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公开(公告)号：US11960854B2
公开(公告)日：2024-04-16
申请号：US17028723
申请日：2020-09-22
Applicant: Advanced Micro Devices, Inc.
Inventor： Ravinder Reddy Rachala , Stephen Victor Kosonocky , Miguel Rodriguez
CPC classification number: G06F7/5443 , H03K21/08 , H03K19/20
Abstract: A multiply-accumulate computation is performed using digital logic circuits. To perform the computation, a plurality of target signals are received at a respective plurality of ripple counters. The counter outputs of the respective ripple counters are scaled by setting stop count values. Counter outputs of the respective ripple counters are adjusted with respective constant values by setting counter reset values at the respective ripple counters. Each count pulses of the target signals for an adjusted period. The count values of the ripple counters are summed. The results may be used to calculate an average value for an adaptive voltage and frequency scaling process.
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公开(公告)号：US11264998B1
公开(公告)日：2022-03-01
申请号：US17031763
申请日：2020-09-24
Applicant: Advanced Micro Devices, Inc.
Inventor： Ravinder Reddy Rachala
Abstract: A system and method for measuring power supply variations are described. A functional unit includes one or more power supply monitors capable of measuring power supply variations. The power supply monitors forego use of a clock signal from clock generating circuitry and forego use of a reference voltage from a reference power supply. The power supply monitors use an output of a source ring oscillator as a clock signal for the sequential elements of a counter. The counter measures a number of revolutions of a measuring ring oscillator within a period of the output of the source oscillator. The revolutions of the measuring ring oscillator are associated with a number of rising edges and falling edges of the output signal of the measuring ring oscillator. An encoder converts the output of the sequential elements to a binary value, and sends the binary value to an external age tracking unit.
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公开(公告)号：US20220091822A1
公开(公告)日：2022-03-24
申请号：US17028723
申请日：2020-09-22
Applicant: Advanced Micro Devices, Inc.
Inventor： Ravinder Reddy Rachala , Stephen Victor Kosonocky , Miguel Rodriguez
Abstract: A multiply-accumulate computation is performed using digital logic circuits. To perform the computation, a plurality of target signals are received at a respective plurality of ripple counters. The counter outputs of the respective ripple counters are scaled by setting stop count values. Counter outputs of the respective ripple counters are adjusted with respective constant values by setting counter reset values at the respective ripple counters. Each count pulses of the target signals for an adjusted period. The count values of the ripple counters are summed. The results may be used to calculate an average value for an adaptive voltage and frequency scaling process.
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公开(公告)号：US20190257696A1
公开(公告)日：2019-08-22
申请号：US15902101
申请日：2018-02-22
Applicant: Advanced Micro Devices, Inc.
Inventor： Ravinder Reddy Rachala , Stephen Victor Kosonocky , Stephen C. Ennis
Abstract: A calibrated temperature sensor includes a power on oscillator responsive to a calibration enable signal for providing a power on clock signal, a temperature dependent oscillator responsive to said calibration enable signal for providing a temperature dependent clock signal, and a measurement logic circuit. The measurement logic circuit counts a first number of pulses of the temperature dependent clock signal during a first calibration period using the power on clock signal, a second number of pulses of the temperature dependent clock signal during a second calibration period using a system clock signal, and a third number of pulses of the power on clock signal over a third calibration period using the system clock signal, and a fourth number of pulses of the temperature dependent clock signal using the system clock signal during a normal operation mode, wherein the first calibration period precedes both the second and third calibration periods.
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公开(公告)号：US20220094365A1
公开(公告)日：2022-03-24
申请号：US17031763
申请日：2020-09-24
Applicant: Advanced Micro Devices, Inc.
Inventor： Ravinder Reddy Rachala
Abstract: A system and method for measuring power supply variations are described. A functional unit includes one or more power supply monitors capable of measuring power supply variations. The power supply monitors forego use of a clock signal from clock generating circuitry and forego use of a reference voltage from a reference power supply. The power supply monitors use an output of a source ring oscillator as a clock signal for the sequential elements of a counter. The counter measures a number of revolutions of a measuring ring oscillator within a period of the output of the source oscillator. The revolutions of the measuring ring oscillator are associated with a number of rising edges and falling edges of the output signal of the measuring ring oscillator. An encoder converts the output of the sequential elements to a binary value, and sends the binary value to an external age tracking unit.
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Patent Agency Ranking
公开(公告)号：US09946278B2
公开(公告)日：2018-04-17
申请号：US14720385
申请日：2015-05-22
Applicant: Advanced Micro Devices, Inc.
Inventor： Miguel Rodriguez , Stephen Victor Kosonocky , Ravinder Reddy Rachala
Abstract: A processor system includes first and second regulators for regulating an adjusted supply voltage. In one embodiment, the regulator system comprises a digital low-dropout (DLDO) control system comprising first and second regulators that generate a plurality of control signals to regulate an adjusted power supply voltage and that generate a charge when a droop level falls below a droop threshold value. The first regulator implements a first control loop and the second regulator implements a second and much faster acting control loop. A supply adjustment block with the two regulators and control loops are provided for each processor core allowing different cores to have different regulated supply levels all based on one common supply.
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公开(公告)号：US20230129642A1
公开(公告)日：2023-04-27
申请号：US17507597
申请日：2021-10-21
Applicant: Advanced Micro Devices, Inc.
Abstract: A system and method for efficiently measuring on-die power supply voltage are described. In various implementations, an integrated circuit includes power supply monitors across a die of the integrated circuit. A power supply monitor receives a power supply voltage and generates a code indicating a value of the power supply voltage. A first ring oscillator receives the power supply voltage and a pulse used as an enable signal. A pulse generator of the power supply monitor takes into account the process, voltage and temperature (PVT) characteristics of the integrated circuit by including at least a second ring oscillator and a modulus counter that receives an output of the second ring oscillator. Therefore, the pulse generated by the pulse generator is PVT dependent and increases gain of the power supply monitor.
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公开(公告)号：US11237220B2
公开(公告)日：2022-02-01
申请号：US16054576
申请日：2018-08-03
Applicant: Advanced Micro Devices, Inc.
Inventor： Ravinder Reddy Rachala , Stephen Victor Kosonocky , Miguel Rodriguez
IPC: G01R31/40 , G11C27/02 , H03K17/687 , G06F1/3206 , H03K3/356 , G06F1/3296 , H03K3/03
Abstract: In one form, a power supply monitor including a current controlled oscillator circuit, a time-to-digital converter, and an output divider. The current controlled oscillator circuit has an input for receiving a power supply voltage to be measured, and an output for providing a frequency signal having a frequency linearly proportional to the power supply voltage. The time-to-digital converter has an input coupled to the output of the current controlled oscillator circuit, and an output for providing a count signal representative of a number of cycles of a reference clock signal per cycle of the frequency signal. The output divider has an input coupled to the output of the time-to-digital converter, and an output for providing a divided count signal representative of a value of the power supply voltage, and provides the divided count signal by dividing a fixed number by the count signal.
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公开(公告)号：US20200041577A1
公开(公告)日：2020-02-06
申请号：US16054576
申请日：2018-08-03
Applicant: Advanced Micro Devices, Inc.
Inventor： Ravinder Reddy Rachala , Stephen Victor Kosonocky , Miguel Rodriguez
Abstract: In one form, a power supply monitor including a current controlled oscillator circuit, a time-to-digital converter, and an output divider. The current controlled oscillator circuit has an input for receiving a power supply voltage to be measured, and an output for providing a frequency signal having a frequency linearly proportional to the power supply voltage. The time-to-digital converter has an input coupled to the output of the current controlled oscillator circuit, and an output for providing a count signal representative of a number of cycles of a reference clock signal per cycle of the frequency signal. The output divider has an input coupled to the output of the time-to-digital converter, and an output for providing a divided count signal representative of a value of the power supply voltage, and provides the divided count signal by dividing a fixed number by the count signal.
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公开(公告)号：US10547273B2
公开(公告)日：2020-01-28
申请号：US15796048
申请日：2017-10-27
Applicant: Advanced Micro Devices, Inc.
Inventor： Ravinder Reddy Rachala , Stephen V. Kosonocky
Abstract: A temperature sensor has a first transistor with a gate voltage tied to maintain the first transistor in an off state with leakage current flowing through the transistor, the leakage current varying with temperature. A second transistor is coupled to the first transistor and receives a gate voltage to keep the second transistor in an on state. A current mirror mirrors the leakage current and supplies a mirrored current used to control a frequency of an oscillator signal varies with the mirrored current. The temperature of the first transistor is determined based the frequency of the oscillator signal.
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