摘要:
An imaging, differential optical sectioning interference microscopy (DOSIM) system and method for measuring refractive indices and thicknesses of transparent thin-films. The refractive index and thickness are calculated from two interferometric images of the sample transparent thin-film having a vertical offset that falls within the linear region of an axial response curve of optically sectioning microscopy. Here, the images are formed by a microscope objective in the normal direction, i.e., in the direction perpendicular to the latitudinal surface of the thin-film. As a result, the lateral resolution of the transparent thin-film is estimated based on the Rayleigh criterion, 0.61λ/NA.
摘要:
A method for imaging an object using a microscope includes obtaining axial response data, the axial response data representative of a relationship between a separation between a top surface of the object and an objective lens of the microscope and an intensity of light reflected by the top surface of the object; positioning the object at a distance from the objective lens that is within a linear region of the axial response data; sequentially illuminating the object with a plurality of periodic patterns; obtaining a plurality of images of the object, each image resulting from the illumination of the object with a corresponding one of the plurality of periodic patterns; determining a reconstructed image of the object based on the plurality of images of the object; and, based on variations in the intensity of the reconstructed image, determining a topographic profile of the top surface of the object.
摘要:
A method for imaging an object using a microscope includes obtaining axial response data, the axial response data representative of a relationship between a separation between a top surface of the object and an objective lens of the microscope and an intensity of light reflected by the top surface of the object; positioning the object at a distance from the objective lens that is within a linear region of the axial response data; sequentially illuminating the object with a plurality of periodic patterns; obtaining a plurality of images of the object, each image resulting from the illumination of the object with a corresponding one of the plurality of periodic patterns; determining a reconstructed image of the object based on the plurality of images of the object; and, based on variations in the intensity of the reconstructed image, determining a topographic profile of the top surface of the object.
摘要:
An imaging, differential optical sectioning interference microscopy (DOSIM) system and method for measuring refractive indices and thicknesses of transparent thin-films. The refractive index and thickness are calculated from two interferometric images of the sample transparent thin-film having a vertical offset that falls within the linear region of an axial response curve of optically sectioning microscopy. Here, the images are formed by a microscope objective in the normal direction, i.e., in the direction perpendicular to the latitudinal surface of the thin-film. As a result, the lateral resolution of the transparent thin-film is estimated based on the Rayleigh criterion, 0.61λ/NA.
摘要:
A display device including a first voltage generator, a second voltage generator, a timing controller, a level shifter and a display panel is provided. The first voltage generator is configured to generate a gate high voltage. During a first period, the gate high voltage is a first voltage. After the first period, the gate high voltage is a second voltage. The first voltage is higher than the second voltage. The second voltage generator is configured to generate a gate low voltage. According to the gate high voltage and the gate low voltage, the level shifter shifts the voltage levels of the start signal, the clock signal and the inverse signal produced by the timing controller for driving a plurality of shift registers disposed on a substrate of the display panel. The shift registers is configured to output scanning signals in sequence.
摘要:
A broadband antenna includes a substrate, a ground plane, a radiating path, a shorting path, a first connection path, a second connection path and a coupling path. The ground plane has a shorting point, a first grounding point and a second grounding point. The radiating path has a feeding point and a first connecting point. Two ends of the shorting path are respectively electrically connected with the shorting point and the feeding point, and the shorting path has a second connecting point. Two ends of the first connection path are respectively connected with the first connecting point and the second connecting point. Two ends of the second connection path are respectively connected with the first grounding point and the feeding point. One end of the coupling path is connected to the second grounding point and another end of the coupling path is separated from the shorting path.
摘要:
A touch panel includes a display module, a touch sensor, an anti-noise unit and a signal processing unit. The display module generates a noise. The touch sensor is disposed above the display module and outputs an abnormal signal, wherein the abnormal signal includes the noise and a sensing signal. The anti-noise unit is adapted to receive the abnormal signal and then reject the noise so as to form the sensing signal. The signal processing unit is adapted to process the sensing signal.
摘要:
A method for controlling a cleaning device is presented, which includes the following steps. A cleaning device includes a control unit, a fan module, an optical emitter, and an optical sensor. The optical emitter and the optical sensor are located in an air inlet of the fan module. The control unit is preset with a first impedance value (Z1), a second impedance value (Z2), and a threshold, where 0
摘要:
A defect detection system and method enable a fastened crystalline silicon product to generate micro-vibration by a micro-vibration excitation device, so as to enable the crystalline silicon product to generate an excitation signal, then to acquire the excitation signal by a acquisition device, so as to analyze the excitation signal acquired by the acquisition device in the time and frequency domain by an analysis detection device with a specific analysis, and to obtain an analysis result, at last, determine a defect state of the crystalline silicon product according to the analysis result.
摘要:
An electronic casing and a method of manufacturing the same are provided. The method includes the following steps. Step (a): a metal laminate and a die of a predetermined shape are provided. The metal laminate comprises a metal top layer and a metal bottom layer that are bonded by interface atom diffusion. Step (b): the metal laminate is processed to form a casing blank by using the die, and the casing blank has at least one turning portion. Step (c): a profiler of a predetermined shape and an electromagnetic forming device are provided. Step (d): the casing blank is attached to the profiler, and the electromagnetic forming device is disposed at a position corresponding to the turning portion. Step (e): the electromagnetic forming device is activated, so that the casing blank has a shape corresponding to the predetermined shape of the profiler.