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公开(公告)号:US10719019B2
公开(公告)日:2020-07-21
申请号:US16315125
申请日:2017-07-06
Applicant: ASML Netherlands B.V. , ASML Holding N.V.
Inventor: Thomas Poiesz , Satish Achanta , Mehmet Ali Akbas , Pavlo Antonov , Jeroen Bouwknegt , Joost Wilhelmus Maria Frenken , Evelyn Wallis Pacitti , Nicolaas Ten Kate , Bruce Tirri , Jan Verhoeven
IPC: G03F7/20 , H01L21/687
Abstract: There is disclosed a substrate holder, a method of manufacturing a substrate holder, a lithographic apparatus comprising the substrate holder, and a method of manufacturing devices using the lithographic apparatus. In one arrangement, there is provided a substrate holder for use in a lithographic apparatus. The substrate holder supports a substrate. The substrate holder comprises a main body. The main body has a main body surface. A plurality of burls are provided projecting from the main body surface. Each burl has a burl side surface and a distal end surface. The distal end surface of each burl engages with the substrate. The distal end surfaces of the burls substantially conform to a support plane and support the substrate. A layer of carbon based material is provided in a plurality of separated regions of carbon based material. The layer of carbon based material provides a surface with a lower coefficient of friction than a part of the main body surface outside the plurality of separated regions of carbon based material. The layer of carbon based material covers only part of the distal end surface of at least one of the burls. Alternatively, the layer of carbon based material covers the distal end surface and at least a portion of the burl side surface of at least one of the burls.
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公开(公告)号:US11448976B2
公开(公告)日:2022-09-20
申请号:US16770464
申请日:2018-11-22
Applicant: ASML NETHERLANDS B.V. , ASML HOLDING N.V.
Inventor: Thomas Poiesz , Coen Hubertus Matheus Baltis , Abraham Alexander Soethoudt , Mehmet Ali Akbas , Dennis Van Den Berg , Wouter Vanesch , Marcel Maria Cornelius Franciscus Teunissen
IPC: G03F7/20 , H01L21/687
Abstract: A substrate holder, for a lithographic apparatus, having a main body, a plurality of support elements to support a substrate and a seal unit. The seal unit may include a first seal positioned outward of and surrounding the plurality of support elements. A position of a substrate contact region of an upper surface of the first seal may be arranged at a distance from the plurality of support elements sufficient enough such that during the loading/unloading of the substrate, a force applied to the first seal by the substrate is greater than a force applied to the plurality of support elements by the substrate. A profile of the contact region, in a cross section through the seal, may have a shape which is configured such that during the loading/unloading of the substrate, the substrate contacts the seal via at least two different points of the profile.
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公开(公告)号:US10656536B2
公开(公告)日:2020-05-19
申请号:US15308598
申请日:2015-04-23
Applicant: ASML Netherlands B.V. , ASML Holding N.V.
Inventor: Martinus Hendrikus Antonius Leenders , Niek Elout De Kruijf , Mircea Dusa , Martijn Houben , Johannes Gerardus Maria Mulder , Thomas Poiesz , Marco Adrianus Peter Van Den Heuvel , Paul Van Dongen , Justin Johannes Hermanus Gerritzen , Antonie Hendrik Verweij , Abraham Alexander Soethoudt
IPC: B25B11/00 , G03F7/20 , H01L21/683
Abstract: A substrate support, includes: a substrate support location configured to support a substrate, and a vacuum clamping device configured to clamp the substrate on the substrate support location, wherein the vacuum clamping device includes at least one reduced pressure source to create a reduced pressure, at least one vacuum section connected to the at least one reduced pressure source, wherein the at least one vacuum section is configured to attract the substrate towards the substrate support location, and a control device configured to control a spatial pressure profile along the at least one vacuum section with which the substrate is attracted by the vacuum clamping device, wherein the control device includes a substrate shape data input to receive substrate shape data representing shape data of the substrate to be clamped, and wherein the control device is configured to adapt the spatial pressure profile in dependency of the substrate shape data.
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4.
公开(公告)号:US12158704B2
公开(公告)日:2024-12-03
申请号:US17533947
申请日:2021-11-23
Applicant: ASML NETHERLANDS B.V.
Inventor: Abraham Alexander Soethoudt , Thomas Poiesz
IPC: G03F7/00 , H01L21/683
Abstract: A method including: generating a first force to attract a substrate holder to a support surface, the holder including a body having opposing first and second body surfaces, first burls at the first body surface, wherein each first burl has a distal end to support a substrate, and second burls at the second body surface to support the substrate holder on the support surface through contact with distal ends of the second burls; generating a second force to attract the substrate to the substrate holder; and controlling the first force and/or second force in a release step to deform the body between the second burls such as to create a gap between the distal ends of a first subset of the plurality of first burls and the substrate and such that the substrate is supported on distal ends of a second subset of the plurality of first burls.
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公开(公告)号:US10514615B2
公开(公告)日:2019-12-24
申请号:US15580806
申请日:2016-06-21
Applicant: ASML NETHERLANDS B.V.
Inventor: Andre Bernardus Jeunink , Robbert De Jong , Martinus Hendrikus Antonius Leenders , Evelyn Wallis Pacitti , Thomas Poiesz , Frank Pieter Albert Van Den Berkmortel
Abstract: A support apparatus configured to support an object, the support apparatus includes a support body including an object holder to hold an object; an opening in the support body adjacent to an edge of the object holder; a channel in fluid communication with the opening via each of a plurality of passageways in the support body; and a passageway liner mounted in at least one of the plurality of passageways, the passageway liner being thermally insulating to substantially thermally decouple the support body from fluid in the at least one of the plurality of passageways.
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公开(公告)号:US11269259B2
公开(公告)日:2022-03-08
申请号:US16952371
申请日:2020-11-19
Applicant: ASML NETHERLANDS B.V.
Inventor: Thomas Poiesz , Bert Dirk Scholten , Dirk Willem Harberts , Lucas Henricus Johannes Stevens , Laura Maria Fernandez Diaz , Johannes Adrianus Cornelis Maria Pijnenburg , Abraham Alexander Soethoudt , Wilhelmus Jacobus Johannes Welters , Jimmy Matheus Wilhelmus Van De Winkel
IPC: G03F7/20
Abstract: A substrate table for an immersion system having a projection system arranged to project an image onto a substrate and a liquid confinement system configured to confine an immersion liquid to a space between the projection system and the substrate, the substrate table including: a substrate holder configured to hold a substrate; and a current control device arranged to reduce an electric current flowing between the substrate and the substrate holder while the immersion liquid is confined to the space.
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公开(公告)号:US10453734B2
公开(公告)日:2019-10-22
申请号:US15580601
申请日:2016-06-01
Applicant: ASML Netherlands B.V.
Inventor: Thomas Poiesz , Martijn Houben , Abraham Alexander Soethoudt
IPC: G03B27/52 , H01L21/687 , G03F7/20 , B23H7/26 , H01L21/027 , H01L21/683
Abstract: A substrate holder for use in a lithographic apparatus and configured to support a substrate, the substrate holder including: a main body having a main body surface; and a plurality of burls projecting from the main body surface; wherein each burl has a distal end configured to engage with the substrate; the distal ends of the burls substantially conform to a support plane whereby a substrate can be supported in a substantially flat state on the burls; a frictional force between the distal end of each burl and a substrate engaged therewith arises in a direction parallel to the support plane in the event of a relative movement of the substrate and substrate holder in the direction; and distal end surfaces of the burls are provided with a release structure configured so that the frictional force is less than would arise in the absence of the release structure.
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公开(公告)号:US10310393B2
公开(公告)日:2019-06-04
申请号:US15737399
申请日:2016-04-28
Applicant: ASML Netherlands B.V.
Inventor: Thomas Poiesz
IPC: G03F7/20
Abstract: The present invention relates to a substrate support (1), comprising: a support body (2) forming a support surface configured to support a substrate, wherein said support surface comprises a support surface part configured to support a substrate area of the substrate, at least one actuator (6) arranged on the support body at a location aligned with the support surface part and configured to contract or extend in a direction substantially parallel to a main plane of the support surface.
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公开(公告)号:US20240385536A1
公开(公告)日:2024-11-21
申请号:US18696657
申请日:2022-10-14
Applicant: ASML Netherlands B.V.
Inventor: Thomas Poiesz , René Adrianus Van Rooij , Alexander Stein
IPC: G03F7/00 , G03F7/16 , H01L21/683
Abstract: The disclosure provides a clamp comprising a dielectric member; a conductive element disposed on the dielectric member and comprised of a first conductive material; and a number of burls arranged on the conductive element for supporting the object, each burl comprising a second conductive material, wherein the clamp comprises a stack of alternating layers of etch resistant material and a third conductive material arranged between the conductive element and the number of burls.
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公开(公告)号:US10353303B2
公开(公告)日:2019-07-16
申请号:US15569135
申请日:2016-05-23
Applicant: ASML NETHERLANDS B.V.
Inventor: Abraham Alexander Soethoudt , Thomas Poiesz
IPC: G03B27/58 , G03F7/20 , B01D53/34 , B01D53/56 , B01D53/79 , B05B13/02 , B05B13/04 , F23J15/00 , B05B15/656 , B05B15/68 , B05B13/06
Abstract: A lithographic apparatus includes a support table and a gas extraction system. The gas extraction system is configured to extract gas from a gap between a base surface of the support table and a substrate through at least one gas extraction opening when the substrate is being lowered onto the support table. The lithographic apparatus is configured such that gas is extracted from the gap at a first loading flow rate when the distance between the substrate and the support plane is greater than a threshold distance and gas is extracted from the gap at a second loading flow rate when the distance between the substrate and the support plane is less than the threshold distance, wherein the second loading flow rate is lower than the first loading flow rate.
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