公开(公告)号：US20040019449A1

公开(公告)日：2004-01-29

申请号：US10201512

申请日：2002-07-23

申请人： ADC DSL Systems, Inc.

发明人： Juan A. Espinoza ,  L. Grant Giddens ,  Clark Tollerson

IPC分类号： G06F019/00

CPC分类号： G01R23/005

摘要： Testing an oscillator and other electronic devices on a circuit board. One method of the present invention comprises powering the oscillator. Providing test instructions to a microprocessor on the circuit board to place the microprocessor in a test mode. Receiving a clock signal from the oscillator at a multiplexer in a field programmable gate array. Receiving operating instructions at the multiplexer from the microprocessor. Multiplexing the clock signal to an external access port with the multiplexer in response to the operating instructions and measuring the frequency of the clock signal at the external access port.

摘要翻译： 在电路板上测试振荡器和其他电子设备。 本发明的一种方法包括给振荡器供电。 向电路板上的微处理器提供测试指令，以将微处理器置于测试模式。 在现场可编程门阵列中的多路复用器处从振荡器接收时钟信号。 从微处理器接收多路复用器的操作指令。 响应于操作指令并且测量外部接入端口处的时钟信号的频率，将时钟信号复用到多路复用器的外部访问端口。

公开(公告)号：US20030227400A1

公开(公告)日：2003-12-11

申请号：US10166156

申请日：2002-06-10

申请人： ADC DSL Systems, Inc.

发明人： L. Grant Giddens ,  Juan A. Espinoza

IPC分类号： H03M001/10

CPC分类号： H03M1/109 ,  H03M1/12 ,  H03M1/66

摘要： Testing of analog-to-digital and digital-to-analog converters formed in integrated circuits. In one embodiment, a method of testing an analog-to-digital (A/D) converter comprises applying an analog test signal of a first frequency to an input of the A/D converter. Sampling digital byte samples from an output of the A/D converter at a second sampling frequency and comparing select digital byte samples with each other. When the select digital byte samples match, storing a verify bit in a memory to verify the A/D converter is working. In another embodiment, a method of testing a digital-to-analog (D/A) comprises creating repeating digital byte samples with a logic circuit formed in the integrated circuit. Converting the repeating digital byte samples into an analog test signal with the D/A converter. Comparing the frequency of the analog test signal with the frequency of an expected analog signal to determine if the D/A converter is working.

摘要翻译： 在集成电路中形成的模拟数字和数模转换器的测试。 在一个实施例中，测试模数（A / D）转换器的方法包括将第一频率的模拟测试信号应用于A / D转换器的输入端。 以第二采样频率从A / D转换器的输出采样数字字节采样，并将选择的数字字节采样进行比较。 当选择数字字节样本匹配时，将验证位存储在存储器中以验证A / D转换器是否正常工作。 在另一个实施例中，测试数模（D / A）的方法包括用在集成电路中形成的逻辑电路产生重复的数字字节样本。 使用D / A转换器将重复数字字节样本转换为模拟测试信号。 将模拟测试信号的频率与预期模拟信号的频率进行比较，以确定D / A转换器是否工作。