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27 条记录 (耗时 0.034 秒)

    Closed cooling system for a marine engine
    3.
    发明授权
    Closed cooling system for a marine engine 失效
    封闭的船用发动机冷却系统

    公开(公告)号：US07503819B1

    公开(公告)日：2009-03-17

    申请号：US11651194

    申请日：2007-01-09

    申请人： Matthew W. Jaeger ,  Derric Drake ,  William C. Martin

    发明人： Matthew W. Jaeger ,  Derric Drake ,  William C. Martin

    IPC分类号： B63H21/14 ,  B60H1/00 ,  F01P5/10

    CPC分类号： B63H21/14 ,  F01P3/207 ,  F01P11/028

    摘要： A cooling system for a marine propulsion device provides a closed portion of the cooling system which recirculates coolant through the engine block and cylinder head, the exhaust manifold, and the exhaust elbow. It provides a pressure relief cap connected to the exhaust elbow and a low velocity portion of the coolant jacket of the exhaust elbow to facilitate the release of gas and coolant when pressures exceed a preselected magnitude.

    摘要翻译： 用于船舶推进装置的冷却系统提供冷却系统的封闭部分，其将冷却剂再循环通过发动机缸体，气缸盖，排气歧管和排气弯头。 它提供一个连接到排气弯管的减压帽和排气弯头的冷却剂套的低速部分，以便当压力超过预选量值时便于释放气体和冷却剂。

    Methods and circuits for testing open collectors and open drains
    5.
    发明授权
    Methods and circuits for testing open collectors and open drains 失效
    开放收集器和开放式排水管的测试方法和电路

    公开(公告)号：US06107814A

    公开(公告)日：2000-08-22

    申请号：US530936

    申请日：1995-09-20

    申请人： William C. Martin

    发明人： William C. Martin

    IPC分类号： G01R31/28

    CPC分类号： G01R31/31715

    摘要： The present invention is directed to methods and circuits for testing open collector or open drain output pads. In a preferred embodiment, the open collector or open drain outputs are hard driven to both their normal low and high level logic states during a test mode of operation. By actively driving open collector or open drain output pads to both their active and their inactive states, the existence of a stable output at any given sample time is guaranteed during a functionality test. The need to accurately estimate time delays associated with RC loads of external circuitry and the need to precisely strobe an open collector or open drain output following transition to an inactive, disabled state are therefore eliminated. Further, control signal inputs associated with a high impedance condition of open collector or open drain output pads can be directly examined at the circuit output using appropriate test logic.

    摘要翻译： 本发明涉及用于测试开路集电极或开漏输出焊盘的方法和电路。 在优选实施例中，开路集电极或开漏输出在测试操作模式期间被硬驱动到其正常的低电平和高电平逻辑状态。 通过主动驱动开路集电极或开路漏极输出焊盘到其有源和无效状态，在功能测试期间保证任何给定采样时间的稳定输出的存在。 因此，需要精确地估计与外部电路的RC负载相关联的时间延迟，并且在转换到非活动的禁用状态之后，需要精确地选通开路集电极或开漏输出。 此外，可以使用适当的测试逻辑在电路输出处直接检查与开路集电极或开漏输出焊盘的高阻抗条件相关联的控制信号输入。

    Method to reduce test vectors/test time in devices using equivalent blocks
    6.
    发明授权
    Method to reduce test vectors/test time in devices using equivalent blocks 失效
    在使用等效块的设备中减少测试向量/测试时间的方法

    公开(公告)号：US5412313A

    公开(公告)日：1995-05-02

    申请号：US959179

    申请日：1992-10-09

    申请人： William C. Martin

    发明人： William C. Martin

    IPC分类号： G01R31/3185 ,  G01R31/02

    CPC分类号： G01R31/318505

    摘要： A method and apparatus for testing the functionality of a circuit are disclosed which reduce the number of vectors required to simulate and test cells having, for example, similar functions. By using a number of vectors which is independent of the number of cells or blocks in the circuit, the need for multiple test modes is reduced such that the time and cost associated with a functionality test can be reduced.

    摘要翻译： 公开了一种用于测试电路功能的方法和装置，其减少了模拟和测试具有例如类似功能的单元所需的矢量数量。 通过使用独立于电路中的单元或块的数量的多个向量，减少了对多个测试模式的需要，从而可以减少与功能测试相关联的时间和成本。

    Computer cooling system using recycled coolant
    7.
    发明授权
    Computer cooling system using recycled coolant 失效
    使用回收冷却液的计算机冷却系统

    公开(公告)号：US4644443A

    公开(公告)日：1987-02-17

    申请号：US781064

    申请日：1985-09-27

    申请人： Michael W. Swensen ,  William C. Martin ,  Henry H. Kight

    发明人： Michael W. Swensen ,  William C. Martin ,  Henry H. Kight

    IPC分类号： H05K7/20

    CPC分类号： H05K7/20572

    摘要： An enclosed, electronic system has a plurality of lower power-dissipating electronic components mounted on a chassis. The components are positioned adjacent each other to form low volume fluid ducts therebetween. A low volume fluid duct is formed between one side of the plurality and one end enclosure of the system. At least one higher power-dissipating electronc component is also mounted on the chassis, forming a high volume fluid duct between one of its sides and one side of the last of the lower power-dissipating electronic components, and a high volume fluid duct also formed between the other side of the higher power-dissipating electronic component and the other end enclosure. Air is caused to blow through the low volume fluid duct and then to be exhausted through the high volume fluid ducts. The rate of air flow through the high volume ducts is one half of the minimum required to cool the higher power-dissipating component. The rate of air flow through the low volume fluid ducts is at least one half of that required to cool each of the lower power-dissipating electronic components. By exhausting the cooling air from the low volume fluid channels through the high volume fluid ducts, the air flow required is less than the total required for the low volume fluid ducts plus the high volume fluid ducts.

    摘要翻译： 封闭的电子系统具有安装在底盘上的多个较低功率耗散的电子部件。 这些部件彼此相邻地定位，以在它们之间形成低体积的流体管道。 在系统的多个一端和一端封套之间形成低体积的流体管道。 至少一个较高的功率消耗电子部件也安装在底盘上，在其一侧和最后一个功率耗散电子部件的一侧之间形成大体积的流体管道，并且还形成了大体积的流体管道 在较高功率耗散电子部件的另一侧和另一端壳体之间。 使空气吹过低体积流体管道，然后通过高体积流体管道排出。 通过高容量管道的空气流速是冷却较高功率耗散部件所需的最小值的一半。 通过低体积流体管道的空气流速是冷却每个较低功率耗散电子部件所需的空气流量的至少一半。 通过从低体积流体通道排出冷却空气通过高容积流体管道，所需的空气流量小于低体积流体管道加上高体积流体管道所需的总气流量。

    Methods and circuits for testing open collectors and open drains
    9.
    发明授权
    Methods and circuits for testing open collectors and open drains 失效

    公开(公告)号：US5471153A

    公开(公告)日：1995-11-28

    申请号：US334114

    申请日：1994-11-04

    申请人： William C. Martin

    发明人： William C. Martin

    IPC分类号： G01R31/317 ,  G01R31/3193 ,  G01R31/28

    CPC分类号： G01R31/3193 ,  G01R31/31715

    摘要： The present invention is directed to methods and circuits for testing open collector or open drain output pads. In a preferred embodiment, the open collector or open drain outputs are hard driven to both their normal low and high level logic states during a test mode of operation. By actively driving open collector or open drain output pads to both their active and their inactive states, the existence of a stable output at any given sample time is guaranteed during a functionality test. The need to accurately estimate time delays associated with RC loads of external circuitry and the need to precisely strobe an open collector or open drain output following transition to an inactive, disabled state are therefore eliminated. Further, control signal inputs associated with a high impedance condition of open collector or open drain output pads can be directly examined at the circuit output using appropriate test logic.