公开(公告)号：US10656206B1

公开(公告)日：2020-05-19

申请号：US15595312

申请日：2017-05-15

Applicant: Amazon Technologies, Inc.

Inventor： Prashanth Basavaraj Patil ,  San-Ching De La Cruz

IPC: G06Q10/08 ,  G01R31/319 ,  G01R31/01 ,  G01R31/28

Abstract: A multi-function test machine includes a table assembly, a robotic arm, one or more stimulators, one or more sensors, and a computing device for testing electronic devices. The multi-function tester may also include a camera test assembly and a universal device holder. The multi-function tester is capable of testing multiple systems of an electronic device concurrently, thus obviating the need for multiple test stations and operators.

公开(公告)号：US10113903B1

公开(公告)日：2018-10-30

申请号：US14474637

申请日：2014-09-02

Applicant: Amazon Technologies, Inc.

Inventor： Prashanth Basavaraj Patil ,  Jian Song

IPC: G01N21/17 ,  G01J1/02

Abstract: An ambient light sensor of an electronic device is calibrated using a calibration device and method which combines multiple sources of light having different wavelengths into a single calibration beam of light. This calibration beam of light provides a consistent and reproducible methodology for testing and calibrating the ambient light sensor.

公开(公告)号：US09250154B1

公开(公告)日：2016-02-02

申请号：US14315621

申请日：2014-06-26

Applicant: Amazon Technologies, Inc.

Inventor： Prashanth Basavaraj Patil ,  Scott Michael Dylewski ,  Yan Karasik

IPC: G01J1/00 ,  G01M11/00 ,  G01N21/95 ,  G01J1/42 ,  G01M3/38

CPC classification number: G01N21/95 ,  G01J1/0271 ,  G01J1/4228 ,  G01J2001/4247 ,  G01N21/27 ,  G01N21/88 ,  G01N2201/125

Abstract: According to one or more embodiments of the disclosure, a testing apparatus is provided. The testing apparatus may include a base portion configured to receive a device under test (DUT). The base portion may also include an array of light sensors to measure light leakage from the DUT. For example, the testing apparatus may receive, from the array of light sensors, one or more light intensity measurements associated with light leakage from between a bezel element and a display element along a first edge portion of the DUT. The testing apparatus may then transmit the measurements to a testing computer.

Abstract translation: 根据本公开的一个或多个实施例，提供了一种测试装置。 测试设备可以包括配置成接收被测设备（DUT）的基本部分。 基部部分还可以包括光传感器阵列以测量来自DUT的光泄漏。 例如，测试装置可以从光传感器阵列接收与DUT的第一边缘部分之间的从边框元件和显示元件之间的光泄漏相关联的一个或多个光强度测量。 测试设备然后可以将测量结果发送到测试计算机。