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公开(公告)号：US20230262312A1
公开(公告)日：2023-08-17
申请号：US18307268
申请日：2023-04-26
Applicant: CANON KABUSHIKI KAISHA
Inventor： Yasushi Koyama , Takahiro Sato , Takeaki Itsuji , Toshifumi Yoshioka , Eiichi Takami , Noriyuki Kaifu , Jun Iba , Rei Kurashima
Abstract: A movable body includes an imaging system which acquires an image formed by a terahertz wave, wherein the image is an image obtained by capturing an inspection object inside the movable body.
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公开(公告)号：US20200296266A1
公开(公告)日：2020-09-17
申请号：US16815171
申请日：2020-03-11
Applicant: CANON KABUSHIKI KAISHA
Inventor： Yasushi Koyama , Takahiro Sato , Takeaki Itsuji , Toshifumi Yoshioka , Eiichi Takami , Noriyuki Kaifu , Jun Iba , Rei Kurashima
Abstract: A movable body includes an imaging system which acquires an image formed by a terahertz wave, wherein the image is an image obtained by capturing an inspection object inside the movable body.
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公开(公告)号：US20200067170A1
公开(公告)日：2020-02-27
申请号：US16545816
申请日：2019-08-20
Applicant: CANON KABUSHIKI KAISHA
Inventor： Takahiro Sato , Jun Iba , Yoshinori Tateishi
Abstract: A receiver which is configured to detect a terahertz wave incident on a first surface of a substrate, the receiver comprising: an antenna which is provided on the first surface of the substrate and is configured to receive the terahertz wave; and a through electrode which is electrically connected to the antenna and penetrates the substrate from the first surface to a second surface, the second surface being opposite to the first surface, wherein the through electrode is separated from the antenna by a distance that is 0.25 times a resonance wavelength or more.
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公开(公告)号：US10063732B2
公开(公告)日：2018-08-28
申请号：US15629599
申请日：2017-06-21
Applicant: CANON KABUSHIKI KAISHA
Inventor： Daisuke Akagi , Masanori Ogura , Jun Iba , Atsushi Furubayashi
CPC classification number: H04N1/0282 , G02B5/20 , H01L27/14 , H04N1/028 , H04N1/02895 , H04N1/03 , H04N1/191 , H04N9/07
Abstract: In a line sensor including color filters that are periodically disposed in a light-receiving-element row, a problem called a “mixture of colors” occurs. A “mixture of colors” occurs when light that has been transmitted through a color filter differing from a color filter corresponding to a light receiving element is incident upon the light receiving element. In a CMOS sensor 107 including a light-receiving-element row in which a plurality of photodiodes 1204 are disposed side by side in a main scanning direction and a plurality of color filters 1202 that are disposed in correspondence with the plurality of photodiodes 1204, the center of each color filter 1202 is displaced in a direction of the center of the light-receiving-element row from the center of the photodiode 1204 corresponding to the color filter.
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公开(公告)号：US10008528B2
公开(公告)日：2018-06-26
申请号：US15272738
申请日：2016-09-22
Applicant: CANON KABUSHIKI KAISHA
Inventor： Hiroshi Ikakura , Nobutaka Ukigaya , Jun Iba , Taro Kato , Takehito Okabe
IPC: H01L31/0232 , H01L27/146
CPC classification number: H01L27/14625 , H01L27/14605 , H01L27/14607 , H01L27/14609 , H01L27/14643 , H01L27/14685
Abstract: A solid-state image sensor includes a substrate including a photoelectric conversion portion, an insulating layer having an opening, and a member arranged inside the opening. Letting d be a depth of the opening, the opening has, at an upper end of the opening, a shape having a width in a first direction parallel to the surface of the substrate, and a width in a second direction parallel to the surface of the substrate and orthogonal to the first direction. The widths in the first and second directions are different from each other. The shape is capable of drawing, at each point on a circumference of the opening at the upper end, a circle of 0.6d in diameter which contacts the circumference at the point and does not include a portion outside the opening.
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Patent Agency Ranking
公开(公告)号：US20170092677A1
公开(公告)日：2017-03-30
申请号：US15272738
申请日：2016-09-22
Applicant: CANON KABUSHIKI KAISHA
Inventor： Hiroshi Ikakura , Nobutaka Ukigaya , Jun Iba , Taro Kato , Takehito Okabe
IPC: H01L27/146
CPC classification number: H01L27/14625 , H01L27/14605 , H01L27/14607 , H01L27/14609 , H01L27/14643 , H01L27/14685
Abstract: A solid-state image sensor includes a substrate including a photoelectric conversion portion, an insulating layer having an opening, and a member arranged inside the opening. Letting d be a depth of the opening, the opening has, at an upper end of the opening, a shape having a width in a first direction parallel to the surface of the substrate, and a width in a second direction parallel to the surface of the substrate and orthogonal to the first direction. The widths in the first and second directions are different from each other. The shape is capable of drawing, at each point on a circumference of the opening at the upper end, a circle of 0.6d in diameter which contacts the circumference at the point and does not include a portion outside the opening.
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公开(公告)号：US09599754B2
公开(公告)日：2017-03-21
申请号：US15009646
申请日：2016-01-28
Applicant: CANON KABUSHIKI KAISHA
Inventor： Kazunari Kawabata , Jun Iba , Zempei Wada
IPC: G02B3/00 , G02B3/04 , H01L27/146
CPC classification number: G02B3/0043 , G02B3/0037 , G02B3/0056 , G02B3/04 , H01L27/14627
Abstract: An optical element array includes a plurality of optical elements arranged along a first direction and a second direction. A first optical element is included at a position distanced from a center of the optical element array by a first distance. The first optical element has a first width, a first height, and a first curvature radius at the first position, and a second width, a second height, and a second curvature radius at a second position. The first width is wider than the second width, the first height is higher than the second height, and the first curvature radius is smaller than the second curvature radius. The first position and the second position are taken along a single direction.
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公开(公告)号：US20130208172A1
公开(公告)日：2013-08-15
申请号：US13751686
申请日：2013-01-28
Applicant: Canon Kabushiki Kaisha
Inventor： Kazuaki Tashiro , Jun Iba , Satoko Iida
CPC classification number: G03B33/00 , G02B19/0014 , G02B19/0076 , H01L27/14621 , H01L27/14627 , H01L27/14685
Abstract: An imaging apparatus comprising a plurality of pixels each of which includes a photoelectric conversion portion, and a light-condensing portion arranged on the plurality of pixels, wherein the light-condensing portion has an area smaller than an area of the photoelectric conversion portion.
Abstract translation: 一种成像装置，包括多个像素，每个像素包括光电转换部分和布置在所述多个像素上的聚光部分，其中所述聚光部分具有小于所述光电转换部分的面积的面积。
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公开(公告)号：US20220171259A1
公开(公告)日：2022-06-02
申请号：US17675822
申请日：2022-02-18
Applicant: CANON KABUSHIKI KAISHA
Inventor： Fumiaki Mizutani , Jun Iba
Abstract: An imaging apparatus includes: a detector configured to detect a surface position of an object by receiving a second electromagnetic wave of which wavelength is shorter than a first electromagnetic wave; a focusing device configured to collect the first electromagnetic wave reflected on the object; at least one memory and at least one processor which function as a control unit configured to control the focusing device such that a position based on the surface position is focused on; and an image sensor configured to image the object using the first electromagnetic wave collected by the focusing device.
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公开(公告)号：US20200296265A1
公开(公告)日：2020-09-17
申请号：US16815153
申请日：2020-03-11
Applicant: CANON KABUSHIKI KAISHA
Inventor： Takeaki Itsuji , Takahiro Sato , Yasushi Koyama , Toshifumi Yoshioka , Eiichi Takami , Noriyuki Kaifu , Jun Iba , Rei Kurashima
Abstract: A processing system comprising a first imaging system configured to capture a first image based on a terahertz wave from an inspection target, a second imaging system configured to capture a second image of the inspection target based on an electromagnetic wave of a wavelength different from the terahertz wave, and a processor configured to process the first image and the second image, wherein the processor detects an inspection region based on the second image and processes information of a region of the first image corresponding to the inspection region.
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