Unreachable cover root cause search

    公开(公告)号:US11138355B1

    公开(公告)日:2021-10-05

    申请号:US17099301

    申请日:2020-11-16

    Abstract: A formal verification EDA application can be configured to receive a circuit design of an IC chip, the circuit design of the IC chip including a list of properties for the IC chip. The list of properties includes a list of covers for the IC chip. The formal verification engine can also execute a formal verification of the IC chip. Results of the formal verification identifies a subset of covers of the list of covers that are unreachable. The formal verification engine can further execute a root cause search for a selected cover in the subset of covers that are unreachable. The root cause search selectively adds and removes cutpoints to signals in the circuit design to identify a root cause for the selected cover being unreachable. The root cause comprises a signal in the circuit design that is upstream from the selected cover.

    System, method, and computer program product for analyzing formal constraint conflicts

    公开(公告)号:US10380312B1

    公开(公告)日:2019-08-13

    申请号:US15371449

    申请日:2016-12-07

    Abstract: The present disclosure relates to a method for electronic design verification. Embodiments may include receiving, using at least one processor, an electronic design and identifying one or more assumptions associated with the electronic design that are mutually in conflict. Embodiments may further include grouping the one or more assumptions that are mutually in conflict into a conflicting group of assumptions and iteratively disabling at least one of the conflicting group of assumptions. Embodiments may include generating at least one trace pair depicting a scenario where an assumption from a disabled set holds in a first trace but is violated in a second trace. Embodiments may further include identifying at least one signal associated with the first trace and at least one signal associated with the second trace and comparing the at least one signal associated with the first trace and the at least one signal associated with the second trace.

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