公开(公告)号：US08917540B2

公开(公告)日：2014-12-23

申请号：US13660337

申请日：2012-10-25

Applicant: Agency for Science, Technology and Research

Inventor： Kui Cai ,  Zhiliang Qin

IPC: G11C11/00 ,  G11C11/16

CPC classification number: G11C11/161 ,  G11C7/1006 ,  G11C11/1653 ,  G11C11/1673

Abstract: According to embodiments of the present invention, a memory device with soft decision decoding is provided. The memory device includes a memory cell configured to store an input data bit; a memory sensor configured to read out a parameter associated with a state of the memory cell; a detector configured to determine, based on the parameter read out from the memory cell, a soft information indicating the likelihood that the input data bit stored in the memory cell is a “0” or the likelihood that the input data bit stored in the memory cell is a “1”; and a decoder configured to generate a decoded bit based on the soft information. Further embodiments relate to a method of performing soft-decision decoding on a data bit stored in a memory cell of a memory device.

Abstract translation: 根据本发明的实施例，提供了具有软判决解码的存储器件。 存储器件包括：存储器单元，被配置为存储输入数据位; 存储器传感器，被配置为读出与所述存储单元的状态相关联的参数; 检测器，被配置为基于从存储器单元读出的参数来确定指示存储在存储单元中的输入数据位为“0”的可能性的软信息或存储在存储器中的输入数据位的可能性 细胞是“1”; 以及解码器，被配置为基于所述软信息生成解码比特。 另外的实施例涉及对存储在存储器件的存储单元中的数据位进行软判决解码的方法。

公开(公告)号：US09454428B2

公开(公告)日：2016-09-27

申请号：US14554577

申请日：2014-11-26

Applicant: Agency for Science, Technology and Research

Inventor： Kui Cai ,  Zhiliang Qin ,  Xueqiang Wang

IPC: H03M13/00 ,  G06F11/10 ,  H03M13/45 ,  G11C11/16 ,  H03M13/15

CPC classification number: G06F11/1012 ,  G11C11/16 ,  G11C11/161 ,  H03M13/152 ,  H03M13/451 ,  H03M13/458

Abstract: There is provided an error correction method for a non-volatile memory. The method includes receiving a codeword read from the non-volatile memory, computing a reliability information for each bit of the codeword received, and performing a reduced-complexity soft-decision decoding (SDD) technique to decode the received codeword. In particular, the SDD technique includes forming a set of test patterns based on the reliability data, and determining whether to perform a HDD of a test pattern in the set of test patterns based on a distance between the test pattern and a candidate pattern. There is also provided an error correction module for a non-volatile memory and a memory system incorporating the error correction module.

Abstract translation: 提供了用于非易失性存储器的纠错方法。 该方法包括接收从非易失性存储器读取的码字，计算接收到的码字的每个比特的可靠性信息，并执行降低复杂度的软判决解码（SDD）技术来解码所接收的码字。 特别地，SDD技术包括基于可靠性数据形成一组测试图案，并且基于测试图案和候选图案之间的距离来确定是否在该组测试图案中执行测试图案的HDD。 还提供了用于非易失性存储器的错误校正模块和包含纠错模块的存储器系统。