Method of characterizing transparent thin-films using differential optical sectioning interference microscopy
    1.
    发明授权
    Method of characterizing transparent thin-films using differential optical sectioning interference microscopy 失效
    使用差分光学切片干涉显微镜表征透明薄膜的方法

    公开(公告)号:US07545510B2

    公开(公告)日:2009-06-09

    申请号:US11789769

    申请日:2007-04-25

    IPC分类号: G01B11/02

    摘要: An imaging, differential optical sectioning interference microscopy (DOSIM) system and method for measuring refractive indices and thicknesses of transparent thin-films. The refractive index and thickness are calculated from two interferometric images of the sample transparent thin-film having a vertical offset that falls within the linear region of an axial response curve of optically sectioning microscopy. Here, the images are formed by a microscope objective in the normal direction, i.e., in the direction perpendicular to the latitudinal surface of the thin-film. As a result, the lateral resolution of the transparent thin-film is estimated based on the Rayleigh criterion, 0.61λ/NA.

    摘要翻译: 用于测量透明薄膜的折射率和厚度的成像,差分光学切片干涉显微镜(DOSIM)系统和方法。 折射率和厚度由具有落在光学切片显微镜的轴向响应曲线的线性区域内的垂直偏移的样品透明薄膜的两个干涉图像计算。 这里,图像由显微镜物镜沿正交方向,即在与薄膜的纬向表面垂直的方向上形成。 结果,透明薄膜的横向分辨率基于Rayleigh标准估计,为0.61λ/ NA。

    OPTICAL PROFILOMETRY
    2.
    发明申请
    OPTICAL PROFILOMETRY 有权
    光学特性

    公开(公告)号:US20110141483A1

    公开(公告)日:2011-06-16

    申请号:US12966207

    申请日:2010-12-13

    IPC分类号: G01B11/25

    摘要: A method for imaging an object using a microscope includes obtaining axial response data, the axial response data representative of a relationship between a separation between a top surface of the object and an objective lens of the microscope and an intensity of light reflected by the top surface of the object; positioning the object at a distance from the objective lens that is within a linear region of the axial response data; sequentially illuminating the object with a plurality of periodic patterns; obtaining a plurality of images of the object, each image resulting from the illumination of the object with a corresponding one of the plurality of periodic patterns; determining a reconstructed image of the object based on the plurality of images of the object; and, based on variations in the intensity of the reconstructed image, determining a topographic profile of the top surface of the object.

    摘要翻译: 使用显微镜成像物体的方法包括获得轴向响应数据,轴向响应数据表示物体的顶表面与显微镜的物镜之间的间隔与由顶表面反射的光的强度之间的关系 的对象; 将物体定位在与轴向响应数据的线性区域内的离开物镜的距离处; 以多个周期性图案依次照明物体; 获得所述对象的多个图像,所述每个图像由所述对象的照明产生,所述每个图像具有所述多个周期性图案中的对应的一个; 基于对象的多个图像确定对象的重建图像; 并且基于重建图像的强度的变化,确定对象的顶表面的地形轮廓。

    Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope
    3.
    发明授权
    Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope 有权
    通过与结构化照明显微镜的光轴相关联的强度与扫描对象的位置进行高度测量

    公开(公告)号:US08705043B2

    公开(公告)日:2014-04-22

    申请号:US12966207

    申请日:2010-12-13

    IPC分类号: G01B9/021 G01B11/24 G01B11/30

    摘要: A method for imaging an object using a microscope includes obtaining axial response data, the axial response data representative of a relationship between a separation between a top surface of the object and an objective lens of the microscope and an intensity of light reflected by the top surface of the object; positioning the object at a distance from the objective lens that is within a linear region of the axial response data; sequentially illuminating the object with a plurality of periodic patterns; obtaining a plurality of images of the object, each image resulting from the illumination of the object with a corresponding one of the plurality of periodic patterns; determining a reconstructed image of the object based on the plurality of images of the object; and, based on variations in the intensity of the reconstructed image, determining a topographic profile of the top surface of the object.

    摘要翻译: 使用显微镜成像物体的方法包括获得轴向响应数据,轴向响应数据表示物体的顶表面与显微镜的物镜之间的间隔与由顶表面反射的光的强度之间的关系 的对象; 将物体定位在与轴向响应数据的线性区域内的离开物镜的距离处; 以多个周期性图案依次照明物体; 获得所述对象的多个图像,所述每个图像由所述对象的照明产生,所述每个图像具有所述多个周期性图案中的对应的一个; 基于对象的多个图像确定对象的重建图像; 并且基于重建图像的强度的变化,确定对象的顶表面的地形轮廓。

    Method for characterizing transparent thin-films using differential optical sectioning interference microscopy
    4.
    发明申请
    Method for characterizing transparent thin-films using differential optical sectioning interference microscopy 失效
    使用差分光学切片干涉显微镜表征透明薄膜的方法

    公开(公告)号:US20080266548A1

    公开(公告)日:2008-10-30

    申请号:US11789769

    申请日:2007-04-25

    IPC分类号: G01N21/00 G06F15/00

    摘要: An imaging, differential optical sectioning interference microscopy (DOSIM) system and method for measuring refractive indices and thicknesses of transparent thin-films. The refractive index and thickness are calculated from two interferometric images of the sample transparent thin-film having a vertical offset that falls within the linear region of an axial response curve of optically sectioning microscopy. Here, the images are formed by a microscope objective in the normal direction, i.e., in the direction perpendicular to the latitudinal surface of the thin-film. As a result, the lateral resolution of the transparent thin-film is estimated based on the Rayleigh criterion, 0.61λ/NA.

    摘要翻译: 用于测量透明薄膜的折射率和厚度的成像,差分光学切片干涉显微镜(DOSIM)系统和方法。 折射率和厚度由具有落在光学切片显微镜的轴向响应曲线的线性区域内的垂直偏移的样品透明薄膜的两个干涉图像计算。 这里,图像由显微镜物镜沿正交方向,即在与薄膜的纬向表面垂直的方向上形成。 结果,透明薄膜的横向分辨率基于Rayleigh标准估计,为0.61λ/ NA。

    Display device capable of switching gate high voltage
    5.
    发明授权
    Display device capable of switching gate high voltage 有权
    能够切换门极高电压的显示装置

    公开(公告)号:US08704815B2

    公开(公告)日:2014-04-22

    申请号:US13158481

    申请日:2011-06-13

    IPC分类号: G09G3/36

    摘要: A display device including a first voltage generator, a second voltage generator, a timing controller, a level shifter and a display panel is provided. The first voltage generator is configured to generate a gate high voltage. During a first period, the gate high voltage is a first voltage. After the first period, the gate high voltage is a second voltage. The first voltage is higher than the second voltage. The second voltage generator is configured to generate a gate low voltage. According to the gate high voltage and the gate low voltage, the level shifter shifts the voltage levels of the start signal, the clock signal and the inverse signal produced by the timing controller for driving a plurality of shift registers disposed on a substrate of the display panel. The shift registers is configured to output scanning signals in sequence.

    摘要翻译: 提供了包括第一电压发生器,第二电压发生器,定时控制器,电平转换器和显示面板的显示装置。 第一电压发生器被配置为产生栅极高压。 在第一时段期间,栅极高电压是第一电压。 第一个周期后,栅极高电压是第二个电压。 第一电压高于第二电压。 第二电压发生器被配置为产生栅极低电压。 根据栅极高电压和栅极低电压,电平移位器移位由定时控制器产生的起始信号,时钟信号和反向信号的电压电平,用于驱动布置在显示器的基板上的多个移位寄存器 面板。 移位寄存器被配置为依次输出扫描信号。

    Broadband antenna applied to multiple frequency band
    6.
    发明授权
    Broadband antenna applied to multiple frequency band 有权
    宽带天线应用于多频段

    公开(公告)号:US08487814B2

    公开(公告)日:2013-07-16

    申请号:US12727059

    申请日:2010-03-18

    IPC分类号: H01Q1/38 H01Q1/48

    摘要: A broadband antenna includes a substrate, a ground plane, a radiating path, a shorting path, a first connection path, a second connection path and a coupling path. The ground plane has a shorting point, a first grounding point and a second grounding point. The radiating path has a feeding point and a first connecting point. Two ends of the shorting path are respectively electrically connected with the shorting point and the feeding point, and the shorting path has a second connecting point. Two ends of the first connection path are respectively connected with the first connecting point and the second connecting point. Two ends of the second connection path are respectively connected with the first grounding point and the feeding point. One end of the coupling path is connected to the second grounding point and another end of the coupling path is separated from the shorting path.

    摘要翻译: 宽带天线包括基板,接地平面,辐射路径,短路路径,第一连接路径,第二连接路径和耦合路径。 接地平面具有短路点,第一接地点和第二接地点。 辐射路径具有馈电点和第一连接点。 短路路径的两端分别与短路点和馈电点电连接,短路路径具有第二连接点。 第一连接路径的两端分别与第一连接点和第二连接点连接。 第二连接路径的两端分别与第一接地点和馈电点相连。 耦合路径的一端连接到第二接地点,耦合路径的另一端与短路路径分离。

    TOUCH PANEL, ANTI-NOISE UNIT AND METHOD FOR PROCESSING A NOISE
    7.
    发明申请
    TOUCH PANEL, ANTI-NOISE UNIT AND METHOD FOR PROCESSING A NOISE 有权
    触摸板,防噪声单元和处理噪声的方法

    公开(公告)号:US20130176233A1

    公开(公告)日:2013-07-11

    申请号:US13527851

    申请日:2012-06-20

    IPC分类号: G06F3/041

    摘要: A touch panel includes a display module, a touch sensor, an anti-noise unit and a signal processing unit. The display module generates a noise. The touch sensor is disposed above the display module and outputs an abnormal signal, wherein the abnormal signal includes the noise and a sensing signal. The anti-noise unit is adapted to receive the abnormal signal and then reject the noise so as to form the sensing signal. The signal processing unit is adapted to process the sensing signal.

    摘要翻译: 触摸面板包括显示模块,触摸传感器,抗噪声单元和信号处理单元。 显示模块产生噪音。 触摸传感器设置在显示模块上方并输出异常信号,其中异常信号包括噪声和感测信号。 抗噪声单元适于接收异常信号,然后拒绝噪声以形成感测信号。 信号处理单元适于处理感测信号。

    DEFECT DETECTION SYSTEM AND METHOD
    9.
    发明申请
    DEFECT DETECTION SYSTEM AND METHOD 有权
    缺陷检测系统和方法

    公开(公告)号:US20120016600A1

    公开(公告)日:2012-01-19

    申请号:US12879215

    申请日:2010-09-10

    IPC分类号: G01N29/46 G01N29/04 G06F19/00

    摘要: A defect detection system and method enable a fastened crystalline silicon product to generate micro-vibration by a micro-vibration excitation device, so as to enable the crystalline silicon product to generate an excitation signal, then to acquire the excitation signal by a acquisition device, so as to analyze the excitation signal acquired by the acquisition device in the time and frequency domain by an analysis detection device with a specific analysis, and to obtain an analysis result, at last, determine a defect state of the crystalline silicon product according to the analysis result.

    摘要翻译: 缺陷检测系统和方法使得紧固的晶体硅产品能够通过微振动激励装置产生微振动,以使晶体硅产品产生激发信号,然后由采集装置获取激发信号, 以便通过特定分析的分析检测装置分析由采集装置在时域和频域中获取的激励信号,并且获得分析结果,最后根据所述分析结果确定晶体硅产品的缺陷状态 分析结果。

    Electronic casing and method of manufacturing the same
    10.
    发明授权
    Electronic casing and method of manufacturing the same 有权
    电子外壳及其制造方法

    公开(公告)号:US08020423B2

    公开(公告)日:2011-09-20

    申请号:US11960795

    申请日:2007-12-20

    IPC分类号: B21D31/00 B23P25/00 H01F7/06

    摘要: An electronic casing and a method of manufacturing the same are provided. The method includes the following steps. Step (a): a metal laminate and a die of a predetermined shape are provided. The metal laminate comprises a metal top layer and a metal bottom layer that are bonded by interface atom diffusion. Step (b): the metal laminate is processed to form a casing blank by using the die, and the casing blank has at least one turning portion. Step (c): a profiler of a predetermined shape and an electromagnetic forming device are provided. Step (d): the casing blank is attached to the profiler, and the electromagnetic forming device is disposed at a position corresponding to the turning portion. Step (e): the electromagnetic forming device is activated, so that the casing blank has a shape corresponding to the predetermined shape of the profiler.

    摘要翻译: 提供电子外壳及其制造方法。 该方法包括以下步骤。 步骤(a):提供金属层叠体和预定形状的模具。 金属层压体包括通过界面原子扩散结合的金属顶层和金属底层。 步骤(b):通过使用模具处理金属层压体以形成外壳坯件,并且壳体坯料具有至少一个转动部分。 步骤(c):提供预定形状的轮廓仪和电磁成形装置。 步骤(d):将外壳坯料安装在轮廓仪上,电磁形成装置设置在与转动部对应的位置。 步骤(e):电磁成形装置被激活,使得壳体坯料具有与轮廓仪的预定形状相对应的形状。