公开(公告)号：US12198915B2

公开(公告)日：2025-01-14

申请号：US17610919

申请日：2020-05-16

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Toby Shanley ,  Wayne Sheils

IPC: H01J43/10 ,  C23C16/02 ,  C23C16/26 ,  C23C16/511 ,  C23C16/56 ,  C30B25/02 ,  C30B29/04 ,  C30B31/06 ,  H01J9/12

Abstract: A device configured to convert or amplify a particle, the conversion or amplification being reliant on the impact of a particle on a surface of the device causing emission of one or more secondary electrons from the same surface. The device includes a carbon-based layer capable of secondary electron emission upon impact of a particle. The surface may be used to convert, for example, an ion into an electron signal, or an electron signal into an amplified electron signal, such as in conversion or amplification dynodes.

公开(公告)号：US10991497B2

公开(公告)日：2021-04-27

申请号：US16075269

申请日：2017-02-02

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Richard Stresau ,  Kevin Hunter ,  Yair Benari ,  Russell Jurek ,  Toby Shanley

IPC: H01F7/02 ,  H01J43/04

Abstract: An apparatus for providing a magnetic field includes a magnet having a surface, and a structure disposed above the magnet surface. The structure includes a material of high magnetic permeability. The apparatus provides an interface between the material of high magnetic permeability and a material of low magnetic permeability. The apparatus may have two poles in magnetic communication with the magnet, the poles extending above the surface of the magnet, and the structure is disposed between the poles. The structure may have alternating regions of high magnetic permeability and low magnetic permeability. The apparatus alters the magnetic field of the magnet to reduce or remove a disorder in the magnetic field, and/or decrease the magnitude of the magnetic field, and/or induce a distortion in the magnetic field, and/or align or re-align the magnetic field, and/or orientate or re-orientate the magnetic field, and/or alter distribution or shape of the magnetic field.

公开(公告)号：US20210175043A1

公开(公告)日：2021-06-10

申请号：US16754802

申请日：2018-08-29

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Wayne Sheils ,  Toby Shanley

IPC: H01J9/00 ,  H01J43/10 ,  B08B7/00

Abstract: Components of scientific analytical equipment, and particularly to methods for extending the operational lifetime or otherwise improving the performance of dynodes used in electron multipliers. The method includes: (i) increasing the secondary electron yield of a dynode and/or (ii) decreasing the rate of degradation of electron yield of a dynode, by exposing a dynode electron-emissive surface to an electron flux under conditions causing electron-impact induced removal of a contaminant deposited on the dynode electron-emissive surface. The conditions may be selected such that the electron-mediated removal is enhanced relative to a contaminant deposition process so as to provide a net decrease in the rate of contaminant deposition and/or a decrease in the amount of contaminant present on the dynode electron-emissive surface.

公开(公告)号：US20230215712A1

公开(公告)日：2023-07-06

申请号：US18001155

申请日：2021-06-07

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  Toby Shanley

IPC: H01J43/14 ,  H01J43/02 ,  H01J49/02

CPC classification number: H01J43/14 ,  H01J43/02 ,  H01J49/025 ,  H01J49/40

Abstract: Scientific analytical equipment including apparatus and methods for detecting and quantitating particles, and particularly ions generated in the course of mass spectroscopy. In one version, a particle detection apparatus includes electron emissive surfaces which emit secondary electrons in response to impact with a particle, the apparatus maintaining spatial separation between: (i) secondary electrons emitted as a result of the impact of a first particle in a first region of the electron emissive surface; and (ii) secondary electrons emitted as a result of the impact of a second particle in a second region of the electron emissive surface.