Method and apparatus for measuring displacement
    5.
    发明申请
    Method and apparatus for measuring displacement 审中-公开
    测量位移的方法和装置

    公开(公告)号:US20050259274A1

    公开(公告)日:2005-11-24

    申请号:US10852040

    申请日:2004-05-24

    IPC分类号: G01B11/14 G01D5/14

    CPC分类号: G01D5/145

    摘要: In a method and apparatus for measuring displacement, an optical modulator includes a magneto-optical recording layer recorded with a plurality of light-reflecting graduation regions. The light-reflecting graduation regions include alternately disposed first and second graduations. The first graduations have a first magnetization direction. The second graduations have a second magnetization direction different from the first magnetization direction. A light source is operable so as to generate a light beam that is incident on the magneto-optical recording layer. The optical modulator is movable relative to the light source such that the light beam is reflected in sequence by consecutive ones of the light-reflecting graduation regions recorded on the magneto-optical recording layer. An analyzing module analyzes changes in polarization characteristics of the light beam reflected from the magneto-optical recording layer to determine extent of displacement of the optical modulator relative to the light source.

    摘要翻译: 在用于测量位移的方法和装置中,光调制器包括记录有多个光反射刻度区域的磁光记录层。 光反射刻度区域包括交替设置的第一刻度和第二刻度。 第一刻度具有第一磁化方向。 第二刻度具有与第一磁化方向不同的第二磁化方向。 光源可操作以产生入射在磁光记录层上的光束。 光调制器相对于光源是可移动的,使得光束被记录在磁光记录层上的连续的一个光反射刻度区反射。 分析模块分析从磁光记录层反射的光束的偏振特性的变化,以确定光调制器相对于光源的位移程度。