Nanotip repair and characterization using field ion microscopy
    1.
    发明授权
    Nanotip repair and characterization using field ion microscopy 有权
    纳米技术使用场离子显微镜修复和表征

    公开(公告)号:US07921465B2

    公开(公告)日:2011-04-05

    申请号:US12191855

    申请日:2008-08-14

    IPC分类号: G01Q40/00

    摘要: A system (100) for characterizing surfaces can include a nanotip microscope (104) in a first pressure envelope (102) at a first pressure with an electrically conductive nanotip (110) mounted thereon for characterizing a sample surface. The system can also include an ion imaging system (122, 124, 128) within a second pressure envelope (120) at a second pressure. The second pressure can less than or equal to the first pressure and the pressure envelopes (102, 120) can be separated by a pressure limiting aperture (PLA) (132). The system can further include gas sources (116, 118) for introducing into the first pressure envelope (102) at least one gas, and a voltage supply (114) coupled to the nanotip (110) for generating an electric field between the nanotip (114) and the PLA (132). In the system, the electric field repels and ionizes molecules or atoms of the gas in proximity to the nanotip (110) and the ion imaging system (122, 124, 128) collects at least a portion the repelled and ionized molecules or atoms traversing the PLA (132) to image the nanotip (110).

    摘要翻译: 用于表征表面的系统(100)可以包括在第一压力下的第一压力外壳(102)中的纳米管显微镜(104),其上安装有用于表征样品表面的导电纳米尖端(110)。 该系统还可以包括在第二压力下的第二压力封套(120)内的离子成像系统(122,124,128)。 第二压力可以小于或等于第一压力,并且压力包络(102,120)可以通过压力限制孔(PLA)(132)分离。 该系统还可以包括用于将至少一种气体引入第一压力外壳(102)的气体源(116,118),以及耦合到所述纳米尖端(110)的电压源(114),用于在所述纳米尖端 114)和解放军(132)。 在系统中,电场排斥并离子化离子纳米尖端(110)附近的气体的分子或原子,并且离子成像系统(122,124,128)收集至少一部分被排斥和离子化的分子或原子穿过 PLA(132)以对纳米尖端(110)成像。

    NANOTIP REPAIR AND CHARACTERIZATION USING FIELD ION MICROSCOPY
    2.
    发明申请
    NANOTIP REPAIR AND CHARACTERIZATION USING FIELD ION MICROSCOPY 有权
    使用场离子显微镜的纳米技术维修和表征

    公开(公告)号:US20100038536A1

    公开(公告)日:2010-02-18

    申请号:US12191855

    申请日:2008-08-14

    IPC分类号: G01N23/04

    摘要: A system (100) for characterizing surfaces can include a nanotip microscope (104) in a first pressure envelope (102) at a first pressure with an electrically conductive nanotip (110) mounted thereon for characterizing a sample surface. The system can also include an ion imaging system (122, 124, 128) within a second pressure envelope (120) at a second pressure. The second pressure can less than or equal to the first pressure and the pressure envelopes (102, 120) can be separated by a pressure limiting aperture (PLA) (132). The system can further include gas sources (116, 118) for introducing into the first pressure envelope (102) at least one gas, and a voltage supply (114) coupled to the nanotip (110) for generating an electric field between the nanotip (114) and the PLA (132). In the system, the electric field repels and ionizes molecules or atoms of the gas in proximity to the nanotip (110) and the ion imaging system (122, 124, 128) collects at least a portion the repelled and ionized molecules or atoms traversing the PLA (132) to image the nanotip (110).

    摘要翻译: 用于表征表面的系统(100)可以包括在第一压力下的第一压力外壳(102)中的纳米管显微镜(104),其上安装有用于表征样品表面的导电纳米尖端(110)。 该系统还可以包括在第二压力下的第二压力封套(120)内的离子成像系统(122,124,128)。 第二压力可以小于或等于第一压力,并且压力包络(102,120)可以通过压力限制孔(PLA)(132)分离。 该系统还可以包括用于将至少一种气体引入第一压力外壳(102)的气体源(116,118),以及耦合到所述纳米尖端(110)的电压源(114),用于在所述纳米尖端 114)和解放军(132)。 在系统中,电场排斥并离子化离子纳米尖端(110)附近的气体的分子或原子,并且离子成像系统(122,124,128)收集至少一部分被排斥的和离子化的分子或原子穿过 PLA(132)以对纳米尖端(110)成像。