摘要:
A wafer and a test method thereof are provided. The invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test on a second chip, where a period of the high voltage stress test overlaps a period of the function test, thereby greatly decreasing the test time of the wafer.
摘要:
An integrated circuit includes a current mirror circuit for providing a current at an output end, a power-down switch coupled to the output end of the current mirror circuit for controlling access of the current generated by the current mirror circuit based on signals received at a control end of the power-down switch, and a compensating unit coupled to a bias end of the current mirror circuit and the power-down switch for stabilizing voltages at the bias end of the current mirror circuit.
摘要:
A wafer, a test system thereof, a test method thereof and a test device thereof are provided. The present invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test on a second chip, where a period of the high voltage stress test overlaps a period of the function test, thereby greatly decreasing the test time of the wafer.
摘要:
A wafer and a test method thereof are provided. The invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test on a second chip, where a period of the high voltage stress test overlaps a period of the function test, thereby greatly decreasing the test time of the wafer.
摘要:
A wafer, a test system thereof, a test method thereof and a test device thereof are provided. The present invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test on a second chip, where a period of the high voltage stress test overlaps a period of the function test, thereby greatly decreasing the test time of the wafer.
摘要:
An integrated circuit includes a current mirror circuit for providing a current at an output end, a power-down switch coupled to the output end of the current mirror circuit for controlling access of the current generated by the current mirror circuit based on signals received at a control end of the power-down switch, and a compensating unit coupled to a bias end of the current mirror circuit and the power-down switch for stabilizing voltages at the bias end of the current mirror circuit.
摘要:
The present invention discloses an apparatus for driving a display in which each pixels of the display receives a driving voltage and a common voltage, and a luminance of each pixel is determined by a difference between the received driving voltage and the common voltage. The apparatus comprises a plurality of source driver chips, each of which receives a pixel value and generates the driving voltage corresponding to the pixel value according to a plurality of Gamma voltages. The common voltage is generated by at least one of the source driver chips.
摘要:
A data driver has several gamma-voltage generating circuits and several driving channels. The gamma-voltage generating circuits are used to process gamma-voltages of different colors. Each two groups of the driving channels are correspondingly coupled with the gamma-voltage generating circuit that generates a single color and is separately disposed at either side of the corresponding gamma generating circuit for outputting the gamma-voltages of the same color to a display panel.
摘要:
A data transmission method for transmitting data between a timing controller and a source driver of a display and a display using the same are disclosed. The transmission method includes recognizing a start of a blank period of a frame period; sampling de-skew data on a data bus during the blank period based on a data clock; performing a de-skew function by comparing the sampled de-skew data with a predetermined de-skew code and adjusting the data clock; recognizing a start of a data input period of the frame period; and sampling pixel data on the data bus during the data input period based on the adjusted data clock. The display includes a timing controller, a data bus, and a source driver. The source driver is connected to the timing controller via the data bus for performing the data transmission method.
摘要:
An output buffer and a controlling method are disclosed. The output buffer comprises an upper buffer and a lower buffer. In the controlling method, at first, a first voltage (V1) and a second voltage (V2) are applied on the upper buffer, and a third voltage (V3) and a fourth voltage (V4) are applied on the lower buffer, wherein V1>V2, V1>V4, V3>V2, and V3>V4. Then, the upper buffer is operated to output data to a plurality of pixels thereby operating the liquid crystals of the pixels over an upper supply range, wherein the upper supply range is from V1 to V2. Thereafter, the lower buffer is operated to output data to the pixels thereby operating the liquid crystals of the pixels over a lower supply range, wherein the lower supply range is from V3 to V4.