摘要:
Example embodiments may provide a method of testing semiconductor devices by identifying units of lots and a test tray such that a plurality of lots having semiconductor devices may be continuously tested by a handler. Example embodiments may also provide a handler used to test the semiconductor devices.
摘要:
Example embodiments may provide a method of testing semiconductor devices by identifying units of lots and a test tray such that a plurality of lots having semiconductor devices may be continuously tested by a handler. Example embodiments may also provide a handler used to test the semiconductor devices.
摘要:
A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.
摘要:
A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.
摘要:
A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.
摘要:
A method and apparatus for providing a traffic information service using a mobile communication terminal are provided. A method of a mobile communication terminal for a traffic information service is provided. The method includes constructing a cluster with at least one neighboring Mobile Station (MS), receiving traffic information from the at least one neighboring MS comprised in the cluster, measuring traffic information using location information of the MS, and transmitting a traffic information message comprising the collected traffic information to a traffic information provision server.
摘要:
A method and apparatus for providing a traffic information service using a mobile communication terminal are provided. A method of a mobile communication terminal for a traffic information service is provided. The method includes constructing a cluster with at least one neighboring Mobile Station (MS), receiving traffic information from the at least one neighboring MS comprised in the cluster, measuring traffic information using location information of the MS, and transmitting a traffic information message comprising the collected traffic information to a traffic information provision server.