MIRROR ELEMENTS FOR EUV LITHOGRAPHY AND PRODUCTION METHODS THEREFOR
    1.
    发明申请
    MIRROR ELEMENTS FOR EUV LITHOGRAPHY AND PRODUCTION METHODS THEREFOR 有权
    镜像的镜像元素及其生产方法

    公开(公告)号:US20140190212A1

    公开(公告)日:2014-07-10

    申请号:US14204009

    申请日:2014-03-11

    Inventor: Wilfried CLAUSS

    Abstract: A method for the production of a mirror element (10) that has a reflective coating (10a) for the EUV wavelength range and a substrate (10b). The substrate (10b) is pre-compacted by hot isostatic pressing, and the reflective coating (10a) is applied to the pre-compacted substrate (10b). In the method, either the pre-compacting of the substrate (10b) is performed until a saturation value of the compaction of the substrate (10b) by long-term EUV irradiation is reached, or, for further compaction, the pre-compacted substrate (10b) is irradiated, preferably homogeneously, with ions (16) and/or with electrons in a surface region (15) in which the coating (10a) has been or will be applied. A mirror element (10) for the EUV wavelength range associated with the method has a substrate (10b) pre-compacted by hot isostatic pressing. Such a mirror element (10) is suitable to be provided in an EUV projection exposure system.

    Abstract translation: 一种用于生产具有用于EUV波长范围的反射涂层(10a)的反射镜元件(10)的方法和一种基板(10b)。 基板(10b)通过热等静压进行预压实,并将反射涂层(10a)施加到预压实的基板(10b)上。 在该方法中,进行基板(10b)的预压实,直到达到通过长期EUV照射的基板(10b)的压实的饱和值,或者为了进一步压缩,预压实基板 (10b)在涂层(10a)已经或将被施加的表面区域(15)中与离子(16)和/或电子被优选均匀地照射。 用于与该方法相关联的EUV波长范围的镜元件(10)具有通过热等静压预压制的基底(10b)。 这种镜子元件(10)适合于设置在EUV投影曝光系统中。

    SUBSTRATES FOR MIRRORS FOR EUV LITHOGRAPHY AND THEIR PRODUCTION
    3.
    发明申请
    SUBSTRATES FOR MIRRORS FOR EUV LITHOGRAPHY AND THEIR PRODUCTION 有权
    用于EUV光刻及其生产的镜子的基底

    公开(公告)号:US20130120863A1

    公开(公告)日:2013-05-16

    申请号:US13667862

    申请日:2012-11-02

    Abstract: For the production of mirrors for EUV lithography, substrates are suggested having a mean relative thermal longitudinal expansion of no more than 10 ppb across a temperature difference ΔT of 15° C. and a zero-crossing temperature in the range between 20° C. and 40° C. For this purpose, at least one first and one second material having low thermal expansion coefficients and opposite gradients of the relative thermal expansion as a function of temperature are selected and a substrate is produced by mixing and bonding these materials.

    Abstract translation: 为了生产用于EUV光刻的反射镜,建议基板在15℃的温差DeltaT和10°C之间的过零点温度下具有不超过10ppb的平均相对热纵向膨胀,并且在20℃和 40℃。为此目的,选择具有低热膨胀系数和相对热膨胀作为温度的函数的相反梯度的至少一种第一和第二材料,并通过混合和粘合这些材料来生产基底。

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