connectable between the integrated circuit and the output terminal of the signal-selection means, configured for receiving the output signal and providing the output signal to the integrated circuit.

    Abstract translation: 一种通信单元的实施例,用于实现与集成电路不同的集成电路和电子单元之间的数据通信,包括接触焊盘单元,其被配置为在所述通信单元的第一操作状态下电容耦合到用于接收的电子单元 来自所述电子单元的输入信号,并用于在所述通信单元的第二操作状态下欧姆耦合到用于接收输入信号的电子单元; 耦合在所述接触焊盘单元和所述集成电路之间的接收器装置,包括信号放大装置,被配置为接收输入信号并产生与输入信号相关的中间信号; 信号选择装置,在第一操作状态期间接收中间信号,输入信号,并提供作为中间信号的输出信号,以及在第二操作条件期间输入输入信号; 以及输入级,可连接在所述集成电路和所述信号选择装置的输出端之间,用于接收所述输出信号并将所述输出信号提供给所述集成电路。

    COMMUNICATION CELL FOR AN INTEGRATED CIRCUIT, CHIP COMPRISING SAID COMMUNICATION CELL, ELECTRONIC SYSTEM INCLUDING THE CHIP, AND TEST APPARATUS
    4.
    发明申请
    COMMUNICATION CELL FOR AN INTEGRATED CIRCUIT, CHIP COMPRISING SAID COMMUNICATION CELL, ELECTRONIC SYSTEM INCLUDING THE CHIP, AND TEST APPARATUS 有权
    用于集成电路的通信单元,包含通信单元的芯片,包括芯片的电子系统和测试装置

    公开(公告)号:US20110171906A1

    公开(公告)日:2011-07-14

    申请号:US12980832

    申请日:2010-12-29

    Abstract: An embodiment of communication cell for enabling data communication between an integrated circuit and an electronic unit distinct from the integrated circuit, comprising a contact pad unit, configured for capacitively coupling, in a first operating condition of said communication cell, to the electronic unit for receiving an input signal from said electronic unit, and for ohmically coupling, in a second operating condition of said communication cell, to the electronic unit for receiving the input signal; a receiver device, including signal-amplifying means, coupled between said contact pad unit and said integrated circuit, configured for receiving the input signal and generating an intermediate signal correlated to the input signal; signal-selection means receiving the intermediate signal, the input signal, and providing an output signal which is the intermediate signal during the first operating condition, and the input signal during the second operating condition; and an input stage, connectable between the integrated circuit and the output terminal of the signal-selection means, configured for receiving the output signal and providing the output signal to the integrated circuit.

    Abstract translation: 一种通信单元的实施例,用于实现与集成电路不同的集成电路和电子单元之间的数据通信,包括接触焊盘单元,其被配置为在所述通信单元的第一操作状态下电容耦合到用于接收的电子单元 来自所述电子单元的输入信号,并用于在所述通信单元的第二操作状态下欧姆耦合到用于接收输入信号的电子单元; 耦合在所述接触焊盘单元和所述集成电路之间的接收器装置,包括信号放大装置,被配置为接收输入信号并产生与输入信号相关的中间信号; 信号选择装置,在第一操作状态期间接收中间信号,输入信号,并提供作为中间信号的输出信号,以及在第二操作条件期间输入输入信号; 以及输入级,可连接在所述集成电路和所述信号选择装置的输出端之间,用于接收所述输出信号并将所述输出信号提供给所述集成电路。

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