Abstract:
An SRAM array and a dummy cell row structure is discussed that permits an SRAM array to be divided into segments isolated by a row pattern of dummy cells. The dummy cell structure avoids the use of special OPC conditions at the power supply line and block boundaries by providing a continuous cell array at the lower cell patterning levels in an area efficient implementation. In one implementation, the SRAM array comprises a first and second array block each comprising an SRAM cell having a first layout configuration, one or more of the dummy cells having a second layout configuration arranged along the row pattern associated with a wordline of the SRAM array, a first power supply voltage line connected to the first array block, and a second different power supply voltage line connected to the second array block. The first and second power supply voltage lines of the array blocks are further connected to the one or more dummy cells. Beneficially, the bitlines of the array may be continuous across the first and second array blocks and a dummy cell associated therewith.
Abstract:
A computer-implemented method of configuring a static random access memory (SRAM) bit cell for operation, an adaptive biasing device and semiconductor wafer testing system. In one embodiment, the method includes: (1) determining a performance characteristic of the SRAM bit cell on a wafer, (2) comparing the performance characteristic to a target and (3) configuring biasing circuitry associated with the SRAM bit cell based on the comparing.
Abstract:
One embodiment of the present invention includes a system for managing power of a memory array. The system comprises a comparator configured to compare a first voltage with a reference voltage. The first voltage can correspond to an operating voltage of at least one of a peripheral circuit associated with the memory array and a logic circuit configured to communicate with the peripheral circuit. The reference voltage can correspond to a minimum threshold voltage for read/write operations of the memory array. The system also comprises an output circuit configured to provide an output voltage to the memory array in response to an output of the comparator. The output voltage can be the greater of the operating voltage of the at least one of the peripheral circuit and the logic circuit and the minimum threshold voltage.
Abstract:
A computer system including a control logic and a storage coupled to the control logic. The storage includes a plurality of bitcells and bitlines used to transfer data between the control logic and the bitcells. The control logic provides an address of a target bitcell to the storage. Within a single clock cycle, the storage uses the address to activate the target bitcell, to precharge bitlines coupled to the target bitcell, and to access the target bitcell.
Abstract:
Digital circuitry in a data processing system includes parallel signature analysis circuitry having a sampling feature which permits sampling any given signal on all clock phases of the digital circuitry. The parallel signature analysis circuitry provides for selective coupling of a target node to each of the respective inputs of a pair of serially-coupled latches.
Abstract:
A computer system comprising a control logic and a storage coupled to the control logic. The storage comprises a plurality of bitcells and bitlines used to transfer data between the control logic and the bitcells. The control logic provides an address of a target bitcell to the storage. Within a single clock cycle, the storage uses the address to activate the target bitcell, to precharge bitlines coupled to the target bitcell, and to access the target bitcell.
Abstract:
One embodiment of the present invention includes a system for managing power of a memory array. The system comprises a comparator configured to compare a first voltage with a reference voltage. The first voltage can correspond to an operating voltage of at least one of a peripheral circuit associated with the memory array and a logic circuit configured to communicate with the peripheral circuit. The reference voltage can correspond to a minimum threshold voltage for read/write operations of the memory array. The system also comprises an output circuit configured to provide an output voltage to the memory array in response to an output of the comparator. The output voltage can be the greater of the operating voltage of the at least one of the peripheral circuit and the logic circuit and the minimum threshold voltage.
Abstract:
An SRAM array with a dummy cell row structure in which the SRAM array is divided into segments isolated by a row pattern of dummy cells. The dummy cell structure provides a continuous cell array at the lower cell patterning levels. The SRAM array includes a first and second array block each including an SRAM cell having a first layout configuration, one or more of the dummy cells having a second layout configuration arranged along the row pattern associated with a wordline of the SRAM array, a first power supply voltage line connected to the first array block, and a second different power supply voltage line connected to the second array block. The first and second power supply voltage lines of the array blocks are further connected to the one or more dummy cells.
Abstract:
Digital circuitry (11) in a data processing system (10) includes parallel signature analysis circuitry (49, 49A) having a sampling feature (51, 53, 89) which permits sampling any given signal on all clock phases of the digital circuitry.