Plasma etching process
    2.
    发明授权
    Plasma etching process 有权
    等离子体蚀刻工艺

    公开(公告)号:US09378970B2

    公开(公告)日:2016-06-28

    申请号:US14610490

    申请日:2015-01-30

    摘要: A method and system are provided for etching a layer to be etched in a plasma etching reactor, including: forming a reactive layer by injection of at least one reactive gas to form a reactive gas plasma, which forms, together with the layer to be etched, a reactive layer which goes into the layer to be etched during etching of said layer to be etched, wherein the reactive layer reaches a steady state thickness upon completion of a determined duration of said injection; said injection being interrupted before said determined duration has elapsed so that, upon completion of the forming of the reactive layer, the thickness of the reactive layer is smaller than said steady state thickness; and removing the reactive layer by injection of at least one inert gas to form an inert gas plasma, which makes it possible to remove only the reactive layer.

    摘要翻译: 提供了一种用于在等离子体蚀刻反应器中蚀刻待蚀刻层的方法和系统,包括:通过注入至少一种反应性气体形成反应层以形成反应性气体等离子体,其与待蚀刻的层一起形成 ,在蚀刻所述蚀刻层期间进入待蚀刻层中的反应层,其中当所述注入的确定持续时间完成时,所述反应层达到稳定状态厚度; 所述注入在经过所述确定的持续时间之前中断,使得在反应层的形成完成时,反应层的厚度小于所述稳态厚度; 并且通过注入至少一种惰性气体来除去反应层以形成惰性气体等离子体,这使得仅可除去反应层。