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公开(公告)号：US11204280B2
公开(公告)日：2021-12-21
申请号：US16804219
申请日：2020-02-28
Applicant: CORNING INCORPORATED
Inventor： Chong Pyung An , Ryan Claude Andrews , Galan Gregory Moore , Rohit Rai , Erika Lynn Stapleton , Ljerka Ukrainczyk
Abstract: A method for determining crystal phases of a glass ceramic sample, including the steps of applying energy to the sample using an excitation source, detecting raw Raman spectral energy that is given off by the sample using a detector, wherein the raw Raman spectral energy includes peak values, determining a plurality of predetermined energy peaks based off a composition of the sample, superimposing the plurality of predetermined energy peaks over the raw Raman spectral energy, applying a baseline value between each predetermined energy peak, subtracting the baseline value from the raw Raman spectral energy, calculating corrected peak values based on the raw Raman spectral energy and baseline value, and determining the crystal phases of the glass ceramic sample based on the corrected peak values.
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公开(公告)号：US20210239584A1
公开(公告)日：2021-08-05
申请号：US17237437
申请日：2021-04-22
Applicant: CORNING INCORPORATED
Inventor： Gabriel Pierce Agnello , Chong Pyung An , Zhenxing Hu , Bosun Jang , Peter Knowles , Balamurugan Meenakshi Sundaram , Douglas Miles Noni, JR. , Richard Sean Priestley , Jamie Todd Westbrook
Abstract: An apparatus for testing the edge strength of a discrete sheet of material such as glass where the sheet has an irregular free-form shaped outline is disclosed. The apparatus can include a plurality of assemblies configured for selectively applying a 3-point bending load on an edge of the sheet of material in a test region of the apparatus, a detection mechanism that optically measures strain in the sheet of material in the region, and a processor that determines the stress in the sheet based on the measured strain by calculating the stress that would be required to produce the measured strain in the sheet of material.
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公开(公告)号：US20220057309A1
公开(公告)日：2022-02-24
申请号：US17285587
申请日：2020-05-06
Applicant: CORNING INCORPORATED
Inventor： Gabriel Pierce Agnello , Chong Pyung An , Zhenxing Hu , Bosun Jang , Peter Knowles , Balamurugan Meenakshi Sundaram , Douglas Miles Noni, JR. , Richard Sean Priestley , Jamie Todd Westbrook
Abstract: An apparatus for testing a sheet of brittle material is disclosed. The apparatus can include a plurality of assemblies configured for selectively applying a 3-point bending load on an edge of the sheet of material in a test region of the apparatus, a detection mechanism that optically measures strain in the sheet of material in the region, and a processor that determines the stress in the sheet based on the measured strain by calculating the stress that would be required to produce the measured strain in the sheet of material.
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公开(公告)号：US20180073967A1
公开(公告)日：2018-03-15
申请号：US15557991
申请日：2016-03-10
Applicant: CORNING INCORPORATED
Inventor： Gabriel Pierce Agnello , Chong Pyung An , William Kenneth Denson , Peter Knowles , David Bruce Moorehouse , Denwood Falconer Ross , Correy Robert Ustanik , Siva Venkatachalam
IPC: G01N3/20
CPC classification number: G01N3/20 , G01N2203/0076 , G01N2203/0282
Abstract: Apparatus and method for testing a sheet of brittle material comprising the steps of measuring one or more edge features of a sheet of brittle material, imparting a bend to the sheet of brittle material and producing relative motion between the sheet and the bend such that the bend traverses the sheet. A stress can be induced in the sheet as a function of the relative motion and imparted bend, wherein the induced stress corresponds to a predetermined strength value, and the measured one or more edge features can be correlated with the strength value.
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公开(公告)号：US11906482B2
公开(公告)日：2024-02-20
申请号：US17237437
申请日：2021-04-22
Applicant: CORNING INCORPORATED
Inventor： Gabriel Pierce Agnello , Chong Pyung An , Zhenxing Hu , Bosun Jang , Peter Knowles , Balamurugan Meenakshi Sundaram , Douglas Miles Noni, Jr. , Richard Sean Priestley , Jamie Todd Westbrook
CPC classification number: G01N3/20 , G01N3/068 , G01N2203/0023 , G01N2203/0282 , G01N2203/0647
Abstract: An apparatus for testing the edge strength of a discrete sheet of material such as glass where the sheet has an irregular free-form shaped outline is disclosed. The apparatus can include a plurality of assemblies configured for selectively applying a 3-point bending load on an edge of the sheet of material in a test region of the apparatus, a detection mechanism that optically measures strain in the sheet of material in the region, and a processor that determines the stress in the sheet based on the measured strain by calculating the stress that would be required to produce the measured strain in the sheet of material.
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Patent Agency Ranking
公开(公告)号：US20230221261A1
公开(公告)日：2023-07-13
申请号：US17928005
申请日：2021-05-25
Applicant: CORNING INCORPORATED
Inventor： Chong Pyung An , En Hong , Tian Huang , Yuhui Jin , Philip Robert LeBlanc , Garrett Andrew Piech
IPC: G01N21/88 , G01N21/958
CPC classification number: G01N21/8806 , G01N21/958 , G01N21/8851 , G01N2021/8822 , G01N2021/8887
Abstract: A method for inspecting a transparent workpiece comprises: directing light from an illumination source onto a plurality of defects formed in the transparent workpiece, wherein the plurality of defects extends in a defect direction, wherein the transparent workpiece comprises a first surface and a second surface; detecting a scattering image signal from light scattered by the plurality of defects using an imaging system, wherein an imaging axis of the imaging system extends at a non-zero imaging angle relative to the defect direction, wherein entireties of at least a subset of the plurality of defects are within a depth of field of the imaging system; and generating a three-dimensional image of at least one of the plurality of defects based on the scattering signal.
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公开(公告)号：US10732126B2
公开(公告)日：2020-08-04
申请号：US16346711
申请日：2017-10-31
Applicant: Corning Incorporated
Inventor： Chong Pyung An , Uta-Barbara Goers , En Hong , Sung-chan Hwang , Ji Hwa Jung , Tae-ho Keem , Philip Robert LeBlanc , Hyeong-cheol Lee , Michal Mlejnek , Johannes Moll , Rajeshkannan Palanisamy , Sung-jong Pyo , Amanda Kathryn Thomas , Correy Robert Ustanik
IPC: G01N21/896 , G01N21/958
Abstract: A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.
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8.发明申请公开(公告)号：US20190277774A1
公开(公告)日：2019-09-12
申请号：US16346711
申请日：2017-10-31
Applicant: Corning Incorporated
Inventor： Chong Pyung An , Uta-Barbara Goers , En Hong , Sung-chan Hwang , Ji Hwa Jung , Tae-ho Keem , Philip Robert LeBlanc , Hyeong-cheol Lee , Michal Mlejnek , Johannes Moll , Rajeshkannan Palanisamy , Sung-jong Pyo , Amanda Kathryn Thomas , Correy Robert Ustanik
IPC: G01N21/896 , G01N21/958
Abstract: A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.
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公开(公告)号：US11906483B2
公开(公告)日：2024-02-20
申请号：US17285587
申请日：2020-05-06
Applicant: CORNING INCORPORATED
Inventor： Gabriel Pierce Agnello , Chong Pyung An , Zhenxing Hu , Bosun Jang , Peter Knowles , Balamurugan Meenakshi Sundaram , Douglas Miles Noni, Jr. , Richard Sean Priestley , Jamie Todd Westbrook
CPC classification number: G01N3/20 , G01N3/068 , G01N2203/0023 , G01N2203/0282 , G01N2203/0647
Abstract: An apparatus for testing a sheet of brittle material is disclosed. The apparatus can include a plurality of assemblies configured for selectively applying a 3-point bending load on an edge of the sheet of material in a test region of the apparatus, a detection mechanism that optically measures strain in the sheet of material in the region, and a processor that determines the stress in the sheet based on the measured strain by calculating the stress that would be required to produce the measured strain in the sheet of material.
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公开(公告)号：US20200278254A1
公开(公告)日：2020-09-03
申请号：US16804219
申请日：2020-02-28
Applicant: Corning Incorporated
Inventor： Chong Pyung An , Ryan Claude Andrews , Galan Gregory Moore , Rohit Rai , Erika Lynn Stapleton , Ljerka Ukrainczyk
Abstract: A method for determining crystal phases of a glass ceramic sample, including the steps of applying energy to the sample using an excitation source, detecting raw Raman spectral energy that is given off by the sample using a detector, wherein the raw Raman spectral energy includes peak values, determining a plurality of predetermined energy peaks based off a composition of the sample, superimposing the plurality of predetermined energy peaks over the raw Raman spectral energy, applying a baseline value between each predetermined energy peak, subtracting the baseline value from the raw Raman spectral energy, calculating corrected peak values based on the raw Raman spectral energy and baseline value, and determining the crystal phases of the glass ceramic sample based on the corrected peak values.
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