摘要:
A device and method for controlling the temperature of a plasma chamber inside wall or other surfaces exposed to the plasma by a plurality of temperature control systems. A plasma process within the plasma chamber can be controlled by independently controlling the temperature of segments of the wall or other surfaces.
摘要:
A device and method for controlling the temperature of a plasma chamber inside wall or other surfaces exposed to the plasma by a plurality of temperature control systems. A plasma process within the plasma chamber can be controlled by independently controlling the temperature of segments of the wall or other surfaces.
摘要:
A device and method for controlling the temperature of a plasma chamber inside wall or other surfaces exposed to the plasma by a plurality of temperature control systems. A plasma process within the plasma chamber can be controlled by independently controlling the temperature of segments of the wall or other surfaces.
摘要:
An apparatus determines how well a semiconductor wafer (4) is clamped to a support member (1). The apparatus has at least one ultrasonic transducer (2a,2b,2c,2d) configured to emit ultrasonic energy (3) toward an interface between the water (4) and the support member (1) so that the interface generates echo signals, and a data processing unit (11) configured to analyze the echo signals to arrive at a determination as to how well the semiconductor wafer (4) is clamped to the support member (1before semiconductor process is started. A first method ensures that a wafer (4) is securely clamped to a support member before a semiconductor process is started. A second method verifies proper de-clamping of a semiconductor wafer (4) from a support member (1) before the semiconductor wafer (4) is removed from the support member (1) upon completion of a semiconductor process.
摘要:
Ultrasonic transducers and tomographic techniques determine the temperature of a semiconductor substrate holder at all points on the substrate holder, thereby allowing comprehensive real-time control of the temperature of the substrate holder during a process, such as a semiconductor wafer etching process. An apparatus for measuring temperatures of respective portions of a substrate holder that supports a substrate (e.g., a semiconductor wafer) on which a process (e.g., an etching process) is carried out, and for controlling the temperatures of the respective portions in response to the measured temperatures, includes: an arrangement of at least one ultrasonic transducer arranged and configured to transmit ultrasonic energy through the substrate holder, and a data processor configured to calculate, during the process, the temperatures of the respective portions of the substrate holder based on respective propagation time delays of the ultrasonic energy through the respective portions.
摘要:
A cooling system for an industrial facility includes a facility that has a thermal energy output and an input, a dry cooler that includes a plurality of blowers, an evaporative cooling tower, a fluid-cooled chiller, a valving system that receives a thermally-charged media from the thermal energy output for delivery to at least one of the dry cooler, the evaporative cooling tower, and the fluid-cooled chiller, and a temperature sensor that is in communication with the valving system via a controller. The temperature sensor measures a current ambient temperature and cooperates with the controller to automatically adjust the valving system to direct the thermally-charged media to one of the dry cooler, the evaporative cooling tower, and the fluid-cooled chiller for rejecting heat from the thermally-charged media to define a thermally-receptive media. The cooling system further includes a return conduit that delivers the thermally-receptive media to the input.
摘要:
A document processing system comprises an input receptacle for receiving documents. A transport mechanism receives the documents from the input receptacle and transports the documents past an image scanner and a discrimination unit. An output receptacle receives the documents from the transport mechanism after being transported past the image scanner and the discrimination unit. The image scanner obtains an image of the documents, obtains an image of a selected area of the documents, and obtains information contained in the selected area of the document. The discrimination unit determines the authenticity of the document. A system controller directs the flows of documents over the transport mechanism.
摘要:
The invention relates to a composition comprising anionic clay and rare earth metal hydroxy carbonate. This composition can suitably be used in FCC for the reduction of NOx and/or SOx emissions, the reduction of the S and/or N-content in fuels, and as a metal trap.The composition can be prepared by precipitating a divalent metal salt, a trivalent metal salt, and a rare earth metal salt to form a precipitate, calcining the precipitate at 200-800° C., and rehydrating the precipitate in the presence of a carbonate source to form a composition comprising anionic clay and a rare earth metal hydroxy carbonate.
摘要:
A method and apparatus is disclosed to overcome the effects of intersymbol interference during data transmission. Overcoming the effects of intersymbol interference makes possible higher data transmission rates for a given error rate. In one embodiment a receiver-transmitter pair is configured with a precode filter at the transmit side and a feed forward filter and a feedback filter at the receive side. Filter coefficients are calculated to reduce the undesirable effects of the channel, such as intersymbol interference. In one embodiment a training process occurs with the feedforward filter and a feedback filter, such that the first N coefficients of the feedback filter are set to zero. Thereafter, the coefficients of the feedforward filter are subject to spectral factorization and separated into minimum phase roots and maximum phase roots. The minimum phase roots comprise the precode filter coefficients and the maximum phase roots are established as feedforward filter coefficients.
摘要:
A system for generating time-of-flight (TOF) positron emission tomography (PET) projection data includes a direct memory access rebinner constructed as a digital FPGA pipeline for rebinning TOF coincidence data in accordance with a number of projection space mapping algorithms, such as single-slice rebinning (SSRB) and reduced multiple-slice rebinning (MSRB), together with less precise transaxial and/or axial sampling.