Edge inspection system for inspection of optical devices

    公开(公告)号:US12003841B2

    公开(公告)日:2024-06-04

    申请号:US17661928

    申请日:2022-05-04

    CPC classification number: H04N23/56 G06T7/0004 H04N23/55 G06T2207/30148

    Abstract: Embodiments described herein relate to an inspection system for illumination of optical devices. The inspection system includes a stage, a focusing lens, a light source, a reflective surface, and a camera. The inspection system is operable to provide a light to a substrate. The substrate is positioned on the inspection system such that an edge of the substrate is exposed. The inspection system focuses light to the edge such that the light propagates through the substrate. The light is coupled out of the substrate, illuminating one or more optical devices disposed on the substrate. The illumination allows the camera to capture images to be inspected. The images are inspected to detect defects of the substrate.

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